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Gabriel Elpers
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Houston, TX, US
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last 30 patents
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Patent Grant
Compact mapping spectrometer
Patent number
10,254,164
Issue date
Apr 9, 2019
NANOMMICS, INC.
Byron G. Zollars
G01 - MEASURING TESTING
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last 30 patents
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Patent Application
SYSTEM AND METHOD FOR DETECTION OF ANOMALIES IN WELDED STRUCTURES
Publication number
20220415020
Publication date
Dec 29, 2022
NEWFREY LLC
Amir R. KASHANIPOUR
B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
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Patent Application
Compact Mapping Spectrometer
Publication number
20160305820
Publication date
Oct 20, 2016
NANOHMICSM, INC.
Byron G. Zollars
G01 - MEASURING TESTING