Gal Daniel GUTTERMAN

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Meitar, IL

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Patents Grantslast 30 patents

Information Patent Grant
Image generation for examination of a semiconductor specimen
- Patent number 11,995,848
- Issue date May 28, 2024
- Applied Materials Israel Ltd.
- David Uliel
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Local shape deviation in a semiconductor specimen
- Patent number 11,686,571
- Issue date Jun 27, 2023
- Applied Materials Israel Ltd.
- Roman Kris
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
LOCAL SHAPE DEVIATION IN A SEMICONDUCTOR SPECIMEN
- Publication number 20230069303
- Publication date Mar 2, 2023
- APPLIED MATERIALS ISRAEL LTD.
- Roman KRIS
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
IMAGE GENERATION FOR EXAMINATION OF A SEMICONDUCTOR SPECIMEN
- Publication number 20220301196
- Publication date Sep 22, 2022
- APPLIED MATERIALS ISRAEL LTD.
- David ULIEL
- G06 - COMPUTING CALCULATING COUNTING