Gaku SUDO

Person

Kanagawa-ken, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Semiconductor device
- Patent number 10,283,647
- Issue date May 7, 2019
- TOSHIBA MEMORY CORPORATION
- Koji Matsuo
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device and method for manufacturing the same
- Patent number 10,090,320
- Issue date Oct 2, 2018
- TOSHIBA MEMORY CORPORATION
- Jun Nogami
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device and method for manufacturing same
- Patent number 9,997,526
- Issue date Jun 12, 2018
- TOSHIBA MEMORY CORPORATION
- Gaku Sudo
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device and method for manufacturing same
- Patent number 9,947,681
- Issue date Apr 17, 2018
- TOSHIBA MEMORY CORPORATION
- Gaku Sudo
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Nonvolatile semiconductor memory device and method for manufacturin...
- Patent number 9,831,270
- Issue date Nov 28, 2017
- TOSHIBA MEMORY CORPORATION
- Gaku Sudo
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Memory device
- Patent number 9,384,829
- Issue date Jul 5, 2016
- Kabushiki Kaisha Toshiba
- Hironobu Furuhashi
- G11 - INFORMATION STORAGE
Information Patent Grant
Method for manufacturing fin semiconductor device using dual maskin...
- Patent number 9,178,064
- Issue date Nov 3, 2015
- Kabushiki Kaisha Toshiba
- Gaku Sudo
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Integrated circuit device and method for manufacturing same
- Patent number 9,142,537
- Issue date Sep 22, 2015
- Kabushiki Kaisha Toshiba
- Gaku Sudo
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Integrated circuit device and method for manufacturing same
- Patent number 9,117,888
- Issue date Aug 25, 2015
- Kabushiki Kaisha Toshiba
- Gaku Sudo
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Integrated circuit device and method for manufacturing same
- Patent number 8,866,206
- Issue date Oct 21, 2014
- Kabushiki Kaisha Toshiba
- Gaku Sudo
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device and method for manufacturing same
- Patent number 8,860,104
- Issue date Oct 14, 2014
- Kabushiki Kaisha Toshiba
- Gaku Sudo
- G11 - INFORMATION STORAGE
Information Patent Grant
Method for manufacturing semiconductor device
- Patent number 8,835,268
- Issue date Sep 16, 2014
- Kabushiki Kaisha Toshiba
- Gaku Sudo
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Integrated circuit device and method for manufacturing same
- Patent number 8,816,502
- Issue date Aug 26, 2014
- Kabushiki Kaisha Toshiba
- Gaku Sudo
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device and method for manufacturing same
- Patent number 8,790,979
- Issue date Jul 29, 2014
- Kabushiki Kaisha Toshiba
- Gaku Sudo
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of manufacturing semiconductor device
- Patent number 8,785,325
- Issue date Jul 22, 2014
- Kabushiki Kaisha Toshiba
- Gaku Sudo
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Integrated circuit device with interconnects arranged parallel to e...
- Patent number 8,659,159
- Issue date Feb 25, 2014
- Kabushiki Kaisha Toshiba
- Gaku Sudo
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for manufacturing semiconductor device
- Patent number 8,658,504
- Issue date Feb 25, 2014
- Kabushiki Kaisha Toshiba
- Gaku Sudo
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Manufacturing method of semiconductor device
- Patent number 8,614,138
- Issue date Dec 24, 2013
- Kabushiki Kaisha Toshiba
- Gaku Sudo
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor memory device and method for manufacturing same
- Patent number 8,592,890
- Issue date Nov 26, 2013
- Kabushiki Kaisha Toshiba
- Nobutaka Watanabe
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of manufacturing semiconductor device
- Patent number 8,168,520
- Issue date May 1, 2012
- Kabushiki Kaisha Toshiba
- Gaku Sudo
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device with semiconductor epitaxial layers buried in...
- Patent number 8,154,050
- Issue date Apr 10, 2012
- Kabushiki Kaisha Toshiba
- Gaku Sudo
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Maskless selective boron-doped epitaxial growth
- Patent number 8,153,501
- Issue date Apr 10, 2012
- Toshiba America Electronic Components, Inc.
- Gaku Sudo
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
HOT process STI in SRAM device and method of manufacturing
- Patent number 8,129,790
- Issue date Mar 6, 2012
- Kabushiki Kaisha Toshiba
- Gaku Sudo
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Dual stress liner device and method
- Patent number 8,004,035
- Issue date Aug 23, 2011
- Kabushiki Kaisha Toshiba
- Gaku Sudo
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Solid-state imaging device and method for manufacturing same
- Patent number 7,960,769
- Issue date Jun 14, 2011
- Kabushiki Kaisha Toshiba
- Gaku Sudo
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of forming an SOI substrate contact
- Patent number 7,867,893
- Issue date Jan 11, 2011
- International Business Machines Corporation
- Haining S. Yang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Contact configuration and method in dual-stress liner semiconductor...
- Patent number 7,727,834
- Issue date Jun 1, 2010
- Toshiba America Electronic Components, Inc.
- Gaku Sudo
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Stress relaxation for top of transistor gate
- Patent number 7,592,653
- Issue date Sep 22, 2009
- Toshiba America Electronic Components, Inc.
- Gaku Sudo
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Dual stress liner device and method
- Patent number 7,585,720
- Issue date Sep 8, 2009
- Toshiba America Electronic Components, Inc.
- Gaku Sudo
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
LOCOS on SOI and HOT semiconductor device and method for manufacturing
