Gary J. WALDO

Person

Hillsboro, OR, US

People

Patents Grantslast 30 patents

Information Patent Grant
System and method for computing direct quadrature zero resultant dr...
- Patent number 12,092,693
- Issue date Sep 17, 2024
- Tektronix, Inc.
- Parjanya Adiga
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Grant
Object oriented graphical user interface for a test and measurement...
- Patent number 11,687,213
- Issue date Jun 27, 2023
- Tektronix, Inc.
- Gary J. Waldo
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Acquiring and displaying multiple waveforms in a test and measureme...
- Patent number 11,231,444
- Issue date Jan 25, 2022
- Tektronix, Inc.
- Gary J. Waldo
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Bus decode and triggering on digital down converted data in a test...
- Patent number 11,188,493
- Issue date Nov 30, 2021
- Tektronix, Inc.
- James D. Alley
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Housing for a test and measurement instrument
- Patent number D909899
- Issue date Feb 9, 2021
- Tektronix, Inc.
- Neil Clayton
- D10 - Measuring, testing, or signalling instruments
Information Patent Grant
Apparatus and method for time correlated signal acquisition and vie...
- Patent number 10,557,870
- Issue date Feb 11, 2020
- Tektronix, Inc.
- Gary J. Waldo
- G01 - MEASURING TESTING
Information Patent Grant
Front panel for a measurement instrument
- Patent number D820129
- Issue date Jun 12, 2018
- Tektronix, Inc.
- Robert R. Kreitzer
- D10 - Measuring, testing, or signalling instruments
Information Patent Grant
Housing for a test and measurement instrument
- Patent number D820127
- Issue date Jun 12, 2018
- Tektronix, Inc.
- Robert Kreitzer
- D10 - Measuring, testing, or signalling instruments
Information Patent Grant
Combinatorial mask triggering in time or frequency domain
- Patent number 9,846,184
- Issue date Dec 19, 2017
- Tektronix, Inc.
- Kenneth P. Dobyns
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for time correlated signal acquisition and vie...
- Patent number 9,500,676
- Issue date Nov 22, 2016
- Tektronix, Inc.
- Gary J. Waldo
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for providing frequency domain display with vi...
- Patent number 9,500,677
- Issue date Nov 22, 2016
- TEKTRONIK, INC.
- Gary J. Waldo
- G01 - MEASURING TESTING
Information Patent Grant
Selective display of waveforms governed by measured parameters
- Patent number 9,443,490
- Issue date Sep 13, 2016
- Tektronix, Inc.
- Benjamin A. Ward
- G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
Information Patent Grant
Time-domain searching in a test and measurement instrument
- Patent number 9,297,834
- Issue date Mar 29, 2016
- Tektronix, Inc.
- Kenneth P. Dobyns
- G01 - MEASURING TESTING
Information Patent Grant
Cross domain triggering in a test and measurement instrument
- Patent number 9,291,646
- Issue date Mar 22, 2016
- Tektronix, Inc.
- Kenneth P. Dobyns
- G01 - MEASURING TESTING
Information Patent Grant
Multi-channel frequency domain test and measurement instrument
- Patent number 9,157,943
- Issue date Oct 13, 2015
- Tektronix, Inc.
- Kenneth P. Dobyns
- G01 - MEASURING TESTING
Information Patent Grant
Method of grouping waveforms for a single channel on a single display
- Patent number 9,026,945
- Issue date May 5, 2015
- Tektronix, Inc.
- Ian S. Dees
- G01 - MEASURING TESTING
Information Patent Grant
Test and measurement instrument with common presentation of time do...
- Patent number 8,615,382
- Issue date Dec 24, 2013
- Tektronix, Inc.
- Kenneth P. Dobyns
- G01 - MEASURING TESTING
Information Patent Grant
Time-domain measurements in a test and measurement instrument
- Patent number 8,461,850
- Issue date Jun 11, 2013
- Tektronix, Inc.
- Kenneth P. Dobyns
- G01 - MEASURING TESTING
Information Patent Grant
RF input/output connector receptacle and control buttons for a meas...
- Patent number D671021
- Issue date Nov 20, 2012
- Tektronix, Inc.
- Kenneth P. Dobyns
- D10 - Measuring, testing, or signalling instruments
Information Patent Grant
Input/output connector receptacles for a measurement instrument
- Patent number D664458
- Issue date Jul 31, 2012
- Tektronix, Inc.
- Robert R. Kreitzer
- D10 - Measuring, testing, or signalling instruments
Information Patent Grant
Front panel for a measurement instrument
- Patent number D663636
- Issue date Jul 17, 2012
- Tektronix, Inc.
- Kenneth P. Dobyns
- D10 - Measuring, testing, or signalling instruments
Information Patent Grant
Calibration method and apparatus for signal analysis device
- Patent number 6,801,042
- Issue date Oct 5, 2004
- Tektronix, Inc.
- Mark E. Mc Pherson
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SEAMLESS SPECTROGRAMS IN A MULTI-CHANNEL TEST AND MEASUREMENT INSTR...
- Publication number 20230258692
- Publication date Aug 17, 2023
- Tektronix, Inc.
- Gary J. WALDO
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATIC DETERMINATION OF SPECTRUM AND SPECTROGRAM ATTRIBUTES IN A...
- Publication number 20230221352
- Publication date Jul 13, 2023
- Tektronix, Inc.
