Gary R. Janik

Person

Palo Alto, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Systems and methods for managing storage endurance
- Patent number 10,268,396
- Issue date Apr 23, 2019
- SanDisk Technologies LLC
- Gary Janik
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Systems and methods for managing storage endurance
- Patent number 9,766,819
- Issue date Sep 19, 2017
- SanDisk Technologies LLC
- Gary Janik
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System and method for apodization in a semiconductor device inspect...
- Patent number 9,645,093
- Issue date May 9, 2017
- KLA-Tencor Corporation
- Jamie M. Sullivan
- G02 - OPTICS
Information Patent Grant
System and method for apodization in a semiconductor device inspect...
- Patent number 9,176,069
- Issue date Nov 3, 2015
- KLA-Tencor Corporation
- Jamie M. Sullivan
- G01 - MEASURING TESTING
Information Patent Grant
Scatterometry metrology using inelastic scattering
- Patent number 7,903,260
- Issue date Mar 8, 2011
- KLA-Tencor Corporation
- Gary R. Janik
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods for measurement of a specimen with vacuum ultra...
- Patent number 7,764,376
- Issue date Jul 27, 2010
- KLA-Tencor Technologies Corp.
- John Fielden
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Scatterometry metrology using inelastic scattering
- Patent number 7,688,454
- Issue date Mar 30, 2010
- KLA-Tencor Corporation
- Gary R. Janik
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods for measurement of a specimen with vacuum ultra...
- Patent number 7,623,239
- Issue date Nov 24, 2009
- KLA-Tencor Technologies Corp.
- John Fielden
- G01 - MEASURING TESTING
Information Patent Grant
Dynamic measurement control
- Patent number 7,606,677
- Issue date Oct 20, 2009
- KLA-Tencor Technologies Corporation
- Gary R. Janik
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Systems and methods for measurement of a specimen with vacuum ultra...
- Patent number 7,564,552
- Issue date Jul 21, 2009
- KLA-Tencor Technologies Corp.
- John Fielden
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Electrical measurements on semiconductors using corona and microwav...
- Patent number 7,521,946
- Issue date Apr 21, 2009
- KLA-Tencor Technologies Corporation
- Gary R. Janik
- G01 - MEASURING TESTING
Information Patent Grant
Film thickness and composition measurement via auger electron spect...
- Patent number 7,495,217
- Issue date Feb 24, 2009
- KLA-Tencor Corporation
- Ying Gao
- G01 - MEASURING TESTING
Information Patent Grant
Scatterometry metrology using inelastic scattering
- Patent number 7,433,056
- Issue date Oct 7, 2008
- KLA-Tencor Technologies Corporation
- Gary R. Janik
- G01 - MEASURING TESTING
Information Patent Grant
Large collection angle x-ray monochromators for electron probe micr...
- Patent number 7,427,757
- Issue date Sep 23, 2008
- KLA-Tencor Technologies Corporation
- Gary R. Janik
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Optical system for measuring samples using short wavelength radiation
- Patent number 7,369,233
- Issue date May 6, 2008
- KLA-Tencor Technologies Corporation
