Galen L. Pfeiffer

Person

Roca, NE, US

People

Patents Grantslast 30 patents

Information Patent Grant
Reflectometer, spectrophotometer, ellipsometer or polarimeter syste...
- Patent number 11,885,738
- Issue date Jan 30, 2024
- J. A. Woollam Co., Inc.
- Martin M. Liphardt
- G01 - MEASURING TESTING
Information Patent Grant
Beam focusing and reflective optics
- Patent number 10,989,601
- Issue date Apr 27, 2021
- J. A. Woollam Co., Inc.
- Martin M. Liphardt
- G01 - MEASURING TESTING
Information Patent Grant
Reflectometer, spectrophotometer, ellipsometer or polarimeter syste...
- Patent number 10,859,439
- Issue date Dec 8, 2020
- J. A. Woollam Co., Inc.
- Martin M. Lihardt
- G01 - MEASURING TESTING
Information Patent Grant
Ellipsometer or polarimeter system having at least one rotating ele...
- Patent number 10,775,298
- Issue date Sep 15, 2020
- J.A. WOOLLAM CO., INC.
- Christopher D. Hassler
- F16 - ENGINEERING ELEMENTS AND UNITS GENERAL MEASURES FOR PRODUCING AND MAINT...
Information Patent Grant
Theta-theta sample positioning stage with application to sample map...
- Patent number 10,444,140
- Issue date Oct 15, 2019
- J. A. Woollam Co., Inc.
- Griffin A. P. Hovorka
- G01 - MEASURING TESTING
Information Patent Grant
Beam focusing and reflecting optics with enhanced detector system
- Patent number 10,338,362
- Issue date Jul 2, 2019
- J. A. Woollam Co., Inc.
- Martin M. Liphardt
- G02 - OPTICS
Information Patent Grant
Beam focusing and reflective optics
- Patent number 10,018,815
- Issue date Jul 10, 2018
- J.A. Woolam Co., Inc.
- Martin M. Liphardt
- G02 - OPTICS
Information Patent Grant
Beam focusing and beam collecting optics with wavelength dependent...
- Patent number 9,921,395
- Issue date Mar 20, 2018
- J. A. Woollam Co., Inc.
- Martin M. Liphardt
- G02 - OPTICS
Information Patent Grant
System for viewing samples that are undergoing ellipsometric invest...
- Patent number 9,658,151
- Issue date May 23, 2017
- J. A. Woollam Co., Inc.
- Martin M. Liphardt
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Beam focusing and beam collecting optics
- Patent number 9,500,843
- Issue date Nov 22, 2016
- J. A. Woollam Co., Inc.
- Martin M. Liphardt
- G02 - OPTICS
Information Patent Grant
Reflective focusing optics
- Patent number 9,442,016
- Issue date Sep 13, 2016
- J. A. Woollam Co., Inc.
- Martin M. Liphardt
- G01 - MEASURING TESTING
Information Patent Grant
System for determining average ellipsometric parameters for planar...
- Patent number 9,360,369
- Issue date Jun 7, 2016
- J. A. Woollam Co., Inc.
- Galen L. Pfeiffer
- G01 - MEASURING TESTING
Information Patent Grant
In line ellipsometer system and method of use
- Patent number 9,347,768
- Issue date May 24, 2016
- J. A. Woollam Co., Inc.
- Galen L. Pfeiffer
- G01 - MEASURING TESTING
Information Patent Grant
System for viewing samples that are undergoing ellipsometric invest...
- Patent number 8,953,030
- Issue date Feb 10, 2015
- J. A. Woollam Co., Inc.
- Martin M. Liphardt
- G01 - MEASURING TESTING
Information Patent Grant
DLP base small spot investigation system
- Patent number 8,749,782
- Issue date Jun 10, 2014
- J. A. Woollam Co., Inc.
- Martin M. Liphardt
- G01 - MEASURING TESTING
Information Patent Grant
Small volume cell
- Patent number 8,531,665
- Issue date Sep 10, 2013
- J. A. Woollam Co., Inc.
- Galen L. Pfeiffer
- G01 - MEASURING TESTING
Information Patent Grant
Small volume cell
- Patent number 8,493,565
- Issue date Jul 23, 2013
- J.A. Wollam Co., Inc.
- Galen L. Pfeiffer
- G01 - MEASURING TESTING
Information Patent Grant
Fast sample height, AOI and POI alignment in mapping ellipsometer o...
- Patent number 8,436,994
- Issue date May 7, 2013
- J. A. Woollam Co., Inc.
- Martin M. Liphardt
- G01 - MEASURING TESTING
Information Patent Grant
Small volume cell
- Patent number 8,130,375
- Issue date Mar 6, 2012
- J. A. Woollam Co., Inc.
- Galen L. Pfeiffer
- G01 - MEASURING TESTING
Information Patent Grant
Fast sample height, AOI and POI alignment in mapping ellipsometer o...
- Patent number 7,872,751
- Issue date Jan 18, 2011
- J. A. Woollam Co., Inc.
- Martin M. Liphardt
- G01 - MEASURING TESTING
Information Patent Grant
System and method for controlling intensity of a beam of electromag...
- Patent number 7,830,512
- Issue date Nov 9, 2010
- J. A. Woollam Co., Inc.
- Galen L. Pfeiffer
- G01 - MEASURING TESTING
Information Patent Grant
System for controlling intensity of a beam of electromagnetic radia...
- Patent number 7,821,637
- Issue date Oct 26, 2010
- J. A. Woollam Co., Inc.
- Galen L. Pfeiffer
- G01 - MEASURING TESTING
Information Patent Grant
Small volume cell
- Patent number 7,817,266
- Issue date Oct 19, 2010
- J. A. Woollam Co., Inc.
- Galen L. Pfeiffer
- G01 - MEASURING TESTING
Information Patent Grant
System and method of controlling intensity of an electromagnetic beam
- Patent number 7,796,260
- Issue date Sep 14, 2010
- J. A. Woollam Co., Inc.
- Blaine D. Johs
- G01 - MEASURING TESTING
Information Patent Grant
Spectroscopic ellipsometer and polarimeter systems
- Patent number 7,633,625
- Issue date Dec 15, 2009
- J. A. Woollam Co., Inc.
- John A. Woollam
- G01 - MEASURING TESTING
Information Patent Grant
Spectroscopic ellipsometer and polarimeter systems
- Patent number 7,616,319
- Issue date Nov 10, 2009
- James D. Welch
- John A. Woollam
- G01 - MEASURING TESTING
Information Patent Grant
Beam chromatic shifting and directing means
- Patent number 7,535,566
- Issue date May 19, 2009
- J. A. Woollam Co., Inc.
- Blaine D. Johs
- G01 - MEASURING TESTING
Information Patent Grant
System for and method of investigating the exact same point on a sa...
- Patent number 7,508,510
- Issue date Mar 24, 2009
- J.A. Wooliam Co., Inc.
- Galen L. Pfeiffer
- G01 - MEASURING TESTING
Information Patent Grant
System for reducing stress induced effects during determination of...
- Patent number 7,349,092
- Issue date Mar 25, 2008
- J. A. Woollam Co., Inc.
- Thomas E. Tiwald
- G01 - MEASURING TESTING
Information Patent Grant
Spectrophotometer, ellipsometer, polarimeter and the like systems
- Patent number 7,327,456
- Issue date Feb 5, 2008
- J. A. Woollam Co., Inc.
- John A. Woollam
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
BEAM FOCUSING AND BEAM COLLECTING OPTICS
- Publication number 20160356998
- Publication date Dec 8, 2016
- J. A. WOOLLAM CO., INC.
- Martin M. Liphardt
- G02 - OPTICS
Information Patent Application
Reflective focusing optics
- Publication number 20150355029
- Publication date Dec 10, 2015
- J. A. WOOLLAM CO., INC.
- Martin M. Liphardt
- G02 - OPTICS
Information Patent Application
System for viewing samples that are undergoing ellipsometric invest...
- Publication number 20150185136
- Publication date Jul 2, 2015
- J. A. WOOLLAM CO., INC.
- Martin M. Liphardt
- G01 - MEASURING TESTING
Information Patent Application
Fast sample height, AOI and POI alignment in mapping ellipsometer o...
- Publication number 20110109906
- Publication date May 12, 2011
- Martin M. Liphardt
- G01 - MEASURING TESTING
Information Patent Application
System and method for controlling intensity of a beam of electromag...
- Publication number 20090231700
- Publication date Sep 17, 2009
- Galen L. Pfeiffer
- G02 - OPTICS
Information Patent Application
Fast sample height, AOI and POI alignment in mapping ellipsometer o...
- Publication number 20090103093
- Publication date Apr 23, 2009
- Martin M. Liphardt
- G01 - MEASURING TESTING
Information Patent Application
Small volume cell
- Publication number 20090027679
- Publication date Jan 29, 2009
- Galen L. Pfeiffer
- G01 - MEASURING TESTING
Information Patent Application
System for and method of investigating the exact same point on a sa...
- Publication number 20070097373
- Publication date May 3, 2007
- Galen L. Pfeiffer
- G01 - MEASURING TESTING