- Gary J. Waldo
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
TEST AND MEASUREMENT INSTRUMENT HAVING SPECTROGRAM WITH CURSOR TIME...
- Publication number 20230221353
- Publication date Jul 13, 2023
- Tektronix, Inc.
- Gary J. Waldo
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR COMPUTING DIRECT QUADRATURE ZERO RESULTANT DR...
- Publication number 20220413051
- Publication date Dec 29, 2022
- Tektronix, Inc.
- Parjanya Adiga
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Application
TEST AND MEASUREMENT INSTRUMENT HAVING PROGRAMMABLE ACQUISITION HIS...
- Publication number 20220308090
- Publication date Sep 29, 2022
- Tektronix, Inc.
- Gary J. WALDO
- G01 - MEASURING TESTING
Information Patent Application
TEST AND MEASUREMENT INSTRUMENT HAVING PROGRAMMABLE ACQUISITION HIS...
- Publication number 20220308790
- Publication date Sep 29, 2022
- Tektronix, Inc.
- Gary J. WALDO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD OF GENERATING METADATA FROM ACQUIRED SIGNALS FOR SEARCH, FIL...
- Publication number 20220252647
- Publication date Aug 11, 2022
- Initial State Technologies, Inc.
- Frederick B. Kuhlman
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEM AND METHOD FOR HIGH PERFORMANCE DISTRIBUTION OF LARGE WAVEFO...
- Publication number 20220163566
- Publication date May 26, 2022
- Initial State Technologies, Inc.
- James R. Bailey
- G01 - MEASURING TESTING
Information Patent Application
IDENTIFYING ONE OR MORE ACQUISITIONS OF INTEREST USING VISUAL QUALI...
- Publication number 20210278441
- Publication date Sep 9, 2021
- Tektronix, Inc.
- Gary J. Waldo
- G01 - MEASURING TESTING
Information Patent Application
BUS DECODE AND TRIGGERING ON DIGITAL DOWN CONVERTED DATA IN A TEST...
- Publication number 20200233827
- Publication date Jul 23, 2020
- Tektronix, Inc.
- James D. Alley
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
APPARATUS AND METHOD FOR TIME CORRELATED SIGNAL ACQUISITION AND VIE...
- Publication number 20170030945
- Publication date Feb 2, 2017
- Tektronix, Inc.
- Gary J. WALDO
- G01 - MEASURING TESTING
Information Patent Application
Locking Foot
- Publication number 20160252207
- Publication date Sep 1, 2016
- Tektronix, Inc.
- Brian A. Hollenberg
- G01 - MEASURING TESTING
Information Patent Application
COMBINATORIAL MASK TRIGGERING IN TIME OR FREQUENCY DOMAIN
- Publication number 20140142880
- Publication date May 22, 2014
- Tektronix, Inc.
- Kenneth P. DOBYNS
- G01 - MEASURING TESTING
Information Patent Application
CROSS DOMAIN TRIGGERING IN A TEST AND MEASUREMENT INSTRUMENT
- Publication number 20140032149
- Publication date Jan 30, 2014
- Tektronix, Inc.
- Kenneth P. Dobyns
- G01 - MEASURING TESTING
Information Patent Application
SELECTIVE DISPLAY OF WAVEFORMS GOVERNED BY MEASURED PARAMETERS
- Publication number 20140002508
- Publication date Jan 2, 2014
- Tektronix, Inc.
- Benjamin A. Ward
- G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
Information Patent Application
APPARATUS AND METHOD FOR PROVIDING FREQUENCY DOMAIN DISPLAY WITH VI...
- Publication number 20130044112
- Publication date Feb 21, 2013
- Tektronix, Inc.
- Gary J. WALDO
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS AND METHOD FOR TIME CORRELATED SIGNAL ACQUISITION AND VIE...
- Publication number 20130044134
- Publication date Feb 21, 2013
- Tektronix, Inc.
- Gary J. WALDO
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF GROUPING WAVEFORMS FOR A SINGLE CHANNEL ON A SINGLE DISPLAY
- Publication number 20120278763
- Publication date Nov 1, 2012
- Tektronix, Inc.
- Ian S. Dees
- G01 - MEASURING TESTING
Information Patent Application
TEST AND MEASUREMENT INSTRUMENT WITH COMMON PRESENTATION OF TIME DO...
- Publication number 20120197598
- Publication date Aug 2, 2012
- Tektronix, Inc.
- Kenneth P. DOBYNS
- G01 - MEASURING TESTING
Information Patent Application
TIME-DOMAIN MEASUREMENTS IN A TEST AND MEASUREMENT INSTRUMENT
- Publication number 20120038369
- Publication date Feb 16, 2012
- Tektronix, Inc.
- Kenneth P. DOBYNS
- G01 - MEASURING TESTING
Information Patent Application
MULTI-CHANNEL FREQUENCY DOMAIN TEST AND MEASUREMENT INSTRUMENT
- Publication number 20120036947
- Publication date Feb 16, 2012
- Tektronix, Inc.
- Kenneth P. DOBYNS
- G01 - MEASURING TESTING
Information Patent Application
Automatic Formation of Groups of Channels
- Publication number 20080192071
- Publication date Aug 14, 2008
- Tektronix, Inc.
- Steven C. Herring
- G01 - MEASURING TESTING
Information Patent Application
Enhanced user interface for an oscilloscope
- Publication number 20070285407
- Publication date Dec 13, 2007
- Evan A. Dickinson
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Digital oscilloscope with customizable display for selected functio...
- Publication number 20050102115
- Publication date May 12, 2005
- Gary J. Waldo
- G01 - MEASURING TESTING
Information Patent Application
Calibration method and apparatus for signal analysis device
- Publication number 20030112017
- Publication date Jun 19, 2003
- Mark E. Mc Pherson
- G01 - MEASURING TESTING