- Mehrdad Nikoonahad
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for measuring deep trenches in silicon
- Patent number 7,369,235
- Issue date May 6, 2008
- KLA-Tencor Corporation
- Gary R. Janik
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods for measurement of a specimen with vacuum ultra...
- Patent number 7,359,052
- Issue date Apr 15, 2008
- KLA-Tencor Technologies Corp.
- John Fielden
- G01 - MEASURING TESTING
Information Patent Grant
Time-resolved measurement technique using radiation pulses
- Patent number 7,295,325
- Issue date Nov 13, 2007
- KLA-Tencor Technologies Corporation
- Hidong Kwak
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods for measuring stress in a specimen
- Patent number 7,274,440
- Issue date Sep 25, 2007
- KLA-Tencor Technologies Corp.
- Gary Janik
- G01 - MEASURING TESTING
Information Patent Grant
Laser-based cleaning device for film analysis tool
- Patent number 7,253,901
- Issue date Aug 7, 2007
- KLA-Tencor Technologies Corporation
- Gary R. Janik
- G01 - MEASURING TESTING
Information Patent Grant
Film thickness and composition measurement via auger electron spect...
- Patent number 7,220,964
- Issue date May 22, 2007
- KLA-Tencor Technologies Corporation
- Ying Gao
- G01 - MEASURING TESTING
Information Patent Grant
Laser-based cleaning device for film analysis tool
- Patent number 7,202,951
- Issue date Apr 10, 2007
- KLA-Tencor Technologies Corporation
- Gary R. Janik
- G01 - MEASURING TESTING
Information Patent Grant
Patterned substrate surface mapping
- Patent number 7,196,801
- Issue date Mar 27, 2007
- KLA-Tencor Technologies Corporation
- Gary R. Janik
- G01 - MEASURING TESTING
Information Patent Grant
Methods and systems for preparing a sample for thin film analysis
- Patent number 7,190,441
- Issue date Mar 13, 2007
- KLA-Tencor Technologies Corp.
- James T. McWhirter
- G01 - MEASURING TESTING
Information Patent Grant
X-ray imaging for patterned film measurement
- Patent number 7,166,838
- Issue date Jan 23, 2007
- KLA-Tencor Technologies Corporation
- Gary R. Janik
- G01 - MEASURING TESTING
Information Patent Grant
X-ray reflectivity system with variable spot
- Patent number 7,139,365
- Issue date Nov 21, 2006
- KLA-Tencor Technologies Corporation
- Gary R. Janik
- G01 - MEASURING TESTING
Information Patent Grant
Film measurement with interleaved laser cleaning
- Patent number 7,110,113
- Issue date Sep 19, 2006
- KLA-Tencor Technologies Corporation
- Gary R. Janik
- B08 - CLEANING
Information Patent Grant
Method for measuring gate dielectric properties for three dimension...
- Patent number 7,109,735
- Issue date Sep 19, 2006
- KLA-Tencor Technologies Corporation
- Gary R. Janik
- G01 - MEASURING TESTING
Information Patent Grant
Angle resolved x-ray detection
- Patent number 7,075,073
- Issue date Jul 11, 2006
- KLA-Tencor Technologies Corporation
- Gary R. Janik
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
X-ray metrology using a transmissive x-ray optical element
- Patent number 7,072,442
- Issue date Jul 4, 2006
- KLA-Tencor Technologies Corporation
- Gary R. Janik
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING

