Garry C. Gillette

Person

San Jose, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Parallel processing pattern generation system for an integrated cir...
- Patent number 6,073,263
- Issue date Jun 6, 2000
- Credence Systems Corporation
- Brian J. Arkin
- G01 - MEASURING TESTING
Information Patent Grant
Current sense circuit
- Patent number 6,028,438
- Issue date Feb 22, 2000
- Credence Systems Corporation
- Garry C. Gillette
- G01 - MEASURING TESTING
Information Patent Grant
Modular integrated circuit tester with distributed synchronization...
- Patent number 6,028,439
- Issue date Feb 22, 2000
- Credence Systems Corporation
- Brian J. Arkin
- G01 - MEASURING TESTING
Information Patent Grant
Circuit arrangement for measuring leakage current utilizing a diffe...
- Patent number 6,011,403
- Issue date Jan 4, 2000
- Credence Systems Corporation
- Garry C. Gillette
- G01 - MEASURING TESTING
Information Patent Grant
Switchable load for testing a semiconductor integrated circuit device
- Patent number 6,008,683
- Issue date Dec 28, 1999
- Credence Systems Corporation
- Garry C. Gillette
- G01 - MEASURING TESTING
Information Patent Grant
System for compensating for temperature induced delay variation in...
- Patent number 6,005,408
- Issue date Dec 21, 1999
- Credence Systems Corporation
- Garry C. Gillette
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Backmatch resistor structure for an integrated circuit tester
- Patent number 5,955,890
- Issue date Sep 21, 1999
- Credence Systems Corporation
- Garry C. Gillette
- G01 - MEASURING TESTING
Information Patent Grant
Load circuit for integrated circuit tester
- Patent number 5,952,821
- Issue date Sep 14, 1999
- Credence Systems Corporation
- Garry Gillette
- G01 - MEASURING TESTING
Information Patent Grant
Multiple output programmable reference voltage source
- Patent number 5,905,403
- Issue date May 18, 1999
- Credence Systems Corporation
- Garry C. Gillette
- G05 - CONTROLLING REGULATING

Garry C. Gillette

Person

Patents Grantslast 30 patents

Parallel processing pattern generation system for an integrated cir...

Current sense circuit

Modular integrated circuit tester with distributed synchronization...

Circuit arrangement for measuring leakage current utilizing a diffe...

Switchable load for testing a semiconductor integrated circuit device

System for compensating for temperature induced delay variation in...

Backmatch resistor structure for an integrated circuit tester

Load circuit for integrated circuit tester

Multiple output programmable reference voltage source