Gabor D. Toth

Person

Gilroy, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Method and system for charged particle microscopy with improved ima...
- Patent number 10,643,819
- Issue date May 5, 2020
- KLA-Tencor Corporation
- Doug K. Masnaghetti
- G01 - MEASURING TESTING
Information Patent Grant
Virtual ground for target substrate using floodgun and feedback con...
- Patent number 9,666,411
- Issue date May 30, 2017
- KLA-Tencor Corporation
- Mark A. McCord
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Readout methodology for multi-channel acquisition of spatially dist...
- Patent number 8,941,049
- Issue date Jan 27, 2015
- KLA-Tencor Corporation
- Gabor Toth
- G01 - MEASURING TESTING
Information Patent Grant
Charged-particle energy analyzer
- Patent number 8,421,030
- Issue date Apr 16, 2013
- KLA-Tencor Corporation
- Khashayar Shadman
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Transverse focusing action in hyperbolic field detectors
- Patent number 8,237,120
- Issue date Aug 7, 2012
- KLA-Tencor Corporation
- Gabor Toth
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods for acquiring information about a defect on a s...
- Patent number 8,045,145
- Issue date Oct 25, 2011
- KLA-Tencor Technologies Corp.
- Dave Bakker
- G01 - MEASURING TESTING
Information Patent Grant
Defect review using image segmentation
- Patent number 7,792,351
- Issue date Sep 7, 2010
- KLA-Tencor Technologies Corporation
- Gabor D. Toth
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Auger electron spectrometer with applied magnetic field at target s...
- Patent number 7,755,042
- Issue date Jul 13, 2010
- KLA-Tencor Corporation
- Gabor D. Toth
- G01 - MEASURING TESTING
Information Patent Grant
Defect review using image segmentation
- Patent number 7,684,609
- Issue date Mar 23, 2010
- KLA-Tencor Technologies Corporation
- Gabor D. Toth
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and instrument for chemical defect characterization in high...
- Patent number 7,635,842
- Issue date Dec 22, 2009
- KLA-Tencor Corporation
- Mehran Nasser-Ghodsi
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods for reducing alteration of a specimen during an...
- Patent number 7,394,067
- Issue date Jul 1, 2008
- KLA-Tencor Technologies Corp.
- David Soltz
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Automated focusing of electron image
- Patent number 7,247,849
- Issue date Jul 24, 2007
- KLA-Tencor Technologies Corporation
- Gabor D. Toth
- G01 - MEASURING TESTING
Information Patent Grant
Wien filter with reduced chromatic aberration
- Patent number 7,164,139
- Issue date Jan 16, 2007
- KLA-Tencor Technologies Corporation
- Gabor D. Toth
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Methods and systems for preparing a copper containing substrate for...
- Patent number 7,148,073
- Issue date Dec 12, 2006
- KLA-Tencor Technologies Corp.
- David Soltz
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Apparatus and method for E-beam dark field imaging
- Patent number 7,141,791
- Issue date Nov 28, 2006
- KLA-Tencor Technologies Corporation
- Douglas K. Masnaghetti
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Automated focusing of electron image
- Patent number 7,041,976
- Issue date May 9, 2006
- KLA-Tencor Technologies Corporation
- Mark A. Neil
- G01 - MEASURING TESTING
Information Patent Grant
Time of flight electron detector
- Patent number 7,030,375
- Issue date Apr 18, 2006
- KLA-Tencor Technologies Corporation
- Anne L. Testoni
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Single tool defect classification solution
- Patent number 6,952,653
- Issue date Oct 4, 2005
- KLA-Tencor Technologies Corporation
- Gabor D. Toth
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Apparatus and methods of controlling surface charge and focus
- Patent number 6,828,571
- Issue date Dec 7, 2004
- KLA-Tencor Technologies Corporation
- Mark A. McCord
- G01 - MEASURING TESTING
Information Patent Grant
Dual electron beam instrument for multi-perspective
- Patent number 6,812,462
- Issue date Nov 2, 2004
- KLA-Tencor Technologies Corporation
- Gabor D. Toth
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Filtered e-beam inspection and review
- Patent number 6,797,955
- Issue date Sep 28, 2004
- KLA-Tencor Technologies Corporation
- David L. Adler
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
Method and System for Charged Particle Microscopy with Improved Ima...
- Publication number 20200227232
- Publication date Jul 16, 2020
- KLA-Tencor Corporation
- Doug K. Masnaghetti
- G01 - MEASURING TESTING
Information Patent Application
Method and System for Charged Particle Microscopy with Improved Ima...
- Publication number 20160372304
- Publication date Dec 22, 2016
- KLA-Tencor Corporation
- Doug K. Masnaghetti
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
READOUT METHODOLOGY FOR MULTI-CHANNEL ACQUISITION OF SPATIALLY DIST...
- Publication number 20120029854
- Publication date Feb 2, 2012
- KLA-Tencor Corporation
- Gabor Toth
- G01 - MEASURING TESTING
Information Patent Application
CHARGED-PARTICLE ENERGY ANALYZER
- Publication number 20110168886
- Publication date Jul 14, 2011
- KLA-Tencor Corporation
- Khashayar Shadman
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND INSTRUMENT FOR CHEMICAL DEFECT CHARACTERIZATION IN HIGH...
- Publication number 20080197277
- Publication date Aug 21, 2008
- KLA-Tencor Corporation
- Mehran Nasser-Ghodsi
- G01 - MEASURING TESTING
Information Patent Application
Apparatus and method for e-beam dark field imaging
- Publication number 20060060780
- Publication date Mar 23, 2006
- Douglas K. Masnaghetti
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Single tool defect classification solution
- Publication number 20050033528
- Publication date Feb 10, 2005
- KLA-Tencor Technologies, Corporation
- Gabor D. Toth
- G06 - COMPUTING CALCULATING COUNTING

Gabor D. Toth

Person

Patents Grantslast 30 patents

Method and system for charged particle microscopy with improved ima...

Virtual ground for target substrate using floodgun and feedback con...

Readout methodology for multi-channel acquisition of spatially dist...

Charged-particle energy analyzer

Transverse focusing action in hyperbolic field detectors

Systems and methods for acquiring information about a defect on a s...

Defect review using image segmentation

Auger electron spectrometer with applied magnetic field at target s...

Defect review using image segmentation

Method and instrument for chemical defect characterization in high...

Systems and methods for reducing alteration of a specimen during an...

Automated focusing of electron image

Wien filter with reduced chromatic aberration

Methods and systems for preparing a copper containing substrate for...

Apparatus and method for E-beam dark field imaging

Automated focusing of electron image

Time of flight electron detector

Single tool defect classification solution

Apparatus and methods of controlling surface charge and focus

Dual electron beam instrument for multi-perspective

Filtered e-beam inspection and review

Patents Applicationslast 30 patents

Method and System for Charged Particle Microscopy with Improved Ima...

Method and System for Charged Particle Microscopy with Improved Ima...

READOUT METHODOLOGY FOR MULTI-CHANNEL ACQUISITION OF SPATIALLY DIST...

CHARGED-PARTICLE ENERGY ANALYZER

METHOD AND INSTRUMENT FOR CHEMICAL DEFECT CHARACTERIZATION IN HIGH...

Apparatus and method for e-beam dark field imaging

Single tool defect classification solution