Gary Blanpied

Person

Lexington, SC, US

People

Patents Grantslast 30 patents

Information Patent Grant
Inspection of objects based on primary and secondary scanning
- Patent number 10,228,486
- Issue date Mar 12, 2019
- Decision Sciences International Corporation
- Michael James Sossong
- G01 - MEASURING TESTING
Information Patent Grant
Discrimination of low-atomic weight materials using scattering and...
- Patent number 9,915,626
- Issue date Mar 13, 2018
- Decision Sciences International Corporation
- Gary Blanpied
- G01 - MEASURING TESTING
Information Patent Grant
Material discrimination using scattering and stopping of muons and...
- Patent number 9,841,530
- Issue date Dec 12, 2017
- Decision Sciences International Corporation
- Gary Blanpied
- G01 - MEASURING TESTING
Information Patent Grant
Calibrating modular charged particle detector arrays
- Patent number 9,784,859
- Issue date Oct 10, 2017
- Decision Sciences International Corporation
- Gary Blanpied
- G01 - MEASURING TESTING
Information Patent Grant
Primary and secondary scanning in muon tomography inspection
- Patent number 9,423,362
- Issue date Aug 23, 2016
- Decision Sciences International Corporation
- Michael James Sossong
- G01 - MEASURING TESTING
Information Patent Grant
Imaging based on cosmic-ray produced charged particles
- Patent number 8,536,527
- Issue date Sep 17, 2013
- Decision Sciences International Corporation
- Christopher L. Morris
- G01 - MEASURING TESTING
Information Patent Grant
Measuring momentum for charged particle tomography
- Patent number 7,838,841
- Issue date Nov 23, 2010
- LOS ALAMOS NATIONAL SECURITY, LLC
- Christopher Morris
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
INSPECTION OF OBJECTS BASED ON PRIMARY AND SECONDARY SCANNING
- Publication number 20160356913
- Publication date Dec 8, 2016
- DECISION SCIENCES INTERNATIONAL CORPORATION
- Michael James Sossong
- G01 - MEASURING TESTING
Information Patent Application
CALIBRATING MODULAR CHARGED PARTICLE DETECTOR ARRAYS
- Publication number 20160054458
- Publication date Feb 25, 2016
- DECISION SCIENCES INTERNATIONAL CORPORATION
- Gary Blanpied
- G01 - MEASURING TESTING
Information Patent Application
MATERIAL DISCRIMINATION USING SCATTERING AND STOPPING OF MUONS AND...
- Publication number 20160041297
- Publication date Feb 11, 2016
- DECISION SCIENCES INTERNATIONAL CORPORATION
- Gary Blanpied
- G01 - MEASURING TESTING
Information Patent Application
DISCRIMINATION OF LOW-ATOMIC WEIGHT MATERIALS USING SCATTERING AND...
- Publication number 20150241593
- Publication date Aug 27, 2015
- DECISION SCIENCES INTERNATIONAL CORPORATION
- Gary Blanpied
- G01 - MEASURING TESTING
Information Patent Application
PRIMARY AND SECONDARY SCANNING IN MUON TOMOGRAPHY INSPECTION
- Publication number 20150212014
- Publication date Jul 30, 2015
- DECISION SCIENCES INTERNATIONAL CORPORATION
- Michael James Sossong
- G01 - MEASURING TESTING
Information Patent Application
IMAGING BASED ON COSMIC-RAY PRODUCED CHARGED PARTICLES
- Publication number 20110248163
- Publication date Oct 13, 2011
- LOS ALAMOS NATIONAL SECURITY, LLC
- Christoper L. Morris
- G01 - MEASURING TESTING
Information Patent Application
Measuring momentum for charged particle tomography
- Publication number 20080265156
- Publication date Oct 30, 2008
- Christopher Morris
- G06 - COMPUTING CALCULATING COUNTING

Gary Blanpied

Person

Patents Grantslast 30 patents

Inspection of objects based on primary and secondary scanning

Discrimination of low-atomic weight materials using scattering and...

Material discrimination using scattering and stopping of muons and...

Calibrating modular charged particle detector arrays

Primary and secondary scanning in muon tomography inspection

Imaging based on cosmic-ray produced charged particles

Measuring momentum for charged particle tomography

Patents Applicationslast 30 patents

INSPECTION OF OBJECTS BASED ON PRIMARY AND SECONDARY SCANNING

CALIBRATING MODULAR CHARGED PARTICLE DETECTOR ARRAYS

MATERIAL DISCRIMINATION USING SCATTERING AND STOPPING OF MUONS AND...

DISCRIMINATION OF LOW-ATOMIC WEIGHT MATERIALS USING SCATTERING AND...

PRIMARY AND SECONDARY SCANNING IN MUON TOMOGRAPHY INSPECTION

IMAGING BASED ON COSMIC-RAY PRODUCED CHARGED PARTICLES

Measuring momentum for charged particle tomography