Gaetan L. Mathieu

Person

Livermore, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Exporting a selected group of micro-objects from a micro-fluidic de...
- Patent number 10,800,652
- Issue date Oct 13, 2020
- Berkeley Lights, Inc.
- Keith J. Breinlinger
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Exporting a selected group of micro-objects from a micro-fluidic de...
- Patent number 10,252,907
- Issue date Apr 9, 2019
- Berkeley Lights, Inc.
- Keith J. Breinlinger
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Method of wirebonding that utilizes a gas flow within a capillary f...
- Patent number 8,485,418
- Issue date Jul 16, 2013
- FormFactor, Inc.
- Benjamin N. Eldridge
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Carbon nanotube columns and methods of making and using carbon nano...
- Patent number 8,354,855
- Issue date Jan 15, 2013
- FormFactor, Inc.
- Benjamin N. Eldridge
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Multilayered probe card
- Patent number 7,948,252
- Issue date May 24, 2011
- FormFactor, Inc.
- Gary W. Grube
- G01 - MEASURING TESTING
Information Patent Grant
Printing of redistribution traces on electronic component
- Patent number 7,880,489
- Issue date Feb 1, 2011
- FormFactor, Inc.
- Benjamin N. Eldridge
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Composite motion probing
- Patent number 7,868,632
- Issue date Jan 11, 2011
- FormFactor, Inc.
- Timothy E. Cooper
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for adjusting a multi-substrate probe structure
- Patent number 7,845,072
- Issue date Dec 7, 2010
- FormFactor, Inc.
- Eric D. Hobbs
- G01 - MEASURING TESTING
Information Patent Grant
Component assembly and alignment
- Patent number 7,808,259
- Issue date Oct 5, 2010
- FormFactor, Inc.
- Benjamin N. Eldridge
- G11 - INFORMATION STORAGE
Information Patent Grant
Microelectronic contact structures
- Patent number 7,798,822
- Issue date Sep 21, 2010
- FormFactor, Inc.
- Benjamin N. Eldridge
- G01 - MEASURING TESTING
Information Patent Grant
Methods for planarizing a semiconductor contactor
- Patent number 7,737,709
- Issue date Jun 15, 2010
- FormFactor, Inc.
- Gaetan L. Mathieu
- G01 - MEASURING TESTING
Information Patent Grant
Electronic device testing using a probe tip having multiple contact...
- Patent number 7,701,243
- Issue date Apr 20, 2010
- FormFactor, Inc.
- Timothy E. Cooper
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for adjusting an orientation of probes
- Patent number 7,671,614
- Issue date Mar 2, 2010
- FormFactor, Inc.
- Benjamin N. Eldridge
- G01 - MEASURING TESTING
Information Patent Grant
Three dimensional microstructures and methods for making three dime...
- Patent number 7,658,831
- Issue date Feb 9, 2010
- FormFactor, Inc.
- Gaetan L. Mathieu
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Method and system for compensating thermally induced motion of prob...
- Patent number 7,642,794
- Issue date Jan 5, 2010
- FormFactor, Inc.
- Benjamin N. Eldridge
- G01 - MEASURING TESTING
Information Patent Grant
Method of manufacturing a resilient contact
- Patent number 7,621,044
- Issue date Nov 24, 2009
- FormFactor, Inc.
- Benjamin N. Eldridge
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Apparatus and method for managing thermally induced motion of a pro...
- Patent number 7,592,821
- Issue date Sep 22, 2009
- FormFactor, Inc.
- Benjamin N. Eldridge
- G01 - MEASURING TESTING
Information Patent Grant
Microelectronic spring contact elements
- Patent number 7,579,269
- Issue date Aug 25, 2009
- FormFactor, Inc.
- Benjamin N. Eldridge
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Method of making lithographic contact elements
- Patent number 7,555,836
- Issue date Jul 7, 2009
- FormFactor, Inc.
- Gaetan L. Mathieu
- G01 - MEASURING TESTING
Information Patent Grant
Spring interconnect structures
- Patent number 7,553,165
- Issue date Jun 30, 2009
- FormFactor, Inc.
- Gaetan L. Mathieu
- G01 - MEASURING TESTING
Information Patent Grant
