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Gabriel Blaj
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Waalre, NL
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last 30 patents
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Patent Grant
X-ray diffraction and computed tomography
Patent number
8,477,904
Issue date
Jul 2, 2013
PANalytical B.V.
Gabriel Blaj
G01 - MEASURING TESTING
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last 30 patents
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Patent Application
X-RAY DIFFRACTION AND COMPUTED TOMOGRAPHY
Publication number
20110200164
Publication date
Aug 18, 2011
PANALYTICAL B.V.
Gabriel Blaj
G01 - MEASURING TESTING