Garima Sharda

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Beecave, TX, US

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Patents Grantslast 30 patents

Information Patent Grant
Glitch detector
- Patent number 11,609,600
- Issue date Mar 21, 2023
- NXP USA, INC.
- Rohit Kumar Sinha
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System and method for controlling faults in system-on-chip
- Patent number 11,520,653
- Issue date Dec 6, 2022
- NXP USA, INC.
- Neha Srivastava
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Glitch detector
- Patent number 11,429,142
- Issue date Aug 30, 2022
- NXP USA, INC.
- Rohit Kumar Sinha
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System and method for testing critical components on system-on-chip
- Patent number 11,422,185
- Issue date Aug 23, 2022
- NXP USA, INC.
- Neha Srivastava
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
GLITCH DETECTOR
- Publication number 20220382322
- Publication date Dec 1, 2022
- NXP USA, Inc.
- Rohit Kumar Sinha
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
GLITCH DETECTOR
- Publication number 20220197332
- Publication date Jun 23, 2022
- NXP USA, Inc.
- Rohit Kumar Sinha
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEM AND METHOD FOR CONTROLLING FAULTS IN SYSTEM-ON-CHIP
- Publication number 20220121512
- Publication date Apr 21, 2022
- NXP USA, Inc.
- Neha Srivastava
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEM AND METHOD FOR TESTING CRITICAL COMPONENTS ON SYSTEM-ON-CHIP
- Publication number 20210405114
- Publication date Dec 30, 2021
- NXP USA, Inc.
- Neha Srivastava
- G01 - MEASURING TESTING