Gang Wang

Person

Grover, MO, US

People

Patents Grantslast 30 patents

Information Patent Grant
Methods for etching a semiconductor structure and for conditioning...
- Patent number 12,009,249
- Issue date Jun 11, 2024
- GlobalWafers Co., Ltd.
- Gang Wang
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Methods for conditioning a processing reactor
- Patent number 11,926,892
- Issue date Mar 12, 2024
- GlobalWafers Co., Ltd.
- Gang Wang
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
High resistivity semiconductor-on-insulator wafer and a method of m...
- Patent number 11,699,615
- Issue date Jul 11, 2023
- GlobalWafers Co., Ltd.
- Igor Peidous
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
CVD apparatus
- Patent number 11,598,021
- Issue date Mar 7, 2023
- GlobalWafers Co., Ltd.
- Shawn George Thomas
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
High resistivity SOI wafers and a method of manufacturing thereof
- Patent number 11,594,446
- Issue date Feb 28, 2023
- GlobalWafers Co., Ltd.
- Igor Peidous
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Methods for etching a semiconductor structure and for conditioning...
- Patent number 11,515,196
- Issue date Nov 29, 2022
- GlobalWafers Co., Ltd.
- Gang Wang
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Methods for conditioning a processing reactor
- Patent number 11,495,487
- Issue date Nov 8, 2022
- GlobalWafers Co., Ltd.
- Gang Wang
- B08 - CLEANING
Information Patent Grant
High resistivity silicon-on-insulator substrate having enhanced cha...
- Patent number 11,239,107
- Issue date Feb 1, 2022
- GlobalWafers Co., Ltd.
- Gang Wang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Light assisted platelet formation facilitating layer transfer from...
- Patent number 11,173,697
- Issue date Nov 16, 2021
- GlobalWafers Co., Ltd.
- Gang Wang
- B32 - LAYERED PRODUCTS
Information Patent Grant
High resistivity silicon-on-insulator structure and method of manuf...
- Patent number 11,145,538
- Issue date Oct 12, 2021
- GlobalWafers Co., Ltd.
- Jeffery L. Libbert
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
High resistivity semiconductor-on-insulator wafer and a method of m...
- Patent number 11,139,198
- Issue date Oct 5, 2021
- GlobalWafers Co., Ltd.
- Igor Peidous
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
High resistivity SOI wafers and a method of manufacturing thereof
- Patent number 11,081,386
- Issue date Aug 3, 2021
- GlobalWafers Co., Ltd.
- Igor Peidous
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Methods for assessing semiconductor structures
- Patent number 11,081,407
- Issue date Aug 3, 2021
- GlobalWafers Co., Ltd.
- Igor Rapoport
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Manufacturing method of smoothing a semiconductor surface
- Patent number 10,985,049
- Issue date Apr 20, 2021
- GlobalWafers Co., Ltd.
- Gang Wang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
High resistivity SOI wafers and a method of manufacturing thereof
- Patent number 10,910,257
- Issue date Feb 2, 2021
- GlobalWafers Co., Ltd.
- Igor Peidous
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
High resistivity silicon-on-insulator substrate having enhanced cha...
- Patent number 10,832,937
- Issue date Nov 10, 2020
- GlobalWafers Co., Ltd.
- Gang Wang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Manufacturing method of smoothing a semiconductor surface
- Patent number 10,818,539
- Issue date Oct 27, 2020
- GlobalWafers Co., Ltd.
- Gang Wang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Manufacture of group IIIA-nitride layers on semiconductor on insula...
- Patent number 10,796,905
- Issue date Oct 6, 2020
- GlobalWafers Co., Ltd.
- Gang Wang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of depositing charge trapping polycrystalline silicon films...
- Patent number 10,784,146
- Issue date Sep 22, 2020
- GlobalWafers Co., Ltd.
- Gang Wang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Manufacturing method of smoothing a semiconductor surface
- Patent number 10,755,966
- Issue date Aug 25, 2020
- GlobaWafers Co., Ltd.
- Gang Wang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
High resistivity silicon-on-insulator substrate having enhanced cha...
