G. Lawrence Best

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Tucson, AZ, US

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Patents Grantslast 30 patents

Information Patent Grant
Interferometric measurement of non-homogeneous multi-material surfaces
- Patent number 8,482,741
- Issue date Jul 9, 2013
- Bruker Nano Inc.
- Dong Chen
- G01 - MEASURING TESTING
Information Patent Grant
Interferometric measurement of non-homogeneous multi-material surfaces
- Patent number 8,416,425
- Issue date Apr 9, 2013
- Bruker Nano Inc.
- Florin Munteanu
- G01 - MEASURING TESTING
Information Patent Grant
Interferometric measurement of non-homogeneous multi-material surfaces
- Patent number 8,213,021
- Issue date Jul 3, 2012
- Veeco Metrology, Inc.
- Dong Chen
- G01 - MEASURING TESTING
Information Patent Grant
Interferometric measurement of DLC layer on magnetic head
- Patent number 7,808,652
- Issue date Oct 5, 2010
- Veeco Instruments, Inc.
- Florin Munteanu
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
INTERFEROMETRIC MEASUREMENT OF NON-HOMOGENEOUS MULTI-MATERIAL SURFACES
- Publication number 20120257216
- Publication date Oct 11, 2012
- BRUKER NANO INC
- DONG CHEN
- G01 - MEASURING TESTING
Information Patent Application
INTERFEROMETRIC MEASUREMENT OF NON-HOMOGENEOUS MULTI-MATERIAL SURFACES
- Publication number 20120257215
- Publication date Oct 11, 2012
- BRUKER NANO INC
- Dong Chen
- G01 - MEASURING TESTING
Information Patent Application
Interferometric measurement of DLC layer on magnetic head
- Publication number 20090185193
- Publication date Jul 23, 2009
- VEECO INSTRUMENTS, INC.
- Florin Munteanu
- G01 - MEASURING TESTING
Information Patent Application
Interferometric measurement of non-homogeneous multi-material surfaces
- Publication number 20090002775
- Publication date Jan 1, 2009
- VEECO INSTRUMENTS, INC.
- Dong Chen
- G01 - MEASURING TESTING