Garth Howell

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McDowall, AU

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Patents Grantslast 30 patents

Information Patent Grant
Sample-specific reference spectra library
- Patent number 9,719,950
- Issue date Aug 1, 2017
- FEI Company
- Michael James Owen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Sub-pixel analysis and display of fine grained mineral samples
- Patent number 9,714,908
- Issue date Jul 25, 2017
- FEI Company
- Michael James Owen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Blend modes for mineralogy images
- Patent number 9,495,786
- Issue date Nov 15, 2016
- FEI COMPAN
- Garth Howell
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Blend modes for mineralogy images
- Patent number 9,183,656
- Issue date Nov 10, 2015
- FEI Company
- Garth Howell
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
CHARGED PARTICLE MICROSCOPE SYSTEMS AND CLUSTERING PROCESSES FOR HI...
- Publication number 20220207256
- Publication date Jun 30, 2022
- FEI Company
- Michael James Owen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Sample-specific Reference Spectra Library
- Publication number 20160245762
- Publication date Aug 25, 2016
- FEI Company
- Michael James Owen
- G01 - MEASURING TESTING
Information Patent Application
BLEND MODES FOR MINERALOGY IMAGES
- Publication number 20160063749
- Publication date Mar 3, 2016
- FEI Company
- Garth Howell
- G01 - MEASURING TESTING
Information Patent Application
Blend Modes for Mineralogy Images
- Publication number 20150262400
- Publication date Sep 17, 2015
- FEI Company
- Garth Howell
- G01 - MEASURING TESTING
Information Patent Application
Sub-pixel Analysis and Display of Fine Grained Mineral Samples
- Publication number 20150122992
- Publication date May 7, 2015
- FEI Company
- Michael James Owen
- H01 - BASIC ELECTRIC ELEMENTS