Gary G. FAN

Follow

Person

Fremont, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Method and system for adaptively scanning a sample during electron...
- Patent number 9,734,987
- Issue date Aug 15, 2017
- KLA-Tencor Corporation
- Gary Fan
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Enhanced defect detection in electron beam inspection and review
- Patent number 9,449,788
- Issue date Sep 20, 2016
- KLA-Tencor Corporation
- Gary G. Fan
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for adaptively scanning a sample during electron...
- Patent number 9,257,260
- Issue date Feb 9, 2016
- KLA-Tencor Corporation
- Gary Fan
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Method and System for Adaptively Scanning a Sample During Electron...
- Publication number 20160155605
- Publication date Jun 2, 2016
- KLA-Tencor Corporation
- Gary Fan
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ENHANCED DEFECT DETECTION IN ELECTRON BEAM INSPECTION AND REVIEW
- Publication number 20150090877
- Publication date Apr 2, 2015
- KLA-Tencor Corporation
- Gary G. FAN
- G01 - MEASURING TESTING
Information Patent Application
Method and System for Adaptively Scanning a Sample During Electron...
- Publication number 20140319342
- Publication date Oct 30, 2014
- KLA-Tencor Corporation
- Gary Fan
- G01 - MEASURING TESTING