- Patent number 10,741,437
- Issue date Aug 11, 2020
- GlobalWafers Co., Ltd.
- Gang Wang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of depositing charge trapping polycrystalline silicon films...
- Patent number 10,658,227
- Issue date May 19, 2020
- GlobalWafers Co., Ltd.
- Gang Wang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
High resistivity silicon-on-insulator substrate having enhanced cha...
- Patent number 10,546,771
- Issue date Jan 28, 2020
- GlobalWafers Co., Ltd.
- Gang Wang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Manufacturing method of smoothing a semiconductor surface
- Patent number 10,529,616
- Issue date Jan 7, 2020
- GlobalWafers Co., Ltd.
- Gang Wang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of manufacturing silicon germanium-on-insulator
- Patent number 10,510,583
- Issue date Dec 17, 2019
- GlobalWafers Co., Ltd.
- Gang Wang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Methods for assessing semiconductor structures
- Patent number 10,490,464
- Issue date Nov 26, 2019
- GlobalWafers Co., Ltd.
- Igor Rapoport
- G01 - MEASURING TESTING
Information Patent Grant
High resistivity silicon-on-insulator wafer manufacturing method fo...
- Patent number 10,483,379
- Issue date Nov 19, 2019
- GlobalWafers Co., Ltd.
- Qingmin Liu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
High resistivity semiconductor-on-insulator wafer and a method of m...
- Patent number 10,483,152
- Issue date Nov 19, 2019
- GlobalWafers Co., Ltd.
- Igor Peidous
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
High resistivity silicon-on-insulator structure and method of manuf...
- Patent number 10,468,295
- Issue date Nov 5, 2019
- GLOBALWAFERS CO. LTD.
- Jeffery L. Libbert
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
High resistivity silicon-on-insulator substrate comprising a charge...
- Patent number 10,468,294
- Issue date Nov 5, 2019
- GlobalWafers Co., Ltd.
- Igor Peidous
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
METHODS FOR ETCHING A SEMICONDUCTOR STRUCTURE AND FOR CONDITIONING...
- Publication number 20230047866
- Publication date Feb 16, 2023
- GLOBALWAFERS CO., LTD.
- Gang Wang
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
METHODS FOR ETCHING A SEMICONDUCTOR STRUCTURE AND FOR CONDITIONING...
- Publication number 20220375781
- Publication date Nov 24, 2022
- GLOBALWAFERS CO., LTD.
- Gang Wang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHODS FOR CONDITIONING A PROCESSING REACTOR
- Publication number 20220367238
- Publication date Nov 17, 2022
- GLOBALWAFERS CO., LTD.
- Gang Wang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHODS FOR CONDITIONING A PROCESSING REACTOR
- Publication number 20220367239
- Publication date Nov 17, 2022
- GLOBALWAFERS CO., LTD.
- Gang Wang
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
HIGH RESISTIVITY SEMICONDUCTOR-ON-INSULATOR WAFER AND A METHOD OF M...
- Publication number 20210384070
- Publication date Dec 9, 2021
- GLOBALWAFERS CO., LTD.
- Igor Peidous
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
HIGH RESISTIVITY SOI WAFERS AND A METHOD OF MANUFACTURING THEREOF
- Publication number 20210327750
- Publication date Oct 21, 2021
- GLOBALWAFERS CO., LTD.
- Igor Peidous
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
HIGH RESISTIVITY SILICON-ON-INSULATOR SUBSTRATE HAVING ENHANCED CHA...
- Publication number 20210013093
- Publication date Jan 14, 2021
- GLOBALWAFERS CO., LTD.
- Gang Wang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
HIGH RESISTIVITY SOI WAFERS AND A METHOD OF MANUFACTURING THEREOF
- Publication number 20210005507
- Publication date Jan 7, 2021
- GLOBALWAFERS CO., LTD.
- Igor Peidous
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MANUFACTURING METHOD OF SMOOTHING A SEMICONDUCTOR SURFACE
- Publication number 20200411364
- Publication date Dec 31, 2020
- GLOBALWAFERS CO., LTD.
- Gang Wang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
HIGH RESISTIVITY SILICON-ON-INSULATOR SUBSTRATE HAVING ENHANCED CHA...
- Publication number 20200335389
- Publication date Oct 22, 2020
- GLOBALWAFERS CO., LTD.
- Gang Wang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF DEPOSITING CHARGE TRAPPING POLYCRYSTALLINE SILICON FILMS...
- Publication number 20200126848