- Patent number 7,402,885
- Issue date Jul 22, 2008
- Toshiba America Electronic Components, Inc.
- Gaku Sudo
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
SEMICONDUCTOR DEVICE
- Publication number 20180040742
- Publication date Feb 8, 2018
- Toshiba Memory Corporation
- Koji Matsuo
- G11 - INFORMATION STORAGE
Information Patent Application
SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING THE SAME
- Publication number 20170338240
- Publication date Nov 23, 2017
- Kabushiki Kaisha Toshiba
- Jun NOGAMI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
NONVOLATILE SEMICONDUCTOR MEMORY DEVICE AND METHOD FOR MANUFACTURIN...
- Publication number 20170271366
- Publication date Sep 21, 2017
- Kabushiki Kaisha Toshiba
- Gaku SUDO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING SAME
- Publication number 20170213840
- Publication date Jul 27, 2017
- KABUSHIKI KAISHA TOSHIBA
- Gaku Sudo
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INTEGRATED CIRCUIT DEVICE AND METHOD FOR MANUFACTURING SAME
- Publication number 20140374829
- Publication date Dec 25, 2014
- KABUSHIKI KAISHA TOSHIBA
- Gaku SUDO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INTEGRATED CIRCUIT DEVICE AND METHOD FOR MANUFACTURING SAME
- Publication number 20140329384
- Publication date Nov 6, 2014
- Gaku SUDO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MEMORY DEVICE
- Publication number 20140185359
- Publication date Jul 3, 2014
- Hironobu FURUHASHI
- G11 - INFORMATION STORAGE
Information Patent Application
INTEGRATED CIRCUIT DEVICE AND METHOD FOR MANUFACTURING SAME
- Publication number 20140145350
- Publication date May 29, 2014
- Kabushiki Kaisha Toshiba
- Gaku SUDO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MANUFACTURING METHOD OF SEMICONDUCTOR DEVICE AND SEMICONDUCTOR DEVICE
- Publication number 20140021555
- Publication date Jan 23, 2014
- Kabushiki Kaisha Toshiba
- Shota ISHIBASHI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING SAME
- Publication number 20140008706
- Publication date Jan 9, 2014
- Kabushiki Kaisha Toshiba
- Gaku SUDO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE
- Publication number 20130230953
- Publication date Sep 5, 2013
- Gaku SUDO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MANUFACTURING METHOD OF SEMICONDUCTOR DEVICE
- Publication number 20130230965
- Publication date Sep 5, 2013
- Gaku SUDO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE
- Publication number 20130065326
- Publication date Mar 14, 2013
- Gaku SUDO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING SAME
- Publication number 20130056810
- Publication date Mar 7, 2013
- Gaku SUDO
- G11 - INFORMATION STORAGE
Information Patent Application
METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE
- Publication number 20130059401
- Publication date Mar 7, 2013
- Gaku SUDO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INTEGRATED CIRCUIT DEVICE AND METHOD FOR MANUFACTURING SAME
- Publication number 20130037871
- Publication date Feb 14, 2013
- Kabushiki Kaisha Toshiba
- Gaku SUDO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INTEGRATED CIRCUIT DEVICE AND METHOD FOR MANUFACTURING SAME
- Publication number 20120261831
- Publication date Oct 18, 2012
- Gaku SUDO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE
- Publication number 20120205750
- Publication date Aug 16, 2012
- Gaku SUDO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR MEMORY DEVICE AND METHOD FOR MANUFACTURING SAME
- Publication number 20120061743
- Publication date Mar 15, 2012
- Kabushiki Kaisha Toshiba
- Nobutaka WATANABE
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE
- Publication number 20100124815
- Publication date May 20, 2010
- Gaku SUDO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SOLID-STATE IMAGING DEVICE AND METHOD FOR MANUFACTURING SAME
- Publication number 20100032736
- Publication date Feb 11, 2010
- Kabushiki Kaisha Toshiba
- Gaku SUDO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Dual Stress Liner Device and Method
- Publication number 20090289375
- Publication date Nov 26, 2009
- Toshiba America Electronic Components, Inc
- Gaku Sudo
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
HOT process STI in SRAM device and method of manufacturing
- Publication number 20090230504
- Publication date Sep 17, 2009
- Kabushiki Kaisha Toshiba
- Gaku Sudo
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MASKLESS SELECTIVE BORON-DOPED EPITAXIAL GROWTH
- Publication number 20090224368
- Publication date Sep 10, 2009
- Toshiba America Electronic Components, Inc
- Gaku Sudo
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Contact Configuration and Method in Dual-Stress Liner Semiconductor...
- Publication number 20090206414
- Publication date Aug 20, 2009
- Toshiba America Electronic Components, Inc
- Gaku Sudo
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE AND FABRICATION METHOD OF THE SAME
- Publication number 20090039399
- Publication date Feb 12, 2009
- Gaku SUDO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING THE SAME
- Publication number 20090032843
- Publication date Feb 5, 2009
- Atsushi OHTA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF FORMING AN SOI SUBSTRATE CONTACT
- Publication number 20090001466
- Publication date Jan 1, 2009
- International Business Machines Corporation
- Haining S. Yang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
P-Channel FET Whose Hole Mobility is Improved by Applying Stress to...
- Publication number 20080251842
- Publication date Oct 16, 2008
- Gaku SUDO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Reducing Crystal Defects from Hybrid Orientation Technology During...
- Publication number 20080124847
- Publication date May 29, 2008
- Toshiba America Electronic Components, Inc
- Gaku Sudo
- H01 - BASIC ELECTRIC ELEMENTS

