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Gang Chen
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Wilsonville, OR, US
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Patents Grants
last 30 patents
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Patent Grant
Fault dictionaries for integrated circuit yield and quality analysi...
Patent number
7,987,442
Issue date
Jul 26, 2011
Mentor Graphics Corporation
Janusz Rajski
G01 - MEASURING TESTING
Information
Patent Grant
Determining and analyzing integrated circuit yield and quality
Patent number
7,512,508
Issue date
Mar 31, 2009
Janusz Rajski
G06 - COMPUTING CALCULATING COUNTING
Patents Applications
last 30 patents
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Patent Application
DETERMINING AND ANALYZING INTEGRATED CIRCUIT YIELD AND QUALITY
Publication number
20090210183
Publication date
Aug 20, 2009
Janusz Rajski
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Determining and analyzing integrated circuit yield and quality
Publication number
20060066339
Publication date
Mar 30, 2006
Janusz Rajski
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Fault dictionaries for integrated circuit yield and quality analysi...
Publication number
20060066338
Publication date
Mar 30, 2006
Janusz Rajski
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Integrated circuit yield and quality analysis methods and systems
Publication number
20060053357
Publication date
Mar 9, 2006
Janusz Rajski
G06 - COMPUTING CALCULATING COUNTING