- Publication date Apr 23, 2020
- GLOBALWAFERS CO., LTD.
- Gang Wang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
HIGH RESISTIVITY SILICON-ON-INSULATOR SUBSTRATE HAVING ENHANCED CHA...
- Publication number 20200126847
- Publication date Apr 23, 2020
- GLOBALWAFERS CO., LTD.
- Gang Wang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHODS FOR ASSESSING SEMICONDUCTOR STRUCTURES
- Publication number 20200058566
- Publication date Feb 20, 2020
- GLOBALWAFERS CO., LTD.
- Igor Rapoport
- G01 - MEASURING TESTING
Information Patent Application
HIGH RESISTIVITY SILICON-ON-INSULATOR STRUCTURE AND METHOD OF MANUF...
- Publication number 20200027778
- Publication date Jan 23, 2020
- GlobalWafers Co. Ltd.
- Jeffery L. Libbert
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MANUFACTURING METHOD OF SMOOTHING A SEMICONDUCTOR SURFACE
- Publication number 20190385901
- Publication date Dec 19, 2019
- GLOBALWAFERS CO., LTD.
- Gang Wang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MANUFACTURING METHOD OF SMOOTHING A SEMICONDUCTOR SURFACE
- Publication number 20190333804
- Publication date Oct 31, 2019
- GLOBALWAFERS CO., LTD.
- Gang Wang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
LIGHT ASSISTED PLATELET FORMATION FACILITATING LAYER TRANSFER FROM...
- Publication number 20190329542
- Publication date Oct 31, 2019
- GLOBALWAFERS CO., LTD.
- Gang Wang
- B32 - LAYERED PRODUCTS
Information Patent Application
METHOD OF MANUFACTURING SILICON GERMANIUM-ON-INSULATOR
- Publication number 20190273015
- Publication date Sep 5, 2019
- GLOBALWAFERS CO., LTD.
- Gang Wang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MANUFACTURE OF GROUP IIIA-NITRIDE LAYERS ON SEMICONDUCTOR ON INSULA...
- Publication number 20190206675
- Publication date Jul 4, 2019
- GLOBALWAFERS CO., LTD.
- Gang Wang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
A METHOD OF MANUFACTURING SILICON GERMANIUM-ON-INSULATOR
- Publication number 20190181036
- Publication date Jun 13, 2019
- SUNEDISON SEMICONDUCTOR LIMITED
- Gang Wang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
HIGH RESISTIVITY SEMICONDUCTOR-ON-INSULATOR WAFER AND A METHOD OF M...
- Publication number 20190139818
- Publication date May 9, 2019
- GlobalWafers Co., Ltd.
- Igor Peidous
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF DEPOSITING CHARGE TRAPPING POLYCRYSTALLINE SILICON FILMS...
- Publication number 20190096745
- Publication date Mar 28, 2019
- GLOBALWAFERS CO., LTD.
- Gang Wang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
HIGH RESISTIVITY SILICON-ON-INSULATOR SUBSTRATE COMPRISING A CHARGE...
- Publication number 20190027397
- Publication date Jan 24, 2019
- Igor Peidous
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
HIGH RESISTIVITY SOI WAFERS AND A METHOD OF MANUFACTURING THEREOF
- Publication number 20180350661
- Publication date Dec 6, 2018
- GLOBALWAFERS CO., LTD.
- Igor Peidous
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MANUFACTURING METHOD OF SMOOTHING A SEMICONDUCTOR SURFACE
- Publication number 20180330983
- Publication date Nov 15, 2018
- SUNEDISON SEMICONDUCTOR LIMITED
- Gang Wang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
A METHOD OF MANUFACTURING SEMICONDUCTOR-ON-INSULATOR
- Publication number 20180294182
- Publication date Oct 11, 2018
- SunEdison Semiconductor Limited (UEN201334164H)
- Gang Wang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
A METHOD OF MANUFACTURING SILICON GERMANIUM-ON-INSULATOR
- Publication number 20180294183
- Publication date Oct 11, 2018
- SUNEDISON SEMICONDUCTOR LIMITED
- Gang Wang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CVD APPARATUS
- Publication number 20180282865
- Publication date Oct 4, 2018
- SUNEDISON SEMICONDUCTOR LIMITED
- Gang Wang
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
METHOD OF DEPOSITING CHARGE TRAPPING POLYCRYSTALLINE SILICON FILMS...
- Publication number 20180233400
- Publication date Aug 16, 2018
- SunEdison Semiconductor Limited (UEN201334164H)
- Gang Wang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHODS FOR ASSESSING SEMICONDUCTOR STRUCTURES
- Publication number 20180233420
- Publication date Aug 16, 2018
- SunEdison Semiconductor Limited (UEN201334164H)
- Igor Rapoport
- H01 - BASIC ELECTRIC ELEMENTS

