Gary C. Hsueh

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Cupertino, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Method and apparatus employing integrated metrology for improved di...
- Patent number 7,265,382
- Issue date Sep 4, 2007
- Applied Materials, Inc.
- Dimitris Lymberopoulos
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for etching low k dielectrics
- Patent number 6,547,977
- Issue date Apr 15, 2003
- Applied Materials Inc.
- Chun Yan
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Backside gas quick dump apparatus for a semiconductor wafer process...
- Patent number 5,856,906
- Issue date Jan 5, 1999
- Applied Materials, Inc.
- Arnold Kholodenko
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER

Patents Applicationslast 30 patents

Information Patent Application
Method and apparatus employing integrated metrology for improved di...
- Publication number 20040092047
- Publication date May 13, 2004
- Applied Materials,Inc
- Dimitris Lymberopoulos
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Integrated system for oxide etching and metal liner deposition
- Publication number 20030027427
- Publication date Feb 6, 2003
- APPLIED MATERIALS, INC.
- Diana Xiaobing Ma
- H01 - BASIC ELECTRIC ELEMENTS