Garth E. Patterson

Person

Brookston, IN, US

People

Patents Grantslast 30 patents

Information Patent Grant
Analytical instruments, assemblies, and methods
- Patent number 9,347,920
- Issue date May 24, 2016
- FLIR Detection, Inc.
- Dennis Barket
- G01 - MEASURING TESTING
Information Patent Grant
Analytical instruments, assemblies, and methods
- Patent number 8,952,321
- Issue date Feb 10, 2015
- FLIR Detection, Inc.
- Dennis Barket
- G01 - MEASURING TESTING
Information Patent Grant
Analytical instrumentation, apparatuses, and methods
- Patent number 8,680,461
- Issue date Mar 25, 2014
- Griffin Analytical Technologies, LLC
- Brent Rardin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Analysis methods, analysis device waveform generation methods, anal...
- Patent number 8,212,206
- Issue date Jul 3, 2012
- Griffin Analytical Technologies, LLC
- Garth E. Patterson
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Interface port for connection of a sampling device to an analytical...
- Patent number 8,176,801
- Issue date May 15, 2012
- Griffin Analytical Technology, L.L.C.
- Mark A. Gregory
- G01 - MEASURING TESTING
Information Patent Grant
Analytical instrumentation and processes
- Patent number 8,043,565
- Issue date Oct 25, 2011
- Griffin Analytical Technologies, LLC
- Garth E. Patterson
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for mobile collection of atmospheric sample fo...
- Patent number 7,841,244
- Issue date Nov 30, 2010
- Griffin Analytical Technologies, Inc.
- Dennis Barket, Jr.
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for storage of atmospheric sample for eventual...
- Patent number 7,600,439
- Issue date Oct 13, 2009
- Griffin Analytical Technologies, Inc.
- Garth E. Patterson
- G01 - MEASURING TESTING
Information Patent Grant
Mass spectrometers
- Patent number 7,582,867
- Issue date Sep 1, 2009
- Griffin Analytical Technologies, LLC
- James Mitchell Wells
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion detection methods, mass spectrometry analysis methods, and mass...
- Patent number 7,576,324
- Issue date Aug 18, 2009
- Griffin Analytical Technologies, LLC
- John W. Grossenbacher
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Guard columns for gas chromatographs and gas chromatograph-mass spe...
- Patent number 7,520,920
- Issue date Apr 21, 2009
- Griffin Analytical Technologies
- Mark A. Gregory
- G01 - MEASURING TESTING
Information Patent Grant
Mass spectrometer assemblies, mass spectrometry vacuum chamber lid...
- Patent number 7,427,750
- Issue date Sep 23, 2008
- Griffin Analytical Technologies, LLC
- John W. Grossenbacher
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Analytical instruments, assemblies, and methods
- Patent number 7,361,890
- Issue date Apr 22, 2008
- Griffin Analytical Technologies, Inc.
- Garth E. Patterson
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass separators
- Patent number 7,294,832
- Issue date Nov 13, 2007
- Griffin Analytical Technologies, LLC
- James Mitchell Wells
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Portable mass spectrometers
- Patent number 7,161,142
- Issue date Jan 9, 2007
- Griffin Analytical Technologies
- Garth E. Patterson
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of automatically calibrating electronic controls in a mass s...
- Patent number 6,982,413
- Issue date Jan 3, 2006
- Griffin Analytical Technologies, Inc.
- Brent A. Knecht
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
Analytical Instruments, Assemblies, and Methods
- Publication number 20150177201
- Publication date Jun 25, 2015
- FLIR DETECTION, INC.
- Dennis Barket
- G01 - MEASURING TESTING
Information Patent Application
Analytical Instruments, Assemblies, and Methods
- Publication number 20110133078
- Publication date Jun 9, 2011
- GRIFFIN ANALYTICAL TECHNOLOGIES, L.L.C.
- Dennis Barket, JR.
- G01 - MEASURING TESTING
Information Patent Application
Analytical Instrumentation, Apparatuses, and Methods
- Publication number 20100042334
- Publication date Feb 18, 2010
- GRIFFIN ANALYTICAL TECHNOLOGIES, L.L.C.
- Brent Rardin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Apparatus and Method for Mobile Collection of Atmospheric Sample fo...
- Publication number 20080229805
- Publication date Sep 25, 2008
- Dennis Barket
- G01 - MEASURING TESTING
Information Patent Application
Interface port for connection of a sampling device to an analytical...
- Publication number 20080163669
- Publication date Jul 10, 2008
- Griffin Analytical Technologies, LLC.
- Mark A. Gregory
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Application
Mass spectrometers
- Publication number 20080128605
- Publication date Jun 5, 2008
- Griffin Analytical Technologies, Inc.
- James Mitchell Wells
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Analytical Instruments, Assemblies, and Methods
- Publication number 20070258861
- Publication date Nov 8, 2007
- Dennis Barket
- G01 - MEASURING TESTING
Information Patent Application
Analysis methods, analysis device waveform generation methods, anal...
- Publication number 20070162232
- Publication date Jul 12, 2007
- Garth E. Patterson
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Ion detection methods, mass spectrometry analysis methods, and mass...
- Publication number 20070057176
- Publication date Mar 15, 2007
- John W Grossenbacher
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Processes for Designing Mass Separator and Ion Traps, Methods for P...
- Publication number 20060163468
- Publication date Jul 27, 2006
- James Mitchell Wells
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Mass spectrometer assemblies, mass spectrometry vacuum chamber lid...
- Publication number 20060060771
- Publication date Mar 23, 2006
- John W Grossenbacher
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Analytical instruments, assemblies, and methods
- Publication number 20060016975
- Publication date Jan 26, 2006
- Garth E. Patterson
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method of automatically calibrating electronic controls in a mass s...
- Publication number 20050051720
- Publication date Mar 10, 2005
- Brent A. Knecht
- H01 - BASIC ELECTRIC ELEMENTS

Garth E. Patterson

Person

Patents Grantslast 30 patents

Analytical instruments, assemblies, and methods

Analytical instruments, assemblies, and methods

Analytical instrumentation, apparatuses, and methods

Analysis methods, analysis device waveform generation methods, anal...

Interface port for connection of a sampling device to an analytical...

Analytical instrumentation and processes

Apparatus and method for mobile collection of atmospheric sample fo...

Apparatus and method for storage of atmospheric sample for eventual...

Mass spectrometers

Ion detection methods, mass spectrometry analysis methods, and mass...

Guard columns for gas chromatographs and gas chromatograph-mass spe...

Mass spectrometer assemblies, mass spectrometry vacuum chamber lid...

Analytical instruments, assemblies, and methods

Mass separators

Portable mass spectrometers

Method of automatically calibrating electronic controls in a mass s...

Patents Applicationslast 30 patents

Analytical Instruments, Assemblies, and Methods

Analytical Instruments, Assemblies, and Methods

Analytical Instrumentation, Apparatuses, and Methods

Apparatus and Method for Mobile Collection of Atmospheric Sample fo...

Interface port for connection of a sampling device to an analytical...

Mass spectrometers

Analytical Instruments, Assemblies, and Methods

Analysis methods, analysis device waveform generation methods, anal...

Ion detection methods, mass spectrometry analysis methods, and mass...

Processes for Designing Mass Separator and Ion Traps, Methods for P...

Mass spectrometer assemblies, mass spectrometry vacuum chamber lid...

Analytical instruments, assemblies, and methods

Method of automatically calibrating electronic controls in a mass s...