Gabriel G. Barna

Person

Dallas, TX, US

People

Patents Grantslast 30 patents

Information Patent Grant
Recessed STI for wide transistors
- Patent number 8,058,161
- Issue date Nov 15, 2011
- Texas Instruments Incorporated
- Gabriel George Barna
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method to manufacture silicon quantum islands and single-electron d...
- Patent number 7,939,398
- Issue date May 10, 2011
- Texas Instruments Incorporated
- Christoph Wasshuber
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Transistors with recessed active trenches for increased effective g...
- Patent number 7,642,144
- Issue date Jan 5, 2010
- Texas Instruments Incorporated
- Andrew Marshall
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
SOI wafer with cooling channels and a method of manufacture thereof
- Patent number 7,344,957
- Issue date Mar 18, 2008
- Texas Instruments Incorporated
- Gabriel G. Barna
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of fabricating a combined fully-depleted silicon-on-insulato...
- Patent number 7,198,993
- Issue date Apr 3, 2007
- Texas Instruments Incorporated
- Howard L. Tigelaar
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method to manufacture silicon quantum islands and single-electron d...
- Patent number 7,122,413
- Issue date Oct 17, 2006
- Texas Instruments Incorporated
- Christoph Wasshuber
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for improving silicon-on-insulator (SOI) film uniformity on...
- Patent number 6,875,656
- Issue date Apr 5, 2005
- Texas Instruments Incorporated
- Gabriel G. Barna
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Equipment evaluation and design
- Patent number 6,438,439
- Issue date Aug 20, 2002
- Texas Instruments Incorporated
- Gabriel G. Barna
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Virtual sensor based monitoring and fault detection/classification...
- Patent number 5,864,773
- Issue date Jan 26, 1999
- Texas Instruments Incorporated
- Gabriel G. Barna
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus of etching a clean trench in a semiconductor m...
- Patent number 5,512,130
- Issue date Apr 30, 1996
- Texas Instruments Incorporated
- Gabriel G. Barna
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Oxygen scavenging in a plasma reactor
- Patent number 5,254,216
- Issue date Oct 19, 1993
- Texas Instruments Incorporated
- James G. Frank
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for measuring plasma properties in semiconductor processing
- Patent number 4,859,277
- Issue date Aug 22, 1989
- Texas Instruments Incorporated
- Gabriel G. Barna
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Process and apparatus for detecting aberrations in production proce...
- Patent number 4,847,792
- Issue date Jul 11, 1989
- Texas Instruments Incorporated
- Gabriel G. Barna
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
METHOD TO MANUFACTURE SILICON QUANTUM ISLANDS AND SINGLE-ELECTRON D...
- Publication number 20100062587
- Publication date Mar 11, 2010
- TEXAS INSTRUMENTS INCORPORATED
- Christoph Wasshuber
- B82 - NANO-TECHNOLOGY
Information Patent Application
Recessed active for increased weffective transistors
- Publication number 20080153218
- Publication date Jun 26, 2008
- Texas Instruments Inc.
- Andrew Marshall
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Recessed STI for wide transistors
- Publication number 20080081404
- Publication date Apr 3, 2008
- TEXAS INSTRUMENTS INCORPORATED
- Gabriel George Barna
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD TO MANUFACTURE SILICON QUANTUM ISLANDS AND SINGLE-ELECTRON D...
- Publication number 20070007596
- Publication date Jan 11, 2007
- TEXAS INSTRUMENTS INCORPORATED
- Christoph Wasshuber
- B82 - NANO-TECHNOLOGY
Information Patent Application
SOI wafer with cooling channels and a method of manufacture thereof
- Publication number 20060160327
- Publication date Jul 20, 2006
- TEXAS INSTRUMENTS INCORPORATED
- Gabriel G. Barna
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Combined fully-depleted silicon-on-insulator (FD-SOI) and partially...
- Publication number 20060128074
- Publication date Jun 15, 2006
- TEXAS INSTRUMENTS INCORPORATED
- Howard L. Tigelaar
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method to manufacture silicon quantum islands and single-electron d...
- Publication number 20050136655
- Publication date Jun 23, 2005
- Texas Instruments, Incorporated
- Christoph Wasshuber
- B82 - NANO-TECHNOLOGY
Information Patent Application
Method for improving silicon-on-insulator (SOI) film uniformity on...
- Publication number 20040232489
- Publication date Nov 25, 2004
- TEXAS INSTRUMENTS INCORPORATED
- Gabriel G. Barna
- H01 - BASIC ELECTRIC ELEMENTS

Gabriel G. Barna

Person

Patents Grantslast 30 patents

Recessed STI for wide transistors

Method to manufacture silicon quantum islands and single-electron d...

Transistors with recessed active trenches for increased effective g...

SOI wafer with cooling channels and a method of manufacture thereof

Method of fabricating a combined fully-depleted silicon-on-insulato...

Method to manufacture silicon quantum islands and single-electron d...

Method for improving silicon-on-insulator (SOI) film uniformity on...

Equipment evaluation and design

Virtual sensor based monitoring and fault detection/classification...

Method and apparatus of etching a clean trench in a semiconductor m...

Oxygen scavenging in a plasma reactor

Method for measuring plasma properties in semiconductor processing

Process and apparatus for detecting aberrations in production proce...

Patents Applicationslast 30 patents

METHOD TO MANUFACTURE SILICON QUANTUM ISLANDS AND SINGLE-ELECTRON D...

Recessed active for increased weffective transistors

Recessed STI for wide transistors

METHOD TO MANUFACTURE SILICON QUANTUM ISLANDS AND SINGLE-ELECTRON D...

SOI wafer with cooling channels and a method of manufacture thereof

Combined fully-depleted silicon-on-insulator (FD-SOI) and partially...

Method to manufacture silicon quantum islands and single-electron d...

Method for improving silicon-on-insulator (SOI) film uniformity on...