Gary F. Besinga

Person

Boise, ID, US

People

Patents Grantslast 30 patents

Information Patent Grant
Program continuation strategies after memory device power loss
- Patent number 12,119,068
- Issue date Oct 15, 2024
- Micron Technology, Inc.
- Gary F. Besinga
- G11 - INFORMATION STORAGE
Information Patent Grant
Accelerating configuration updates for memory devices
- Patent number 11,984,174
- Issue date May 14, 2024
- Micron Technology, Inc.
- Tawalin Opastrakoon
- G11 - INFORMATION STORAGE
Information Patent Grant
Optimized storage charge loss management
- Patent number 11,923,030
- Issue date Mar 5, 2024
- Micron Technology, Inc.
- Gary F. Besinga
- G11 - INFORMATION STORAGE
Information Patent Grant
Performing selective copyback in memory devices
- Patent number 11,887,681
- Issue date Jan 30, 2024
- Micron Technology, Inc.
- Vamsi Rayaprolu
- G11 - INFORMATION STORAGE
Information Patent Grant
Operation of mixed mode blocks
- Patent number 11,721,404
- Issue date Aug 8, 2023
- Micron Technology, Inc.
- Kishore K. Muchherla
- G11 - INFORMATION STORAGE
Information Patent Grant
Selective dummy writes for asynchronous power loss handling in memo...
- Patent number 11,720,259
- Issue date Aug 8, 2023
- Micron Technology, Inc.
- Michael G. Miller
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Offset memory component automatic calibration (autocal) error recov...
- Patent number 11,715,530
- Issue date Aug 1, 2023
- Micron Technology, Inc.
- Bruce A. Liikanen
- G11 - INFORMATION STORAGE
Information Patent Grant
Open block management using storage charge loss margin checking
- Patent number 11,715,531
- Issue date Aug 1, 2023
- Micron Technology, Inc.
- Christopher M. Smitchger
- G11 - INFORMATION STORAGE
Information Patent Grant
Workload adaptive scans for memory sub-systems
- Patent number 11,715,541
- Issue date Aug 1, 2023
- Micron Technology, Inc.
- Renato C. Padilla
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Dynamic program-verify voltage adjustment for intra-block storage c...
- Patent number 11,687,452
- Issue date Jun 27, 2023
- Micron Technology, Inc.
- Gary F. Besinga
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Selective accelerated sampling of failure- sensitive memory pages
- Patent number 11,644,979
- Issue date May 9, 2023
- Micron Technology, Inc.
- Kishore Kumar Muchherla
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Diagonal page mapping in memory systems
- Patent number 11,507,304
- Issue date Nov 22, 2022
- Micron Technology, Inc.
- Tawalin Opastrakoon
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Optimized storage charge loss management
- Patent number 11,456,051
- Issue date Sep 27, 2022
- Micron Technology, Inc.
- Gary F. Besinga
- G11 - INFORMATION STORAGE
Information Patent Grant
Block read count voltage adjustment
- Patent number 11,456,037
- Issue date Sep 27, 2022
- Micron Technology, Inc.
- Harish Singidi
- G11 - INFORMATION STORAGE
Information Patent Grant
Workload adaptive scans for memory sub-systems
- Patent number 11,393,548
- Issue date Jul 19, 2022
- Micron Technology, Inc.
- Renato C. Padilla
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Offset memory component automatic calibration (autocal) error recov...
- Patent number 11,361,833
- Issue date Jun 14, 2022
- Micron Technology, Inc.
- Bruce A. Liikanen
- G11 - INFORMATION STORAGE
Information Patent Grant
Selective accelerated sampling of failure-sensitive memory pages
- Patent number 11,301,143
- Issue date Apr 12, 2022
- Micron Technology, Inc.
- Kishore Kumar Muchherla
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Operation of mixed mode blocks
- Patent number 11,158,392
- Issue date Oct 26, 2021
- Micron Technology, Inc.
- Kishore K. Muchherla
- G11 - INFORMATION STORAGE
Information Patent Grant
Dynamic error handling in a memory system
- Patent number 11,126,495
- Issue date Sep 21, 2021
- Micron Technology, Inc.
- Renato Padilla
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Using a status indicator in a memory sub-system to detect an event
- Patent number 11,120,885
- Issue date Sep 14, 2021
- Micron Technology, Inc.
- Michael G. Miller
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Optimized scan interval
