Gary J. Oldham

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Eugene, OR, US

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Patents Grantslast 30 patents

Information Patent Grant
Multiple plane weigh platter for multiple plane scanning systems
- Patent number 6,237,852
- Issue date May 29, 2001
- PSC Scanning, Inc.
- Michael P. Svetal
- G01 - MEASURING TESTING
Information Patent Grant
Multiple plane weigh platter for multiple plane scanning systems
- Patent number 5,834,708
- Issue date Nov 10, 1998
- Spectra-Physics Scanning Systems, Inc.
- Michael P. Svetal
- G01 - MEASURING TESTING