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Gary M. DeVries
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Fairport, NY, US
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Patents Grants
last 30 patents
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Patent Grant
Stitching of near-nulled subaperture measurements
Patent number
8,203,719
Issue date
Jun 19, 2012
QED Technologies International, Inc.
Paul Murphy
G01 - MEASURING TESTING
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Patent Grant
Method for accurate high-resolution measurements of aspheric surfaces
Patent number
7,433,057
Issue date
Oct 7, 2008
QED Technologies International, Inc.
Paul E. Murphy
G01 - MEASURING TESTING
Patents Applications
last 30 patents
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Patent Application
Stitching of near-nulled subaperture measurements
Publication number
20090251702
Publication date
Oct 8, 2009
OED Technologies International, Inc.
Paul Murphy
G01 - MEASURING TESTING
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Patent Application
Method for accurate high-resolution measurements of aspheric surfaces
Publication number
20060221350
Publication date
Oct 5, 2006
QED Technologies, Inc.
Paul E. Murphy
G01 - MEASURING TESTING