Gary J. WALDO

Person

Patents Grantslast 30 patents

System and method for computing direct quadrature zero resultant dr...

Object oriented graphical user interface for a test and measurement...

Acquiring and displaying multiple waveforms in a test and measureme...

Bus decode and triggering on digital down converted data in a test...

Housing for a test and measurement instrument

Apparatus and method for time correlated signal acquisition and vie...

Front panel for a measurement instrument

Housing for a test and measurement instrument

Combinatorial mask triggering in time or frequency domain

Apparatus and method for time correlated signal acquisition and vie...

Apparatus and method for providing frequency domain display with vi...

Selective display of waveforms governed by measured parameters

Time-domain searching in a test and measurement instrument

Cross domain triggering in a test and measurement instrument

Multi-channel frequency domain test and measurement instrument

Method of grouping waveforms for a single channel on a single display

Test and measurement instrument with common presentation of time do...

Time-domain measurements in a test and measurement instrument

RF input/output connector receptacle and control buttons for a meas...

Input/output connector receptacles for a measurement instrument

Front panel for a measurement instrument

Calibration method and apparatus for signal analysis device

Patents Applicationslast 30 patents

SEAMLESS SPECTROGRAMS IN A MULTI-CHANNEL TEST AND MEASUREMENT INSTR...

AUTOMATIC DETERMINATION OF SPECTRUM AND SPECTROGRAM ATTRIBUTES IN A...

TEST AND MEASUREMENT INSTRUMENT HAVING SPECTROGRAM WITH CURSOR TIME...

SYSTEM AND METHOD FOR COMPUTING DIRECT QUADRATURE ZERO RESULTANT DR...

TEST AND MEASUREMENT INSTRUMENT HAVING PROGRAMMABLE ACQUISITION HIS...

TEST AND MEASUREMENT INSTRUMENT HAVING PROGRAMMABLE ACQUISITION HIS...

METHOD OF GENERATING METADATA FROM ACQUIRED SIGNALS FOR SEARCH, FIL...

SYSTEM AND METHOD FOR HIGH PERFORMANCE DISTRIBUTION OF LARGE WAVEFO...

IDENTIFYING ONE OR MORE ACQUISITIONS OF INTEREST USING VISUAL QUALI...

BUS DECODE AND TRIGGERING ON DIGITAL DOWN CONVERTED DATA IN A TEST...

APPARATUS AND METHOD FOR TIME CORRELATED SIGNAL ACQUISITION AND VIE...

Locking Foot

COMBINATORIAL MASK TRIGGERING IN TIME OR FREQUENCY DOMAIN

CROSS DOMAIN TRIGGERING IN A TEST AND MEASUREMENT INSTRUMENT

SELECTIVE DISPLAY OF WAVEFORMS GOVERNED BY MEASURED PARAMETERS

APPARATUS AND METHOD FOR PROVIDING FREQUENCY DOMAIN DISPLAY WITH VI...

APPARATUS AND METHOD FOR TIME CORRELATED SIGNAL ACQUISITION AND VIE...

METHOD OF GROUPING WAVEFORMS FOR A SINGLE CHANNEL ON A SINGLE DISPLAY

TEST AND MEASUREMENT INSTRUMENT WITH COMMON PRESENTATION OF TIME DO...

TIME-DOMAIN MEASUREMENTS IN A TEST AND MEASUREMENT INSTRUMENT

MULTI-CHANNEL FREQUENCY DOMAIN TEST AND MEASUREMENT INSTRUMENT

Automatic Formation of Groups of Channels

Enhanced user interface for an oscilloscope

Digital oscilloscope with customizable display for selected functio...

Calibration method and apparatus for signal analysis device