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Gabriel G. Barna
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Richardson, TX, US
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Patents Grants
last 30 patents
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Patent Grant
Plasma etching with fast endpoint detector
Patent number
6,104,487
Issue date
Aug 15, 2000
Texas Instruments Incorporated
David Wallace Buck
G01 - MEASURING TESTING
Information
Patent Grant
Method for controlling semiconductor wafer processing
Patent number
5,661,669
Issue date
Aug 26, 1997
Texas Instruments Incorporated
Purnendu Kanti Mozumder
G05 - CONTROLLING REGULATING
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Patent Grant
System and method for controlling semiconductor wafer processing
Patent number
5,526,293
Issue date
Jun 11, 1996
Texas Instruments Inc.
Purnendu K. Mozumder
G05 - CONTROLLING REGULATING
Information
Patent Grant
Measurement of gas leaks into gas lines of a plasma reactor
Patent number
5,326,975
Issue date
Jul 5, 1994
Texas Instruments Incorporated
Gabriel G. Barna
G01 - MEASURING TESTING