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Kyoto-shi, JP
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last 30 patents
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Patent Grant
Measurement apparatus, and method for operating measurement apparatus
Patent number
10,234,414
Issue date
Mar 19, 2019
ARKRAY, Inc.
Yuji Kurata
G01 - MEASURING TESTING
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last 30 patents
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Patent Application
MEASUREMENT SYSTEM
Publication number
20240077450
Publication date
Mar 7, 2024
ARKRAY, Inc.
Gai GO
G01 - MEASURING TESTING
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Patent Application
MEASUREMENT APPARATUS, AND METHOD FOR OPERATING MEASUREMENT APPARATUS
Publication number
20160018353
Publication date
Jan 21, 2016
ARKRAY, Inc.
Yuji KURATA
G01 - MEASURING TESTING