Gary L. Cloud

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East Lansing, MI, US

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Patents Grantslast 30 patents

Information Patent Grant
Scanning interferometry technique for through-thickness evaluation...
- Patent number 9,500,468
- Issue date Nov 22, 2016
- Board of Trustees of Michigan State University
- Anton S. Khomenko
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for electronic speckle pattern interferometry
- Patent number 6,188,482
- Issue date Feb 13, 2001
- Board of Trustees operating Michigan State University
- Gary L. Cloud
- G01 - MEASURING TESTING
Information Patent Grant
Technique and apparatus for performing electronic speckle pattern i...
- Patent number 6,128,082
- Issue date Oct 3, 2000
- Board of Trustees operating Michigan State University
- Gary L. Cloud
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Scanning interferometry technique for through-thickness evaluation...
- Publication number 20160054116
- Publication date Feb 25, 2016
- Board of Trustees of Michigan State University
- Anton S. Khomenko
- G01 - MEASURING TESTING