Integrated circuit assembly
- Patent number 7,550,842
- Issue date Jun 23, 2009
- FormFactor, Inc.
- Igor Y. Khandros
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for adjusting a multi-substrate probe structure
- Patent number 7,471,094
- Issue date Dec 30, 2008
- FormFactor, Inc.
- Eric D. Hobbs
- G01 - MEASURING TESTING
Information Patent Grant
Methods of probing an electronic device
- Patent number 7,463,043
- Issue date Dec 9, 2008
- FormFactor, Inc.
- Timothy E. Cooper
- G01 - MEASURING TESTING
Information Patent Grant
Shaped spring
- Patent number 7,458,816
- Issue date Dec 2, 2008
- FormFactor, Inc.
- Gaetan L. Mathieu
- G01 - MEASURING TESTING
Information Patent Grant
Variable width resilient conductive contact structures
- Patent number 7,435,108
- Issue date Oct 14, 2008
- FormFactor, Inc.
- Benjamin N. Eldridge
- G01 - MEASURING TESTING
Information Patent Grant
Composite wiring structure having a wiring block and an insulating...
- Patent number 7,400,157
- Issue date Jul 15, 2008
- FormFactor, Inc.
- Gary W. Grube
- G01 - MEASURING TESTING
Information Patent Grant
Spring interconnect structures
- Patent number 7,371,072
- Issue date May 13, 2008
- FormFactor, Inc.
- Gaetan L. Mathieu
- G01 - MEASURING TESTING
Information Patent Grant
Method for making a socket to perform testing on integrated circuits
- Patent number 7,330,039
- Issue date Feb 12, 2008
- FormFactor, Inc.
- Igor Y. Khandros
- G01 - MEASURING TESTING
Information Patent Grant
Lithographic contact elements
- Patent number 7,287,322
- Issue date Oct 30, 2007
- FormFactor, Inc.
- Gaetan L. Mathieu
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for managing thermally induced motion of a pro...
- Patent number 7,285,968
- Issue date Oct 23, 2007
- FormFactor, Inc.
- Benjamin N. Eldridge
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Exporting a Selected Group of Micro-Objects From a Micro-Fluidic De...
- Publication number 20190152771
- Publication date May 23, 2019
- Berkeley Lights, Inc.
- Keith J. Breinlinger
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
Exporting a Selected Group of Micro-Objects From a Micro-Fluidic De...
- Publication number 20170355595
- Publication date Dec 14, 2017
- Berkeley Lights, Inc.
- Keith J. Breinlinger
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
METHOD OF MANUFACTURING A PROBE CARD
- Publication number 20080272794
- Publication date Nov 6, 2008
- FormFactor, Inc.
- Gary W. Grube
- G01 - MEASURING TESTING
Information Patent Application
SPRING INTERCONNECT STRUCTURES
- Publication number 20080254651
- Publication date Oct 16, 2008
- FormFactor, Inc.
- Gaetan L. Mathieu
- G01 - MEASURING TESTING
Information Patent Application
CONTACT TIP STRUCTURE FOR MICROELECTRONIC INTERCONNECTION ELEMENTS...
- Publication number 20080116927
- Publication date May 22, 2008
- FormFactor, Inc.
- Thomas H. Dozier
- G01 - MEASURING TESTING
Information Patent Application
LITHOGRAPHIC CONTACT ELEMENTS
- Publication number 20080115353
- Publication date May 22, 2008
- FormFactor, Inc.
- Gaetan L. Mathieu
- G01 - MEASURING TESTING
Information Patent Application
METHODS FOR PLANARIZING A SEMICONDUCTOR CONTACTOR
- Publication number 20080048688
- Publication date Feb 28, 2008
- FormFactor, Inc.
- Gaetan L. Mathieu
- G01 - MEASURING TESTING
Information Patent Application
PROBING A DEVICE
- Publication number 20070262767
- Publication date Nov 15, 2007
- FormFactor, Inc.
- Timothy E. Cooper
- G01 - MEASURING TESTING
Information Patent Application
Method of Manufacturing a Probe Card
- Publication number 20070247176
- Publication date Oct 25, 2007
- FormFactor, Inc.
- Gary W. Grube
- G01 - MEASURING TESTING
Information Patent Application
Probe For Semiconductor Devices
- Publication number 20070176619
- Publication date Aug 2, 2007
- FormFactor, Inc.
- Igor Y. Khandros
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
Composite Motion Probing
- Publication number 20070170941
- Publication date Jul 26, 2007
- FormFactor, Inc.
- Timothy E. Cooper
- G01 - MEASURING TESTING
