Ganggang Zhang

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Beijing, CN

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Patents Grantslast 30 patents

Information Patent Grant
Testing structure and method for interface trap density of gate oxide
- Patent number 9,255,960
- Issue date Feb 9, 2016
- Peking University
- Yandong He
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
TESTING STRUCTURE AND METHOD FOR INTERFACE TRAP DENSITY OF GATE OXIDE
- Publication number 20140247067
- Publication date Sep 4, 2014
- Peking University
- Yandong He
- G01 - MEASURING TESTING