- Patent number 11,056,156
- Issue date Jul 6, 2021
- Micron Technology, Inc.
- Kishore Kumar Muchherla
- G11 - INFORMATION STORAGE
Information Patent Grant
Block read count voltage adjustment
- Patent number 11,031,089
- Issue date Jun 8, 2021
- Micron Technology, Inc.
- Harish Reddy Singidi
- G11 - INFORMATION STORAGE
Information Patent Grant
Identifying asynchronous power loss
- Patent number 10,942,796
- Issue date Mar 9, 2021
- Micron Technology, Inc.
- Michael G. Miller
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Read retry with targeted auto read calibrate
- Patent number 10,915,395
- Issue date Feb 9, 2021
- Micron Technology, Inc.
- Ting Luo
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Using a status indicator in a memory sub-system to detect an event
- Patent number 10,854,305
- Issue date Dec 1, 2020
- Micron Technology, Inc.
- Michael G. Miller
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Memory devices and methods for read disturb mitigation involving wo...
- Patent number 10,770,156
- Issue date Sep 8, 2020
- Micron Technology, Inc.
- Renato C. Padilla
- G11 - INFORMATION STORAGE
Information Patent Grant
Block read count voltage adjustment
- Patent number 10,755,792
- Issue date Aug 25, 2020
- Micron Technology, Inc.
- Harish Reddy Singidi
- G11 - INFORMATION STORAGE
Information Patent Grant
Using a status indicator in a memory sub-system to detect an event
- Patent number 10,593,412
- Issue date Mar 17, 2020
- Micron Technology, Inc.
- Michael G. Miller
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Correcting power loss in NAND memory devices
- Patent number 10,579,307
- Issue date Mar 3, 2020
- Micron Technology, Inc.
- Michael G. Miller
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Optimized scan interval
- Patent number 10,573,357
- Issue date Feb 25, 2020
- Micron Technology, Inc.
- Kishore Kumar Muchherla
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
ACCELERATING CONFIGURATION UPDATES FOR MEMORY DEVICES
- Publication number 20240257887
- Publication date Aug 1, 2024
- Micron Technology, Inc.
- Tawalin Opastrakoon
- G11 - INFORMATION STORAGE
Information Patent Application
PERFORMING SELECTIVE COPYBACK IN MEMORY DEVICES
- Publication number 20240127900
- Publication date Apr 18, 2024
- Micron Technology, Inc.
- Vamsi Rayaprolu
- G11 - INFORMATION STORAGE
Information Patent Application
ERROR HANDLING
- Publication number 20230393922
- Publication date Dec 7, 2023
- Micron Technology, Inc.
- Sampath K. Ratnam
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
PERFORMING SELECTIVE COPYBACK IN MEMORY DEVICES
- Publication number 20230268018
- Publication date Aug 24, 2023
- Micron Technology, Inc.
- Vamsi Rayaprolu
- G11 - INFORMATION STORAGE
Information Patent Application
PROGRAM CONTINUATION STRATEGIES AFTER MEMORY DEVICE POWER LOSS
- Publication number 20230268014
- Publication date Aug 24, 2023
- Micron Technology, Inc.
- Gary F. Besinga
- G11 - INFORMATION STORAGE
Information Patent Application
DIAGONAL PAGE MAPPING IN MEMORY SYSTEMS
- Publication number 20230049877
- Publication date Feb 16, 2023
- Micron Technology, Inc.
- Tawalin Opastrakoon
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
OPTIMIZED STORAGE CHARGE LOSS MANAGEMENT
- Publication number 20220392561
- Publication date Dec 8, 2022
- Micron Technology, Inc.
- Gary F. Besinga
- G11 - INFORMATION STORAGE
Information Patent Application
DIAGONAL PAGE MAPPING IN MEMORY SYSTEMS
- Publication number 20220391127
- Publication date Dec 8, 2022
- Micron Technology, Inc.
- Tawalin Opastrakoon
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
WORKLOAD ADAPTIVE SCANS FOR MEMORY SUB-SYSTEMS
- Publication number 20220351796
- Publication date Nov 3, 2022
- Micron Technology, Inc.
- Renato C. Padilla
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
OPEN BLOCK MANAGEMENT USING STORAGE CHARGE LOSS MARGIN CHECKING
- Publication number 20220310183
- Publication date Sep 29, 2022
- Micron Technology, Inc.
- Christopher M. Smitchger
- G11 - INFORMATION STORAGE
Information Patent Application
OPTIMIZED STORAGE CHARGE LOSS MANAGEMENT
- Publication number 20220310190
- Publication date Sep 29, 2022
- Micron Technology, Inc.
- Gary F. Besinga
- G11 - INFORMATION STORAGE
