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Gary L. Deppe
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Mansfield, OH, US
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last 30 patents
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Patent Grant
Temperature responsive probe apparatus
Patent number
5,949,324
Issue date
Sep 7, 1999
John M. Segler
G01 - MEASURING TESTING
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Patent Grant
Thermal sensor assembly
Patent number
4,866,410
Issue date
Sep 12, 1989
Hi-Stat Manufacturing Company, Inc.
Gary L. Deppe
G01 - MEASURING TESTING