Gad Neumann

Person

Rehovot, IL

People

Patents Grantslast 30 patents

Information Patent Grant
System for detection of wafer defects
- Patent number 7,961,763
- Issue date Jun 14, 2011
- Applied Materials South East Asia Pte. Ltd.
- Dov Furman
- G01 - MEASURING TESTING
Information Patent Grant
System for detection of wafer defects
- Patent number 7,843,559
- Issue date Nov 30, 2010
- Applied Materials South East Asia Pte. Ltd.
- Dov Furman
- G01 - MEASURING TESTING
Information Patent Grant
Optical inspection apparatus for substrate defect detection
- Patent number 7,796,807
- Issue date Sep 14, 2010
- Applied Materials, Israel Ltd.
- David Alumot
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for determining optimum position of focus of an imaging s...
- Patent number 7,633,041
- Issue date Dec 15, 2009
- Applied Materials South East Asia Pte, Ltd.
- Dov Furman
- G01 - MEASURING TESTING
Information Patent Grant
System for detection of water defects
- Patent number 7,525,659
- Issue date Apr 28, 2009
- Negevtech Ltd.
- Dov Furman
- G01 - MEASURING TESTING
Information Patent Grant
Optical inspection method for substrate defect detection
- Patent number 7,499,583
- Issue date Mar 3, 2009
- Applied Materials, Israel, Ltd.
- David Alumot
- G01 - MEASURING TESTING
Information Patent Grant
System for detection of wafer defects
- Patent number 7,477,383
- Issue date Jan 13, 2009
- Negevtech Ltd.
- Dov Furman
- G01 - MEASURING TESTING
Information Patent Grant
Fiber optical illumination system
- Patent number 7,260,298
- Issue date Aug 21, 2007
- Negevtech Ltd.
- Dov Furman
- G01 - MEASURING TESTING
Information Patent Grant
System for detection of wafer defects
- Patent number 7,180,586
- Issue date Feb 20, 2007
- Negevtech Ltd.
- Gad Neumann
- G01 - MEASURING TESTING
Information Patent Grant
Optical inspection apparatus for substrate defect detection
- Patent number 6,952,491
- Issue date Oct 4, 2005
- Applied Materials, Inc.
- David Alumot
- G01 - MEASURING TESTING
Information Patent Grant
Fiber optical illumination system
- Patent number 6,892,013
- Issue date May 10, 2005
- Negevtech Ltd.
- Dov Furman
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for fast on-line electro-optical detection of waf...
- Patent number 6,693,664
- Issue date Feb 17, 2004
- Negevtech
- Gad Neumann
- G01 - MEASURING TESTING
Information Patent Grant
Substrate inspection method and apparatus
- Patent number 6,178,257
- Issue date Jan 23, 2001
- Applied Materials, Inc.
- David Alumot
- G01 - MEASURING TESTING
Information Patent Grant
Optical inspection method and apparatus
- Patent number 5,982,921
- Issue date Nov 9, 1999
- Applied Materials, Inc.
- David Alumot
- G01 - MEASURING TESTING
Information Patent Grant
Two-phase optical inspection method and apparatus for defect detection
- Patent number 5,699,447
- Issue date Dec 16, 1997
- Orbot Instruments Ltd.
- David Alumot
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
OPTICAL INSPECTION APPARATUS FOR SUBSTRATE DEFECT DETECTION
- Publication number 20090148033
- Publication date Jun 11, 2009
- David Alumot
- G01 - MEASURING TESTING
Information Patent Application
System for detection of wafer defects
- Publication number 20070019856
- Publication date Jan 25, 2007
- NEGEVTECH LTD.
- Dov Furman
- G01 - MEASURING TESTING
Information Patent Application
System for detection of wafer defects
- Publication number 20070013903
- Publication date Jan 18, 2007
- NEGEVTECH LTD.
- Dov Furman
- G01 - MEASURING TESTING
Information Patent Application
System for detection of wafer defects
- Publication number 20060244956
- Publication date Nov 2, 2006
- NEGEVTECH LTD.
- Dov Furman
- G01 - MEASURING TESTING
Information Patent Application
System for detection of wafer defects
- Publication number 20060244958
- Publication date Nov 2, 2006
- NEGEVTECH LTD.
- Dov Furman
- G01 - MEASURING TESTING
Information Patent Application
System for detection of wafer defects
- Publication number 20060244957
- Publication date Nov 2, 2006
- NEGEVTECH LTD.
- Dov Furman
- G01 - MEASURING TESTING
Information Patent Application
Fiber optical illumination system
- Publication number 20050180707
- Publication date Aug 18, 2005
- NEGEVTECH LTD.
- Dov Furman
- G02 - OPTICS
Information Patent Application
System for detection of wafer defects
- Publication number 20050110987
- Publication date May 26, 2005
- NEGEVTECH LTD.
- Dov Furman
- G01 - MEASURING TESTING
Information Patent Application
Optical inspection apparatus for substrate defect detection
- Publication number 20040263834
- Publication date Dec 30, 2004
- Applied Materials, Inc.
- David Alumot
- G01 - MEASURING TESTING
Information Patent Application
Optical inspection method for substrate defect detection
- Publication number 20040218807
- Publication date Nov 4, 2004
- Applied Materials, Inc.
- David Alumot
- G01 - MEASURING TESTING
Information Patent Application
System for detection of wafer defects
- Publication number 20040146295
- Publication date Jul 29, 2004
- NEGEVTECH LTD.
- Dov Furman
- G01 - MEASURING TESTING
Information Patent Application
Fiber optical illumination system
- Publication number 20040136665
- Publication date Jul 15, 2004
- NEGEVTECH LTD.
- Dov Furman
- G02 - OPTICS
Information Patent Application
Method and system for fast on-line electro-optical detection of waf...
- Publication number 20030133604
- Publication date Jul 17, 2003
- Gad Neumann
- G01 - MEASURING TESTING
Information Patent Application
Optical inspection apparatus for defect detection
- Publication number 20020039436
- Publication date Apr 4, 2002
- David Alumot
- G01 - MEASURING TESTING

Gad Neumann

Person

Patents Grantslast 30 patents

System for detection of wafer defects

System for detection of wafer defects

Optical inspection apparatus for substrate defect detection

Apparatus for determining optimum position of focus of an imaging s...

System for detection of water defects

Optical inspection method for substrate defect detection

System for detection of wafer defects

Fiber optical illumination system

System for detection of wafer defects

Optical inspection apparatus for substrate defect detection

Fiber optical illumination system

Method and system for fast on-line electro-optical detection of waf...

Substrate inspection method and apparatus

Optical inspection method and apparatus

Two-phase optical inspection method and apparatus for defect detection

Patents Applicationslast 30 patents

OPTICAL INSPECTION APPARATUS FOR SUBSTRATE DEFECT DETECTION

System for detection of wafer defects

System for detection of wafer defects

System for detection of wafer defects

System for detection of wafer defects

System for detection of wafer defects

Fiber optical illumination system

System for detection of wafer defects

Optical inspection apparatus for substrate defect detection

Optical inspection method for substrate defect detection

System for detection of wafer defects

Fiber optical illumination system

Method and system for fast on-line electro-optical detection of waf...

Optical inspection apparatus for defect detection