Gary Mark Gunderson

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Issaquah, WA, US

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Patents Grantslast 30 patents

Information Patent Grant
Inspection device with vertically moveable assembly
- Patent number 9,535,089
- Issue date Jan 3, 2017
- Rudolph Technologies, Inc.
- Gary Mark Gunderson
- G01 - MEASURING TESTING
Information Patent Grant
Inspection device with vertically moveable assembly
- Patent number 8,729,917
- Issue date May 20, 2014
- Rudolph Technologies, Inc.
- Gary Mark Gunderson
- G01 - MEASURING TESTING
Information Patent Grant
System and method of planar positioning
- Patent number 6,986,211
- Issue date Jan 17, 2006
- Applied Precision, LLC
- Gary M. Gunderson
- G01 - MEASURING TESTING
Information Patent Grant
Z-axis frame for a high accuracy orthogonal motion stage
- Patent number 6,781,753
- Issue date Aug 24, 2004
- Applied Precision, LLC
- Gary M. Gunderson
- G02 - OPTICS
Information Patent Grant
Orthogonal high accuracy microscope stage
- Patent number 5,812,310
- Issue date Sep 22, 1998
- Applied Precision, Inc.
- John P. Stewart
- G02 - OPTICS

Patents Applicationslast 30 patents

Information Patent Application
INSPECTION DEVICE WITH VERTICALLY MOVEABLE ASSEMBLY
- Publication number 20140253166
- Publication date Sep 11, 2014
- Rudolph Technologies, Inc.
- Gary Mark Gunderson
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION DEVICE WITH VERTICALLY MOVEABLE ASSEMBLY
- Publication number 20120098563
- Publication date Apr 26, 2012
- Rudolph Technologies, Inc.
- Gary Mark Gunderson
- G01 - MEASURING TESTING
Information Patent Application
System and method of planar positioning
- Publication number 20060156569
- Publication date Jul 20, 2006
- Gary M. Gunderson
- G01 - MEASURING TESTING
Information Patent Application
System and method of planar positioning
- Publication number 20050011080
- Publication date Jan 20, 2005
- Gary M. Gunderson
- G01 - MEASURING TESTING
Information Patent Application
Z-axis frame for a high accuracy orthogonal motion stage
- Publication number 20020093733
- Publication date Jul 18, 2002
- Gary M. Gunderson
- G02 - OPTICS