Gal Bruner

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Kibutz Kabri, IL

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Patents Grantslast 30 patents

Information Patent Grant
Analyzing a buried layer of a sample
- Patent number 11,598,633
- Issue date Mar 7, 2023
- Applied Materials Israel Ltd.
- Alexander Mairov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Adaptive geometry for optimal focused ion beam etching
- Patent number 11,315,754
- Issue date Apr 26, 2022
- Applied Materials Israel Ltd.
- Ilya Blayvas
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
METHOD TO MORE PRECISELY CALIBRATE THE MECHANICAL TILT AND ROTATION...
- Publication number 20250054726
- Publication date Feb 13, 2025
- APPLIED MATERIALS ISRAEL LTD.
- Yehuda Zur
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
FLOW FOR HIGH RESOLUTION STEREOSCOPIC MEASUREMENTS
- Publication number 20240339289
- Publication date Oct 10, 2024
- APPLIED MATERIALS ISRAEL LTD.
- Adar Sonn-Segev
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ANALYZING A BURIED LAYER OF A SAMPLE
- Publication number 20230019567
- Publication date Jan 19, 2023
- APPLIED MATERIALS ISRAEL LTD.
- Alexander Mairov
- G01 - MEASURING TESTING
Information Patent Application
ADAPTIVE GEOMETRY FOR OPTIMAL FOCUSED ION BEAM ETCHING
- Publication number 20210335571
- Publication date Oct 28, 2021
- APPLIED MATERIALS ISRAEL LTD.
- Ilya Blayvas
- H01 - BASIC ELECTRIC ELEMENTS