Gabriele Kuczera

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Boeblingen, DE

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Patents Grantslast 30 patents

Information Patent Grant
Wafer probe alignment
- Patent number 9,977,053
- Issue date May 22, 2018
- International Business Machines Corporation
- Joerg G. Appinger
- G01 - MEASURING TESTING
Information Patent Grant
Wafer probe alignment
- Patent number 9,927,463
- Issue date Mar 27, 2018
- International Business Machines Corporation
- Joerg G. Appinger
- G01 - MEASURING TESTING
Information Patent Grant
Auto-alignment of backer plate for direct docking test boards
- Patent number 9,921,268
- Issue date Mar 20, 2018
- International Business Machines Corporation
- Eberhard Dengler
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor automatic test equipment
- Patent number 9,726,719
- Issue date Aug 8, 2017
- International Business Machines Corporation
- Gabriele Kuczera
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
AUTO-ALIGNMENT OF BACKER PLATE FOR DIRECT DOCKING TEST BOARDS
- Publication number 20170139003
- Publication date May 18, 2017
- International Business Machines Corporation
- Eberhard Dengler
- G01 - MEASURING TESTING
Information Patent Application
WAFER PROBE ALIGNMENT
- Publication number 20170108547
- Publication date Apr 20, 2017
- International Business Machines Corporation
- Joerg G. APPINGER
- G01 - MEASURING TESTING
Information Patent Application
WAFER PROBE ALIGNMENT
- Publication number 20170108534
- Publication date Apr 20, 2017
- International Business Machines Corporation
- Joerg G. APPINGER
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR AUTOMATIC TEST EQUIPMENT
- Publication number 20150276849
- Publication date Oct 1, 2015
- International Business Machines Corporation
- Gabriele Kuczera
- G01 - MEASURING TESTING