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Gang Yuan
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Portland, OR, US
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last 30 patents
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Patent Grant
Test pin, method of manufacturing same, and system containing same
Patent number
7,521,949
Issue date
Apr 21, 2009
Intel Corporation
Hongfei Yan
G01 - MEASURING TESTING
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last 30 patents
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Patent Application
Test pin, method of manufacturing same, and system containing same
Publication number
20080278187
Publication date
Nov 13, 2008
Hongfei Yan
G01 - MEASURING TESTING