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Palo alto, CA, US
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Patents Grants
last 30 patents
Information
Patent Grant
Multi-bore capillary for mass spectrometer
Patent number
9,236,232
Issue date
Jan 12, 2016
Agilent Technologies, Inc.
Stuart C. Hansen
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Multi-capillary column and high-capacity ionization interface for G...
Patent number
8,841,611
Issue date
Sep 23, 2014
Agilent Technologies, Inc.
Gangqiang Li
G01 - MEASURING TESTING
Information
Patent Grant
Device, system, and method for reflecting ions
Patent number
8,642,951
Issue date
Feb 4, 2014
Agilent Technologies, Inc.
Gangqiang Li
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Tandem ionizer ion source for mass spectrometer and method of use
Patent number
7,939,798
Issue date
May 10, 2011
Agilent Technologies, Inc.
Gangqiang Li
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Mass spectrometer and electric field source for mass spectrometer
Patent number
7,755,040
Issue date
Jul 13, 2010
Agilent Technologies, Inc.
Gangqiang Li
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Micro fluidic gas assisted ionization structure and method
Patent number
7,642,508
Issue date
Jan 5, 2010
Agilent Technologies, Inc.
Gangqiang Li
B05 - SPRAYING OR ATOMISING IN GENERAL APPLYING LIQUIDS OR OTHER FLUENT MATER...
Information
Patent Grant
Ion extraction pulser and method for mass spectrometry
Patent number
7,619,213
Issue date
Nov 17, 2009
Agilent Technologies, Inc.
Gangqiang Li
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Segmented rod multipole as ion processing cell
Patent number
7,557,343
Issue date
Jul 7, 2009
Agilent Technologies, Inc.
Stuart C. Hansen
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Mass spectrometer interface for atmospheric ionization ion sources
Patent number
7,534,997
Issue date
May 19, 2009
Agilent Technologies, Inc.
Gangqiang Li
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Micro fluidic gas assisted ionization device and method
Patent number
7,495,210
Issue date
Feb 24, 2009
Agilent Technologies, Inc.
Gangqiang Li
B05 - SPRAYING OR ATOMISING IN GENERAL APPLYING LIQUIDS OR OTHER FLUENT MATER...
Information
Patent Grant
Methods and compositions for combining ions and charged particles
Patent number
7,449,687
Issue date
Nov 11, 2008
Agilent Technologies, Inc.
Gangqiang Li
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Multi-channel high-field asymmetric waveform ion mobility spectrometry
Patent number
7,397,027
Issue date
Jul 8, 2008
Agilent Technologies, Inc.
Gangqiang Li
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus and method for gas flow management
Patent number
7,397,028
Issue date
Jul 8, 2008
Agilent Technologies, Inc.
Reid A. Brennen
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Time-of-flight spectrometer with orthogonal pulsed ion detection
Patent number
7,388,193
Issue date
Jun 17, 2008
Agilent Technologies, Inc.
Gangqiang Li
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Lens device for introducing a second ion beam into a primary ion path
Patent number
7,372,042
Issue date
May 13, 2008
Agilent Technologies, Inc.
Alexander Mordehai
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Two dimensional ion traps with improved ion isolation and method of...
Patent number
7,372,024
Issue date
May 13, 2008
Agilent Technologies, Inc.
Alexander Mordehai
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Ion trap with built-in field-modifying electrodes and method of ope...
Patent number
7,279,681
Issue date
Oct 9, 2007
Agilent Technologies, Inc.
Gangqiang Li
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Ion trap mass spectrometer with scanning delay ion extraction
Patent number
7,208,726
Issue date
Apr 24, 2007
Agilent Technologies, Inc.
August Hidalgo
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Ion guides for mass spectrometry
Patent number
6,759,651
Issue date
Jul 6, 2004
Agilent Technologies, Inc.
Gangqiang Li
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Ion mobility spectrometer with high ion transmission efficiency
Patent number
6,727,495
Issue date
Apr 27, 2004
Agilent Technologies, Inc.
Gangqiang Li
G01 - MEASURING TESTING
Information
Patent Grant
Grating pattern and arrangement for mass spectrometers
Patent number
6,717,133
Issue date
Apr 6, 2004
Agilent Technologies, Inc.
Gangqiang Li
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Thermal drift compensation to mass calibration in time-of-flight ma...
Patent number
6,700,118
Issue date
Mar 2, 2004
Agilent Technologies, Inc.
George Yefchak
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Apparatus and method of laser dissociation for mass spectrometry
Patent number
6,642,516
Issue date
Nov 4, 2003
Agilent Technologies, Inc.
Stuart C Hansen
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
In-line matrix assisted laser desorption/ionization mass spectromet...
Patent number
6,639,217
Issue date
Oct 28, 2003
Agilent Technologies, Inc.
Gangqiang Li
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Ion optic components for mass spectrometers
Patent number
6,593,570
Issue date
Jul 15, 2003
Agilent Technologies, Inc.
Gangqiang Li
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Tandem mass spectrometry using a single quadrupole mass analyzer
Patent number
6,570,153
Issue date
May 27, 2003
Agilent Technologies, Inc.
Gangqiang Li
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Mass spectrometer electrospray ionization
Patent number
6,462,337
Issue date
Oct 8, 2002
Agilent Technologies, Inc.
Gangqiang Li
C07 - ORGANIC CHEMISTRY
Information
Patent Grant
Systems and methods of mass spectrometry
Patent number
6,274,866
Issue date
Aug 14, 2001
Agilent Technologies, Inc.
