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Gabriel Baralia
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Darmstadt, DE
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Patents Grants
last 30 patents
Information
Patent Grant
Methods and devices for extending a time period until changing a me...
Patent number
11,977,097
Issue date
May 7, 2024
Carl Zeiss SMT GmbH
Gabriel Baralia
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Device and method for analyzing a defect of a photolithographic mas...
Patent number
11,733,186
Issue date
Aug 22, 2023
Carl Zeiss SMT GmbH
Gabriel Baralia
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Methods and devices for extending a time period until changing a me...
Patent number
11,353,478
Issue date
Jun 7, 2022
Carl Zeiss SMT GmbH
Gabriel Baralia
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Device and method for analysing a defect of a photolithographic mas...
Patent number
10,983,075
Issue date
Apr 20, 2021
Carl Zeiss SMT GmbH
Gabriel Baralia
G01 - MEASURING TESTING
Information
Patent Grant
Probe system and method for receiving a probe of a scanning probe m...
Patent number
10,578,644
Issue date
Mar 3, 2020
Carl Zeiss SMT GmbH
Christof Baur
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus and method for examining a surface of a mask
Patent number
9,910,065
Issue date
Mar 6, 2018
Carl Zeiss SMT GmbH
Michael Budach
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Apparatus and method for investigating an object
Patent number
9,115,981
Issue date
Aug 25, 2015
Carl Zeiss SMS GmbH
Christof Baur
B82 - NANO-TECHNOLOGY
Information
Patent Grant
Apparatus and method for analyzing and modifying a specimen surface
Patent number
8,769,709
Issue date
Jul 1, 2014
Carl Zeiss SMS GmbH
Christof Baur
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
METHODS AND DEVICES FOR EXTENDING A TIME PERIOD UNTIL CHANGING A ME...
Publication number
20220291255
Publication date
Sep 15, 2022
Carl Zeiss SMT GMBH
Gabriel Baralia
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
DEVICE AND METHOD FOR ANALYSING A DEFECT OF A PHOTOLITHOGRAPHIC MAS...
Publication number
20210247336
Publication date
Aug 12, 2021
Carl Zeiss SMT GMBH
Gabriel Baralia
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
METHODS AND DEVICES FOR EXTENDING A TIME PERIOD UNTIL CHANGING A ME...
Publication number
20190317126
Publication date
Oct 17, 2019
Carl Zeiss SMT GMBH
Gabriel Baralia
G01 - MEASURING TESTING
Information
Patent Application
PROBE SYSTEM AND METHOD FOR RECEIVING A PROBE OF A SCANNING PROBE M...
Publication number
20180095108
Publication date
Apr 5, 2018
Carl Zeiss SMT GMBH
Christof Baur
G01 - MEASURING TESTING
Information
Patent Application
DEVICE AND METHOD FOR ANALYSING A DEFECT OF A PHOTOLITHOGRAPHIC MAS...
Publication number
20170292923
Publication date
Oct 12, 2017
Carl Zeiss SMT GMBH
Gabriel Baralia
G02 - OPTICS
Information
Patent Application
APPARATUS AND METHOD FOR EXAMINING A SURFACE OF A MASK
Publication number
20160341763
Publication date
Nov 24, 2016
Carl Zeiss SMT GMBH
Michael Budach
G01 - MEASURING TESTING
Information
Patent Application
APPARATUS AND METHOD FOR INVESTIGATING AN OBJECT
Publication number
20140027512
Publication date
Jan 30, 2014
Christof Baur
B82 - NANO-TECHNOLOGY
Information
Patent Application
APPARATUS AND METHOD FOR ANALYZING AND MODIFYING A SPECIMEN SURFACE
Publication number
20140007306
Publication date
Jan 2, 2014
Christof Baur
B82 - NANO-TECHNOLOGY