Galen L. Pfeiffer

Person

Patents Grantslast 30 patents

Reflectometer, spectrophotometer, ellipsometer or polarimeter syste...

Beam focusing and reflective optics

Reflectometer, spectrophotometer, ellipsometer or polarimeter syste...

Ellipsometer or polarimeter system having at least one rotating ele...

Theta-theta sample positioning stage with application to sample map...

Beam focusing and reflecting optics with enhanced detector system

Beam focusing and reflective optics

Beam focusing and beam collecting optics with wavelength dependent...

System for viewing samples that are undergoing ellipsometric invest...

Beam focusing and beam collecting optics

Reflective focusing optics

System for determining average ellipsometric parameters for planar...

In line ellipsometer system and method of use

System for viewing samples that are undergoing ellipsometric invest...

DLP base small spot investigation system

Small volume cell

Small volume cell

Fast sample height, AOI and POI alignment in mapping ellipsometer o...

Small volume cell

Fast sample height, AOI and POI alignment in mapping ellipsometer o...

System and method for controlling intensity of a beam of electromag...

System for controlling intensity of a beam of electromagnetic radia...

Small volume cell

System and method of controlling intensity of an electromagnetic beam

Spectroscopic ellipsometer and polarimeter systems

Spectroscopic ellipsometer and polarimeter systems

Beam chromatic shifting and directing means

System for and method of investigating the exact same point on a sa...

System for reducing stress induced effects during determination of...

Spectrophotometer, ellipsometer, polarimeter and the like systems

Patents Applicationslast 30 patents

BEAM FOCUSING AND BEAM COLLECTING OPTICS

Reflective focusing optics

System for viewing samples that are undergoing ellipsometric invest...

Fast sample height, AOI and POI alignment in mapping ellipsometer o...

System and method for controlling intensity of a beam of electromag...

Fast sample height, AOI and POI alignment in mapping ellipsometer o...

Small volume cell

System for and method of investigating the exact same point on a sa...