Information Patent Application
Apparatus And Method For Adjusting An Orientation Of Probes
- Publication number 20070126435
- Publication date Jun 7, 2007
- FormFactor, Inc.
- Benjamin N. Eldridge
- G01 - MEASURING TESTING
Information Patent Application
Method of Manufacturing A Probe Card
- Publication number 20070126443
- Publication date Jun 7, 2007
- FormFactor, Inc.
- Gary W. Grube
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for adjusting a multi-substrate probe structure
- Publication number 20060290367
- Publication date Dec 28, 2006
- FormFactor, Inc.
- Eric D. Hobbs
- G01 - MEASURING TESTING
Information Patent Application
SOCKETS FOR "SPRINGED" SEMICONDUCTOR DEVICES
- Publication number 20060223345
- Publication date Oct 5, 2006
- FormFactor, Inc.
- Thomas H. Dozier
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
Electroform spring built on mandrel transferable to other surface
- Publication number 20060085976
- Publication date Apr 27, 2006
- FormFactor, Inc.
- Benjamin N. Eldridge
- C25 - ELECTROLYTIC OR ELECTROPHORETIC PROCESSES APPARATUS THEREFOR
Information Patent Application
Mechanically reconfigurable vertical tester interface for IC probing
- Publication number 20050277323
- Publication date Dec 15, 2005
- FormFactor, Inc.
- Benjamin N. Eldridge
- G01 - MEASURING TESTING
Information Patent Application
Method to build robust mechanical structures on substrate surfaces
- Publication number 20050255408
- Publication date Nov 17, 2005
- FormFactor, Inc.
- Gary W. Grube
- G01 - MEASURING TESTING
Information Patent Application
Probing a device
- Publication number 20050179455
- Publication date Aug 18, 2005
- FormFactor, Inc.
- Timothy E. Cooper
- G01 - MEASURING TESTING
Information Patent Application
Method for making a socket to perform testing on integrated circuits
- Publication number 20050167816
- Publication date Aug 4, 2005
- FormFactor, Inc.
- Igor Y. Khandros
- G01 - MEASURING TESTING
Information Patent Application
Method of manufacturing a probe card
- Publication number 20050146339
- Publication date Jul 7, 2005
- FormFactor, Inc.
- Gary W. Grube
- G01 - MEASURING TESTING
Information Patent Application
Lithographic contact elements
- Publication number 20050148214
- Publication date Jul 7, 2005
- FormFactor, Inc.
- Gaetan L. Mathieu
- G01 - MEASURING TESTING
Information Patent Application
Methods for making vertical electric feed through structures usable...
- Publication number 20050108875
- Publication date May 26, 2005
- Gaetan L. Mathieu
- G01 - MEASURING TESTING
Information Patent Application
Methods for making plated through holes usable as interconnection w...
- Publication number 20050108876
- Publication date May 26, 2005
- Gaetan L. Mathieu
- G01 - MEASURING TESTING
Information Patent Application
Methods for planarizing a semiconductor contactor
- Publication number 20040266089
- Publication date Dec 30, 2004
- FormFactor, Inc.
- Gaetan L. Mathieu
- G01 - MEASURING TESTING
Information Patent Application
Connection components with frangible leads and bus
- Publication number 20040238922
- Publication date Dec 2, 2004
- Tessera, Inc.
- Thomas H. DiStefano
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
Microelectronic spring contact elements
- Publication number 20040198081
- Publication date Oct 7, 2004
- Benjamin N. Eldridge
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
Method of manufacturing a probe card
- Publication number 20040194299
- Publication date Oct 7, 2004
- FormFactor, Inc.
- Gary W. Grube
- G01 - MEASURING TESTING
Information Patent Application
Tested semiconductor device produced by an interconnection element...
- Publication number 20040177499
- Publication date Sep 16, 2004
- Benjamin N. Eldridge
- G01 - MEASURING TESTING
Information Patent Application
Contact carriers (tiles) for populating larger substrates with spri...
- Publication number 20040163252
- Publication date Aug 26, 2004
- FormFactor, Inc.
- Igor Y. Khandros
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR

