Garrett Budnik

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Hillsboro, OR, US

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Patents Grantslast 30 patents

Information Patent Grant
Combined SEM-CL and FIB-IOE microscopy
- Patent number 10,896,802
- Issue date Jan 19, 2021
- FEI Company
- Mostafa Maazouz
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
METHODS AND SYSTEMS FOR ELEMENTAL MAPPING
- Publication number 20230095798
- Publication date Mar 30, 2023
- FEI Company
- Garrett BUDNIK
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
COMBINED SEM-CL AND FIB-IOE MICROSCOPY
- Publication number 20190198288
- Publication date Jun 27, 2019
- FEI Company
- Mostafa Maazouz
- H01 - BASIC ELECTRIC ELEMENTS