Gary L. Chadwick

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Boise, ID, US

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Patents Grantslast 30 patents

Information Patent Grant
Method for burn-in testing semiconductor dice
- Patent number 6,998,860
- Issue date Feb 14, 2006
- Micron Technology, Inc.
- Alan G. Wood
- G01 - MEASURING TESTING
Information Patent Grant
Printing stencils for electronic substrates
- Patent number 6,766,736
- Issue date Jul 27, 2004
- Micron Technology, Inc.
- Richard Regner
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Method and apparatus of testing memory device power and ground pins...
- Patent number 6,545,497
- Issue date Apr 8, 2003
- Micron Technology, Inc.
- Dave Hebert
- G01 - MEASURING TESTING
Information Patent Grant
Discrete die burn-in for nonpackaged die
- Patent number 6,091,251
- Issue date Jul 18, 2000
- Alan G. Wood
- G01 - MEASURING TESTING
Information Patent Grant
Discrete die burn-in for nonpackaged die
- Patent number 6,091,250
- Issue date Jul 18, 2000
- Micron Technology, Inc.
- Alan G. Wood
- G01 - MEASURING TESTING
Information Patent Grant
Discrete die burn-in for non-packaged die
- Patent number 5,302,891
- Issue date Apr 12, 1994
- Micron Technology, Inc.
- Alan G. Wood
- G01 - MEASURING TESTING
Information Patent Grant
Real time monitoring of remote signals in an industrial environment
- Patent number 4,996,655
- Issue date Feb 26, 1991
- Micron Technology, Inc.
- Gary L. Chadwick
- G05 - CONTROLLING REGULATING

Patents Applicationslast 30 patents

Information Patent Application
Light shaping apparatus
- Publication number 20080149853
- Publication date Jun 26, 2008
- Micron Technology, Inc.
- David E. Hebert
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
Printing stencils for electronic substrates
- Publication number 20030041753
- Publication date Mar 6, 2003
- Richard Regner
- B41 - PRINTING LINING MACHINES TYPEWRITERS STAMPS
Information Patent Application
Method and apparatus of testing memory device power and ground pins...
- Publication number 20020132382
- Publication date Sep 19, 2002
- Dave Hebert
- G01 - MEASURING TESTING