Gangqiang Li
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Power-modulated inductively coupled plasma spectrometry
Patent number
6,242,735
Issue date
Jun 5, 2001
Agilent Technologies, Inc.
Gangqiang Li
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Power-modulated inductively coupled plasma spectrometry
Patent number
6,222,186
Issue date
Apr 24, 2001
Agilent Technologies, Inc.
Gangqiang Li
H01 - BASIC ELECTRIC ELEMENTS
Patents Applications
last 30 patents
Information
Patent Application
MULTI-CAPILLARY COLUMN AND HIGH-CAPACITY IONIZATION INTERFACE FOR G...
Publication number
20140151546
Publication date
Jun 5, 2014
AGILENT TECHNOLOGIES, INC.
Gangqiang Li
G01 - MEASURING TESTING
Information
Patent Application
DEVICE, SYSTEM, AND METHOD FOR REFLECTING IONS
Publication number
20120280121
Publication date
Nov 8, 2012
Gangqiang Li
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
MULTI-BORE CAPILLARY FOR MASS SPECTROMETER
Publication number
20110127422
Publication date
Jun 2, 2011
AGILENT TECHNOLOGIES, INC.
Stuart C. Hansen
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
TANDEM IONIZER ION SOURCE FOR MASS SPECTROMETER AND METHOD OF USE
Publication number
20100193702
Publication date
Aug 5, 2010
Gangqiang Li
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Apparatus and Method for Identifying Metalloproteins
Publication number
20100084550
Publication date
Apr 8, 2010
Agilent Technologies, Inc.
Viorica Lopez-Avila
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Monopole Time-of-Flight Tandem Mass Spectrometer
Publication number
20090242748
Publication date
Oct 1, 2009
Gangqiang Li
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Mass Spectrometer gain adjustment using ion ratios
Publication number
20090108191
Publication date
Apr 30, 2009
George Yefchak
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
MASS SPECTROMETER AND ELECTRIC FIELD SOURCE FOR MASS SPECTROMETER
Publication number
20090078866
Publication date
Mar 26, 2009
Gangqiang Li
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Electrospray Ionization Mass Spectrometer Interface
Publication number
20080104064
Publication date
May 1, 2008
Gangqiang Li
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Multi-channel high-field asymmetric waveform ion mobility spectrometry
Publication number
20080067350
Publication date
Mar 20, 2008
Gangqiang Li
G01 - MEASURING TESTING
Information
Patent Application
Mass spectrometer interface for atmospheric ionization ion sources
Publication number
20080067355
Publication date
Mar 20, 2008
Gangqiang Li
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Micro fluidic gas assisted ionization device and method
Publication number
20080067353
Publication date
Mar 20, 2008
Gangqiang Li
B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information
Patent Application
Ion extraction pulser and method for mass spectrometry
Publication number
20080029696
Publication date
Feb 7, 2008
Gangqiang Li
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Ion mobility spectrometry waveform
Publication number
20070278398
Publication date
Dec 6, 2007
Gangqiang Li
G01 - MEASURING TESTING
Information
Patent Application
MICRO FLUIDIC GAS ASSISTED IONIZATION STRUCTURE AND METHOD
Publication number
20070257190
Publication date
Nov 8, 2007
Gangqiang Li
B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information
Patent Application
Two dimensional ion traps with improved ion isolation and method of...
Publication number
20070057175
Publication date
Mar 15, 2007
Alexander Mordehai
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Segmented rod multipole as ion processing cell
Publication number
20070057180
Publication date
Mar 15, 2007
Stuart C. Hansen
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Lens device for introducing a second ion beam into a primary ion path
Publication number
20070045531
Publication date
Mar 1, 2007
Alex Mordehai
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Apparatus and method for gas flow management
Publication number
20070045532
Publication date
Mar 1, 2007
Reid A. Brennen
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Time-of-flight spectrometer with orthogonal pulsed ion detection
Publication number
20070023636
Publication date
Feb 1, 2007
Gangqiang Li
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Ion trap with built-in field-modifying electrodes and method of ope...
Publication number
20070023646
Publication date
Feb 1, 2007
Gangqiang Li
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Methods and compositions for combining ions and charged particles
Publication number
20060289741
Publication date
Dec 28, 2006
Gangqiang Li
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Nanopore separation devices and methods of using same
Publication number
20060073489
Publication date
Apr 6, 2006
Gangqiang Li
B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information
Patent Application
Ion trap mass spectrometer with scanning delay ion extraction
Publication number
20060043282
Publication date
Mar 2, 2006
August Hidalgo
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Unevenly segmented multipole
Publication number
20050242281
Publication date
Nov 3, 2005
Gangqiang Li
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Ion mobility spectrometer with high ion transmission efficiency
Publication number
20030132379
Publication date
Jul 17, 2003
Gangqiang Li
G01 - MEASURING TESTING
Information
Patent Application
Thermal drift compensation to mass calibration in time-of-flight ma...
Publication number
20030034448
Publication date
Feb 20, 2003
George Yefchak
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Grating pattern and arrangement for mass spectrometers
Publication number
20020190199
Publication date
Dec 19, 2002
Gangqiang Li
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Ion optic components for mass spectrometers
Publication number
20010035498
Publication date
Nov 1, 2001
Gangqiang Li
H01 - BASIC ELECTRIC ELEMENTS