Gaetan L. Mathieu

Person

Patents Grantslast 30 patents

Exporting a selected group of micro-objects from a micro-fluidic de...

Exporting a selected group of micro-objects from a micro-fluidic de...

Method of wirebonding that utilizes a gas flow within a capillary f...

Carbon nanotube columns and methods of making and using carbon nano...

Multilayered probe card

Printing of redistribution traces on electronic component

Composite motion probing

Method and apparatus for adjusting a multi-substrate probe structure

Component assembly and alignment

Microelectronic contact structures

Methods for planarizing a semiconductor contactor

Electronic device testing using a probe tip having multiple contact...

Apparatus and method for adjusting an orientation of probes

Three dimensional microstructures and methods for making three dime...

Method and system for compensating thermally induced motion of prob...

Method of manufacturing a resilient contact

Apparatus and method for managing thermally induced motion of a pro...

Microelectronic spring contact elements

Method of making lithographic contact elements

Spring interconnect structures

Integrated circuit assembly

Method and apparatus for adjusting a multi-substrate probe structure

Methods of probing an electronic device

Shaped spring

Variable width resilient conductive contact structures

Composite wiring structure having a wiring block and an insulating...

Spring interconnect structures

Method for making a socket to perform testing on integrated circuits

Lithographic contact elements

Apparatus and method for managing thermally induced motion of a pro...

Patents Applicationslast 30 patents

Exporting a Selected Group of Micro-Objects From a Micro-Fluidic De...

Exporting a Selected Group of Micro-Objects From a Micro-Fluidic De...

METHOD OF MANUFACTURING A PROBE CARD

SPRING INTERCONNECT STRUCTURES

CONTACT TIP STRUCTURE FOR MICROELECTRONIC INTERCONNECTION ELEMENTS...

LITHOGRAPHIC CONTACT ELEMENTS

METHODS FOR PLANARIZING A SEMICONDUCTOR CONTACTOR

PROBING A DEVICE

Method of Manufacturing a Probe Card

Probe For Semiconductor Devices

Composite Motion Probing

Apparatus And Method For Adjusting An Orientation Of Probes

Method of Manufacturing A Probe Card

Method and apparatus for adjusting a multi-substrate probe structure

SOCKETS FOR "SPRINGED" SEMICONDUCTOR DEVICES

Electroform spring built on mandrel transferable to other surface

Mechanically reconfigurable vertical tester interface for IC probing

Method to build robust mechanical structures on substrate surfaces

Probing a device

Method for making a socket to perform testing on integrated circuits

Method of manufacturing a probe card

Lithographic contact elements

Methods for making vertical electric feed through structures usable...

Methods for making plated through holes usable as interconnection w...

Methods for planarizing a semiconductor contactor

Connection components with frangible leads and bus

Microelectronic spring contact elements

Method of manufacturing a probe card

Tested semiconductor device produced by an interconnection element...

Contact carriers (tiles) for populating larger substrates with spri...