Gangadharan Sivaraman

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Chennai, IN

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Patents Grantslast 30 patents

Information Patent Grant
Creating defect samples for array regions
- Patent number 10,620,134
- Issue date Apr 14, 2020
- KLA-Tencor Corp.
- Vidyasagar Anantha
- G01 - MEASURING TESTING
Information Patent Grant
Sub-pixel alignment of inspection to design
- Patent number 9,996,942
- Issue date Jun 12, 2018
- KLA-Tencor Corp.
- Santosh Bhattacharyya
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Repeater detection
- Patent number 9,766,187
- Issue date Sep 19, 2017
- KLA-Tencor Corp.
- Hong Chen
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
METHODS FOR IMPROVING OPTICAL INSPECTION AND METROLOGY IMAGE QUALIT...
- Publication number 20220270212
- Publication date Aug 25, 2022
- KLA Corporation
- Kaushik Sah
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Creating Defect Samples for Array Regions
- Publication number 20190346375
- Publication date Nov 14, 2019
- KLA-Tencor Corporation
- Vidyasagar Anantha
- G01 - MEASURING TESTING
Information Patent Application
Sub-Pixel Alignment of Inspection to Design
- Publication number 20160275672
- Publication date Sep 22, 2016
- KLA-Tencor Corporation
- Santosh Bhattacharyya
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Repeater Detection
- Publication number 20160061745
- Publication date Mar 3, 2016
- KLA-Tencor Corporation
- Hong Chen
- G01 - MEASURING TESTING