Galen Gledhill

Person

Hillsboro, OR, US

People

Patents Grantslast 30 patents

Information Patent Grant
Optical alignment correction using convolutional neural network eva...
- Patent number 10,923,318
- Issue date Feb 16, 2021
- FEI Company
- Galen Gledhill
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Combined SEM-CL and FIB-IOE microscopy
- Patent number 10,896,802
- Issue date Jan 19, 2021
- FEI Company
- Mostafa Maazouz
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for enhancing SE detection in mirror-based lig...
- Patent number 10,692,694
- Issue date Jun 23, 2020
- FEI Company
- Galen Gledhill
- G02 - OPTICS

Patents Applicationslast 30 patents

Information Patent Application
FIB AND SEM RESOLUTION ENHANCEMENT USING ASYMMETRIC PROBE DECONVOLU...
- Publication number 20250029809
- Publication date Jan 23, 2025
- FEI Company
- Galen GLEDHILL
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHODS AND SYSTEMS FOR ELEMENTAL MAPPING
- Publication number 20240429018
- Publication date Dec 26, 2024
- FEI Company
- Garrett BUDNIK
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
FOCUSED ION BEAM SYSTEM AND METHOD
- Publication number 20230420213
- Publication date Dec 28, 2023
- FEI Company
- Alexander HENSTRA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHODS AND SYSTEMS FOR ELEMENTAL MAPPING
- Publication number 20230095798
- Publication date Mar 30, 2023
- FEI Company
- Garrett BUDNIK
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
OPTICAL ALIGNMENT CORRECTION USING CONVOLUTIONAL NEURAL NETWORK EVA...
- Publication number 20200203122
- Publication date Jun 25, 2020
- FEI Company
- Galen Gledhill
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
COMBINED SEM-CL AND FIB-IOE MICROSCOPY
- Publication number 20190198288
- Publication date Jun 27, 2019
- FEI Company
- Mostafa Maazouz
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MIRROR-BASED LIGHT IMAGING CHARGED PARTICLE MICROSCOPES
- Publication number 20190198289
- Publication date Jun 27, 2019
- FEI Company
- Galen Gledhill
- G02 - OPTICS

Galen Gledhill

Person

Patents Grantslast 30 patents

Optical alignment correction using convolutional neural network eva...

Combined SEM-CL and FIB-IOE microscopy

Method and apparatus for enhancing SE detection in mirror-based lig...

Patents Applicationslast 30 patents

FIB AND SEM RESOLUTION ENHANCEMENT USING ASYMMETRIC PROBE DECONVOLU...

METHODS AND SYSTEMS FOR ELEMENTAL MAPPING

FOCUSED ION BEAM SYSTEM AND METHOD

METHODS AND SYSTEMS FOR ELEMENTAL MAPPING

OPTICAL ALIGNMENT CORRECTION USING CONVOLUTIONAL NEURAL NETWORK EVA...

COMBINED SEM-CL AND FIB-IOE MICROSCOPY

MIRROR-BASED LIGHT IMAGING CHARGED PARTICLE MICROSCOPES