Membership
Tour
Register
Log in
Gary E. Sheehan
Follow
Person
Londonderry, NH, US
People
Overview
Industries
Organizations
People
Information
Impact
Patents Grants
last 30 patents
Information
Patent Grant
Synchronized delta-VBE measurement system
Patent number
6,957,910
Issue date
Oct 25, 2005
National Semiconductor Corporation
Jun Wan
G01 - MEASURING TESTING
Information
Patent Grant
Method for synchronized delta-VBE measurement for calculating die t...
Patent number
6,736,540
Issue date
May 18, 2004
National Semiconductor Corporation
Gary E. Sheehan
G01 - MEASURING TESTING
Information
Patent Grant
Linearized temperature sensor
Patent number
6,183,131
Issue date
Feb 6, 2001
National Semiconductor Corporation
Peter R. Holloway
G01 - MEASURING TESTING