Garrett O'Brien

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Sunnyvale, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Scan multiplexing for increasing the effective scan data exchange rate
- Patent number 6,865,704
- Issue date Mar 8, 2005
- Agilent Technologies, Inc.
- Stuart L. Whannel
- G01 - MEASURING TESTING
Information Patent Grant
Hierarchical creation of vectors for quiescent current (IDDQ) tests...
- Patent number 6,751,768
- Issue date Jun 15, 2004
- Agilent Technologies, Inc.
- Fidel Muradali
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Hierarchical creation of vectors for quiescent current (IDDQ) tests...
- Publication number 20030101398
- Publication date May 29, 2003
- Fidel Muradali
- G01 - MEASURING TESTING
Information Patent Application
Scan multiplication
- Publication number 20030093731
- Publication date May 15, 2003
- Stuart L. Whannel
- G01 - MEASURING TESTING