Person

Patents Grantslast 30 patents

Semiconductor device

Semiconductor device and method for manufacturing the same

Semiconductor device and method for manufacturing same

Semiconductor device and method for manufacturing same

Nonvolatile semiconductor memory device and method for manufacturin...

Memory device

Method for manufacturing fin semiconductor device using dual maskin...

Integrated circuit device and method for manufacturing same

Integrated circuit device and method for manufacturing same

Integrated circuit device and method for manufacturing same

Semiconductor device and method for manufacturing same

Method for manufacturing semiconductor device

Integrated circuit device and method for manufacturing same

Semiconductor device and method for manufacturing same

Method of manufacturing semiconductor device

Integrated circuit device with interconnects arranged parallel to e...

Method for manufacturing semiconductor device

Manufacturing method of semiconductor device

Semiconductor memory device and method for manufacturing same

Method of manufacturing semiconductor device

Semiconductor device with semiconductor epitaxial layers buried in...

Maskless selective boron-doped epitaxial growth

HOT process STI in SRAM device and method of manufacturing

Dual stress liner device and method

Solid-state imaging device and method for manufacturing same

Method of forming an SOI substrate contact

Contact configuration and method in dual-stress liner semiconductor...

Stress relaxation for top of transistor gate

Dual stress liner device and method

LOCOS on SOI and HOT semiconductor device and method for manufacturing

Patents Applicationslast 30 patents

SEMICONDUCTOR DEVICE

SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING THE SAME

NONVOLATILE SEMICONDUCTOR MEMORY DEVICE AND METHOD FOR MANUFACTURIN...

SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING SAME

INTEGRATED CIRCUIT DEVICE AND METHOD FOR MANUFACTURING SAME

INTEGRATED CIRCUIT DEVICE AND METHOD FOR MANUFACTURING SAME

MEMORY DEVICE

INTEGRATED CIRCUIT DEVICE AND METHOD FOR MANUFACTURING SAME

MANUFACTURING METHOD OF SEMICONDUCTOR DEVICE AND SEMICONDUCTOR DEVICE

SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING SAME

METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE

MANUFACTURING METHOD OF SEMICONDUCTOR DEVICE

METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE

SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING SAME

METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE

INTEGRATED CIRCUIT DEVICE AND METHOD FOR MANUFACTURING SAME

INTEGRATED CIRCUIT DEVICE AND METHOD FOR MANUFACTURING SAME

METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE

SEMICONDUCTOR MEMORY DEVICE AND METHOD FOR MANUFACTURING SAME

METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE

SOLID-STATE IMAGING DEVICE AND METHOD FOR MANUFACTURING SAME

Dual Stress Liner Device and Method

HOT process STI in SRAM device and method of manufacturing

MASKLESS SELECTIVE BORON-DOPED EPITAXIAL GROWTH

Contact Configuration and Method in Dual-Stress Liner Semiconductor...

SEMICONDUCTOR DEVICE AND FABRICATION METHOD OF THE SAME

SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING THE SAME

METHOD OF FORMING AN SOI SUBSTRATE CONTACT

P-Channel FET Whose Hole Mobility is Improved by Applying Stress to...

Reducing Crystal Defects from Hybrid Orientation Technology During...