Information Patent Application
OFFSET MEMORY COMPONENT AUTOMATIC CALIBRATION (AUTOCAL) ERROR RECOV...
- Publication number 20220301640
- Publication date Sep 22, 2022
- Micron Technology, Inc.
- Bruce A. Liikanen
- G11 - INFORMATION STORAGE
Information Patent Application
ACCELERATING CONFIGURATION UPDATES FOR MEMORY DEVICES
- Publication number 20220284974
- Publication date Sep 8, 2022
- Micron Technology, Inc.
- Tawalin Opastrakoon
- G11 - INFORMATION STORAGE
Information Patent Application
SELECTIVE DUMMY WRITES FOR ASYNCHRONOUS POWER LOSS HANDLING IN MEMO...
- Publication number 20220276791
- Publication date Sep 1, 2022
- Micron Technology, Inc.
- Michael G. Miller
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SELECTIVE ACCELERATED SAMPLING OF FAILURE-SENSITIVE MEMORY PAGES
- Publication number 20220229564
- Publication date Jul 21, 2022
- Micron Technology, Inc.
- Kishore Kumar Muchherla
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
WORKLOAD ADAPTIVE SCANS FOR MEMORY SUB-SYSTEMS
- Publication number 20220199179
- Publication date Jun 23, 2022
- Micron Technology, Inc.
- Renato C. Padilla
- G11 - INFORMATION STORAGE
Information Patent Application
DYNAMIC PROGRAM-VERIFY VOLTAGE ADJUSTMENT FOR INTRA-BLOCK STORAGE C...
- Publication number 20220188226
- Publication date Jun 16, 2022
- Micron Technology, Inc.
- Gary F. Besinga
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SELECTIVE DUMMY WRITES FOR ASYCHRONOUS POWER LOSS HANDLING IN MEMOR...
- Publication number 20220066650
- Publication date Mar 3, 2022
- Micron Technology, Inc.
- Michael G. Miller
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ASYCHRONOUS POWER LOSS HANDLING USING DUMMY WRITES IN MEMORY DEVICES
- Publication number 20220066651
- Publication date Mar 3, 2022
- Micron Technology, Inc.
- Michael G. Miller
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
OPERATION OF MIXED MODE BLOCKS
- Publication number 20220013182
- Publication date Jan 13, 2022
- Micron Technology, Inc.
- Kishore K. Muchherla
- G11 - INFORMATION STORAGE
Information Patent Application
BLOCK READ COUNT VOLTAGE ADJUSTMENT
- Publication number 20210264991
- Publication date Aug 26, 2021
- Micron Technology, Inc.
- Harish Singidi
- G11 - INFORMATION STORAGE
Information Patent Application
USING A STATUS INDICATOR IN A MEMORY SUB-SYSTEM TO DETECT AN EVENT
- Publication number 20210074374
- Publication date Mar 11, 2021
- Micron Technology, Inc.
- Michael G. Miller
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SELECTIVE ACCELERATED SAMPLING OF FAILURE-SENSITIVE MEMORY PAGES
- Publication number 20200387324
- Publication date Dec 10, 2020
- Micron Technology, Inc.
- Kishore Kumar Muchherla
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
BLOCK READ COUNT VOLTAGE ADJUSTMENT
- Publication number 20200335172
- Publication date Oct 22, 2020
- Micron Technology, Inc.
- Harish Reddy Singidi
- G11 - INFORMATION STORAGE
Information Patent Application
USING A STATUS INDICATOR IN A MEMORY SUB-SYSTEM TO DETECT AN EVENT
- Publication number 20200219573
- Publication date Jul 9, 2020
- Micron Technology, Inc.
- Michael G. Miller
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
READ RETRY WITH TARGETED AUTO READ CALIBRATE
- Publication number 20200159447
- Publication date May 21, 2020
- Micron Technology, Inc.
- Ting Luo
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
OPTIMIZED SCAN INTERVAL
- Publication number 20200160894
- Publication date May 21, 2020
- Micron Technology, Inc.
- Kishore Kumar Muchherla
- G11 - INFORMATION STORAGE
Information Patent Application
OFFSET MEMORY COMPONENT AUTOMATIC CALIBRATION (AUTOCAL) ERROR RECOV...
- Publication number 20200090767
- Publication date Mar 19, 2020
- Micron Technology, Inc.
- Bruce A. Liikanen
- G11 - INFORMATION STORAGE
Information Patent Application
USING A STATUS INDICATOR IN A MEMORY SUB-SYSTEM TO DETECT AN EVENT
- Publication number 20200027514
- Publication date Jan 23, 2020
- Micron Technology, Inc.
- Michael G. Miller
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
BLOCK READ COUNT VOLTAGE ADJUSTMENT
- Publication number 20200020407
- Publication date Jan 16, 2020
- Micron Technology, Inc.
- Harish Reddy Singidi
- G11 - INFORMATION STORAGE

