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Gabriel Daalmans
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Hochstadt, DE
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Patents Grants
last 30 patents
Information
Patent Grant
Device for detecting defects in electrically conductive materials i...
Patent number
7,495,433
Issue date
Feb 24, 2009
Siemens Aktiengesellschaft
Gabriel Daalmans
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus for detection of the gradient of a magnetic field, and a...
Patent number
7,495,624
Issue date
Feb 24, 2009
Siemens Aktiengesellschaft
Gabriel Daalmans
G01 - MEASURING TESTING
Information
Patent Grant
Motion detector according to the Ferraris principle
Patent number
6,851,318
Issue date
Feb 8, 2005
Siemens Aktiengesellschaft
Gabriel Daalmans
G01 - MEASURING TESTING
Information
Patent Grant
Circuit arrangement for evaluating an acceleration sensor using the...
Patent number
6,848,308
Issue date
Feb 1, 2005
Siemens Aktiengesellschaft
Franz Bauer
G01 - MEASURING TESTING
Information
Patent Grant
Device for measuring the motion of a conducting body through magnet...
Patent number
6,850,053
Issue date
Feb 1, 2005
Siemens Aktiengesellschaft
Gabriel Daalmans
G01 - MEASURING TESTING
Information
Patent Grant
Method and device for the in situ detection of the degree of conver...
Patent number
6,686,735
Issue date
Feb 3, 2004
Siemens Aktiengesellschaft
Gabriel Daalmans
G01 - MEASURING TESTING
Information
Patent Grant
Device for eddy current measurement of a motion of a conducting bod...
Patent number
6,650,106
Issue date
Nov 18, 2003
Siemens Aktiengesellschaft
Gabriel Daalmans
G01 - MEASURING TESTING
Information
Patent Grant
Scanning head for eddy-current testing, method for processing a sca...
Patent number
6,452,384
Issue date
Sep 17, 2002
Siemens Aktiengesellschaft
Erich Becker
G01 - MEASURING TESTING
Information
Patent Grant
SQUID-magnetometer for measuring weak magnetic fields with gradiome...
Patent number
4,937,525
Issue date
Jun 26, 1990
Siemens Aktiengesellschaft
Gabriel M. Daalmans
G01 - MEASURING TESTING
Information
Patent Grant
Thin film SQUID magnetometer for a device for measuring weak magnet...
Patent number
4,801,882
Issue date
Jan 31, 1989
Siemens Aktiengesellschaft
Gabriel M. Daalmans
G01 - MEASURING TESTING
Information
Patent Grant
Method for making a superconducting gradiometer having a three-dime...
Patent number
4,694,567
Issue date
Sep 22, 1987
Siemens Aktiengesellschaft
Gabriel M. Daalmans
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
Method for determining the layer thickness of an electrically condu...
Publication number
20090251137
Publication date
Oct 8, 2009
Gabriel Daalmans
G01 - MEASURING TESTING
Information
Patent Application
Device For Detecting Defects Which Are Deep And Close To The Surfac...
Publication number
20070200563
Publication date
Aug 30, 2007
Gabriel Daalmans
G01 - MEASURING TESTING
Information
Patent Application
Apparatus for detection of the gradient of a magnetic field, and a...
Publication number
20060055614
Publication date
Mar 16, 2006
Gabriel Daalmans
G01 - MEASURING TESTING
Information
Patent Application
Motion detector according to the ferraris principle
Publication number
20030193396
Publication date
Oct 16, 2003
SIEMENS AKTIENGESELLSCHAFT
Gabriel Daalmans
G01 - MEASURING TESTING
Information
Patent Application
Motion measuring device
Publication number
20030080728
Publication date
May 1, 2003
SIEMENS AKTIENGESELLSCHAFT
Gabriel Daalmans
G01 - MEASURING TESTING
Information
Patent Application
Device for measuring a motion
Publication number
20030071612
Publication date
Apr 17, 2003
SIEMENS AKTIENGESELLSCHAFT
Gabriel Daalmans
G01 - MEASURING TESTING
Information
Patent Application
Method and device for the in situ detection of the degree of conver...
Publication number
20030038630
Publication date
Feb 27, 2003
Gabriel Daalmans
G01 - MEASURING TESTING
Information
Patent Application
Circuit arrangement for evaluating an acceleration sensor using the...
Publication number
20020078748
Publication date
Jun 27, 2002
Franz Bauer
G01 - MEASURING TESTING