Person

Patents Grantslast 30 patents

Methods for etching a semiconductor structure and for conditioning...

Methods for conditioning a processing reactor

High resistivity semiconductor-on-insulator wafer and a method of m...

CVD apparatus

High resistivity SOI wafers and a method of manufacturing thereof

Methods for etching a semiconductor structure and for conditioning...

Methods for conditioning a processing reactor

High resistivity silicon-on-insulator substrate having enhanced cha...

Light assisted platelet formation facilitating layer transfer from...

High resistivity silicon-on-insulator structure and method of manuf...

High resistivity semiconductor-on-insulator wafer and a method of m...

High resistivity SOI wafers and a method of manufacturing thereof

Methods for assessing semiconductor structures

Manufacturing method of smoothing a semiconductor surface

High resistivity SOI wafers and a method of manufacturing thereof

High resistivity silicon-on-insulator substrate having enhanced cha...

Manufacturing method of smoothing a semiconductor surface

Manufacture of group IIIA-nitride layers on semiconductor on insula...

Method of depositing charge trapping polycrystalline silicon films...

Manufacturing method of smoothing a semiconductor surface

High resistivity silicon-on-insulator substrate having enhanced cha...

Method of depositing charge trapping polycrystalline silicon films...

High resistivity silicon-on-insulator substrate having enhanced cha...

Manufacturing method of smoothing a semiconductor surface

Method of manufacturing silicon germanium-on-insulator

Methods for assessing semiconductor structures

High resistivity silicon-on-insulator wafer manufacturing method fo...

High resistivity semiconductor-on-insulator wafer and a method of m...

High resistivity silicon-on-insulator structure and method of manuf...

High resistivity silicon-on-insulator substrate comprising a charge...

Patents Applicationslast 30 patents

METHODS FOR ETCHING A SEMICONDUCTOR STRUCTURE AND FOR CONDITIONING...

METHODS FOR ETCHING A SEMICONDUCTOR STRUCTURE AND FOR CONDITIONING...

METHODS FOR CONDITIONING A PROCESSING REACTOR

METHODS FOR CONDITIONING A PROCESSING REACTOR

HIGH RESISTIVITY SEMICONDUCTOR-ON-INSULATOR WAFER AND A METHOD OF M...

HIGH RESISTIVITY SOI WAFERS AND A METHOD OF MANUFACTURING THEREOF

HIGH RESISTIVITY SILICON-ON-INSULATOR SUBSTRATE HAVING ENHANCED CHA...

HIGH RESISTIVITY SOI WAFERS AND A METHOD OF MANUFACTURING THEREOF

MANUFACTURING METHOD OF SMOOTHING A SEMICONDUCTOR SURFACE

HIGH RESISTIVITY SILICON-ON-INSULATOR SUBSTRATE HAVING ENHANCED CHA...

METHOD OF DEPOSITING CHARGE TRAPPING POLYCRYSTALLINE SILICON FILMS...

HIGH RESISTIVITY SILICON-ON-INSULATOR SUBSTRATE HAVING ENHANCED CHA...

METHODS FOR ASSESSING SEMICONDUCTOR STRUCTURES

HIGH RESISTIVITY SILICON-ON-INSULATOR STRUCTURE AND METHOD OF MANUF...

MANUFACTURING METHOD OF SMOOTHING A SEMICONDUCTOR SURFACE

MANUFACTURING METHOD OF SMOOTHING A SEMICONDUCTOR SURFACE

LIGHT ASSISTED PLATELET FORMATION FACILITATING LAYER TRANSFER FROM...

METHOD OF MANUFACTURING SILICON GERMANIUM-ON-INSULATOR

MANUFACTURE OF GROUP IIIA-NITRIDE LAYERS ON SEMICONDUCTOR ON INSULA...

A METHOD OF MANUFACTURING SILICON GERMANIUM-ON-INSULATOR

HIGH RESISTIVITY SEMICONDUCTOR-ON-INSULATOR WAFER AND A METHOD OF M...

METHOD OF DEPOSITING CHARGE TRAPPING POLYCRYSTALLINE SILICON FILMS...

HIGH RESISTIVITY SILICON-ON-INSULATOR SUBSTRATE COMPRISING A CHARGE...

HIGH RESISTIVITY SOI WAFERS AND A METHOD OF MANUFACTURING THEREOF

MANUFACTURING METHOD OF SMOOTHING A SEMICONDUCTOR SURFACE

A METHOD OF MANUFACTURING SEMICONDUCTOR-ON-INSULATOR

A METHOD OF MANUFACTURING SILICON GERMANIUM-ON-INSULATOR

CVD APPARATUS

METHOD OF DEPOSITING CHARGE TRAPPING POLYCRYSTALLINE SILICON FILMS...

METHODS FOR ASSESSING SEMICONDUCTOR STRUCTURES