Gary F. Besinga

Person

Patents Grantslast 30 patents

Program continuation strategies after memory device power loss

Accelerating configuration updates for memory devices

Optimized storage charge loss management

Performing selective copyback in memory devices

Operation of mixed mode blocks

Selective dummy writes for asynchronous power loss handling in memo...

Offset memory component automatic calibration (autocal) error recov...

Open block management using storage charge loss margin checking

Workload adaptive scans for memory sub-systems

Dynamic program-verify voltage adjustment for intra-block storage c...

Selective accelerated sampling of failure- sensitive memory pages

Diagonal page mapping in memory systems

Optimized storage charge loss management

Block read count voltage adjustment

Workload adaptive scans for memory sub-systems

Offset memory component automatic calibration (autocal) error recov...

Selective accelerated sampling of failure-sensitive memory pages

Operation of mixed mode blocks

Dynamic error handling in a memory system

Using a status indicator in a memory sub-system to detect an event

Optimized scan interval

Block read count voltage adjustment

Identifying asynchronous power loss

Read retry with targeted auto read calibrate

Using a status indicator in a memory sub-system to detect an event

Memory devices and methods for read disturb mitigation involving wo...

Block read count voltage adjustment

Using a status indicator in a memory sub-system to detect an event

Correcting power loss in NAND memory devices

Optimized scan interval

Patents Applicationslast 30 patents

ACCELERATING CONFIGURATION UPDATES FOR MEMORY DEVICES

PERFORMING SELECTIVE COPYBACK IN MEMORY DEVICES

ERROR HANDLING

PERFORMING SELECTIVE COPYBACK IN MEMORY DEVICES

PROGRAM CONTINUATION STRATEGIES AFTER MEMORY DEVICE POWER LOSS

DIAGONAL PAGE MAPPING IN MEMORY SYSTEMS

OPTIMIZED STORAGE CHARGE LOSS MANAGEMENT

DIAGONAL PAGE MAPPING IN MEMORY SYSTEMS

WORKLOAD ADAPTIVE SCANS FOR MEMORY SUB-SYSTEMS

OPEN BLOCK MANAGEMENT USING STORAGE CHARGE LOSS MARGIN CHECKING

OPTIMIZED STORAGE CHARGE LOSS MANAGEMENT

OFFSET MEMORY COMPONENT AUTOMATIC CALIBRATION (AUTOCAL) ERROR RECOV...

ACCELERATING CONFIGURATION UPDATES FOR MEMORY DEVICES

SELECTIVE DUMMY WRITES FOR ASYNCHRONOUS POWER LOSS HANDLING IN MEMO...

SELECTIVE ACCELERATED SAMPLING OF FAILURE-SENSITIVE MEMORY PAGES

WORKLOAD ADAPTIVE SCANS FOR MEMORY SUB-SYSTEMS

DYNAMIC PROGRAM-VERIFY VOLTAGE ADJUSTMENT FOR INTRA-BLOCK STORAGE C...

SELECTIVE DUMMY WRITES FOR ASYCHRONOUS POWER LOSS HANDLING IN MEMOR...

ASYCHRONOUS POWER LOSS HANDLING USING DUMMY WRITES IN MEMORY DEVICES

OPERATION OF MIXED MODE BLOCKS

BLOCK READ COUNT VOLTAGE ADJUSTMENT

USING A STATUS INDICATOR IN A MEMORY SUB-SYSTEM TO DETECT AN EVENT

SELECTIVE ACCELERATED SAMPLING OF FAILURE-SENSITIVE MEMORY PAGES

BLOCK READ COUNT VOLTAGE ADJUSTMENT

USING A STATUS INDICATOR IN A MEMORY SUB-SYSTEM TO DETECT AN EVENT

READ RETRY WITH TARGETED AUTO READ CALIBRATE

OPTIMIZED SCAN INTERVAL

OFFSET MEMORY COMPONENT AUTOMATIC CALIBRATION (AUTOCAL) ERROR RECOV...

USING A STATUS INDICATOR IN A MEMORY SUB-SYSTEM TO DETECT AN EVENT

BLOCK READ COUNT VOLTAGE ADJUSTMENT