Gangadhara S. Mathad

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Poughkeepsie, NY, US

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Patents Grantslast 30 patents

Information Patent Grant
Optical measurement of planarized features
- Patent number 6,842,235
- Issue date Jan 11, 2005
- Infineon Technologies North America Corp.
- Syed Shoaib Hasan Zaidi
- G01 - MEASURING TESTING
Information Patent Grant
Method for monitoring the rate of etching of a semiconductor
- Patent number 6,687,014
- Issue date Feb 3, 2004
- Infineon Technologies AG
- Shoaib Hasan Zaidi
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Method for monitoring the rate of etching of a semiconductor
- Publication number 20030133127
- Publication date Jul 17, 2003
- Shoaib Hasan Zaidi
- G01 - MEASURING TESTING
Information Patent Application
Optical measurement of planarized features
- Publication number 20030063272
- Publication date Apr 3, 2003
- Syed Shoaib Hasan Zaidi
- G01 - MEASURING TESTING