Patents Applicationslast 30 patents

Information Patent Application
SYSTEMS AND METHODS FOR MANAGING STORAGE ENDURANCE
- Publication number 20170351439
- Publication date Dec 7, 2017
- SanDisk Technologies LLC
- Gary Janik
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEMS AND METHODS FOR MANAGING STORAGE ENDURANCE
- Publication number 20160188221
- Publication date Jun 30, 2016
- SanDisk Technologies, Inc.
- Gary Janik
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
CONFIGURATION PARAMETER MANAGEMENT FOR NON-VOLATILE DATA STORAGE
- Publication number 20160141042
- Publication date May 19, 2016
- SanDisk Technologies, Inc.
- James Peterson
- G11 - INFORMATION STORAGE
Information Patent Application
System and Method for Apodization in a Semiconductor Device Inspect...
- Publication number 20160054232
- Publication date Feb 25, 2016
- KLA-Tencor Corporation
- Jamie M. Sullivan
- G01 - MEASURING TESTING
Information Patent Application
DETERMINING A CONFIGURATION PARAMETER USING A SOFT READ COMMAND
- Publication number 20150205664
- Publication date Jul 23, 2015
- FUSION-IO, INC.
- Gary Janik
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
System and Method for Apodization in a Semiconductor Device Inspect...
- Publication number 20140016125
- Publication date Jan 16, 2014
- KLA-Tencor Corporation
- Jamie M. Sullivan
- G02 - OPTICS
Information Patent Application
System and Method for Rejuvenating an Imaging Sensor Degraded by Ex...
- Publication number 20130295695
- Publication date Nov 7, 2013
- Gildardo Delgado
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS AND METHODS FOR MEASUREMENT OF A SPECIMEN WITH VACUUM ULTRA...
- Publication number 20090279088
- Publication date Nov 12, 2009
- KLA-TENCOR TECHONOLOGIES CORPORATION
- John Fielden
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
SYSTEMS AND METHODS FOR MEASUREMENT OF A SPECIMEN WITH VACUUM ULTRA...
- Publication number 20080252889
- Publication date Oct 16, 2008
- John Fielden
- G01 - MEASURING TESTING
Information Patent Application
Systems and methods for measurement or analysis of a specimen using...
- Publication number 20050253080
- Publication date Nov 17, 2005
- Gary Janik
- G01 - MEASURING TESTING
Information Patent Application
Systems and methods for measurement of a specimen with vacuum ultra...
- Publication number 20050254050
- Publication date Nov 17, 2005
- John Fielden
- G01 - MEASURING TESTING
Information Patent Application
Systems and methods for measurement of a specimen with vacuum ultra...
- Publication number 20050252752
- Publication date Nov 17, 2005
- John Fielden
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Time-resolved measurement technique using radiation pulses
- Publication number 20040207850
- Publication date Oct 21, 2004
- Hidong Kwak
- G01 - MEASURING TESTING
Information Patent Application
Optical system for measuring samples using short wavelength radiation
- Publication number 20040150820
- Publication date Aug 5, 2004
- Mehrdad Nikoonahad
- G01 - MEASURING TESTING
Information Patent Application
Multi-technique thin film analysis tool
- Publication number 20030169846
- Publication date Sep 11, 2003
- Gary R. Janik
- G01 - MEASURING TESTING
Information Patent Application
Surface photo-acoustic film measurement device and technique
- Publication number 20030150272
- Publication date Aug 14, 2003
- Gary Janik
- G01 - MEASURING TESTING
Information Patent Application
Laser-based cleaning device for film analysis tool
- Publication number 20030137662
- Publication date Jul 24, 2003
- Gary R. Janik
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for improved x-ray reflection measurement
- Publication number 20030086533
- Publication date May 8, 2003
- Gary Janik
- G01 - MEASURING TESTING

Gary R. Janik

Person

Patents Grantslast 30 patents

Systems and methods for managing storage endurance

Systems and methods for managing storage endurance

System and method for apodization in a semiconductor device inspect...

System and method for apodization in a semiconductor device inspect...

Scatterometry metrology using inelastic scattering

Systems and methods for measurement of a specimen with vacuum ultra...

Scatterometry metrology using inelastic scattering

Systems and methods for measurement of a specimen with vacuum ultra...

Dynamic measurement control

Systems and methods for measurement of a specimen with vacuum ultra...

Electrical measurements on semiconductors using corona and microwav...

Film thickness and composition measurement via auger electron spect...

Scatterometry metrology using inelastic scattering

Large collection angle x-ray monochromators for electron probe micr...

Optical system for measuring samples using short wavelength radiation

Method and system for measuring deep trenches in silicon

Systems and methods for measurement of a specimen with vacuum ultra...

Time-resolved measurement technique using radiation pulses

Systems and methods for measuring stress in a specimen

Laser-based cleaning device for film analysis tool

Film thickness and composition measurement via auger electron spect...

Laser-based cleaning device for film analysis tool

Patterned substrate surface mapping

Methods and systems for preparing a sample for thin film analysis

X-ray imaging for patterned film measurement

X-ray reflectivity system with variable spot

Film measurement with interleaved laser cleaning

Method for measuring gate dielectric properties for three dimension...

Angle resolved x-ray detection

X-ray metrology using a transmissive x-ray optical element

Patents Applicationslast 30 patents

SYSTEMS AND METHODS FOR MANAGING STORAGE ENDURANCE

SYSTEMS AND METHODS FOR MANAGING STORAGE ENDURANCE

CONFIGURATION PARAMETER MANAGEMENT FOR NON-VOLATILE DATA STORAGE

System and Method for Apodization in a Semiconductor Device Inspect...

DETERMINING A CONFIGURATION PARAMETER USING A SOFT READ COMMAND

System and Method for Apodization in a Semiconductor Device Inspect...

System and Method for Rejuvenating an Imaging Sensor Degraded by Ex...

SYSTEMS AND METHODS FOR MEASUREMENT OF A SPECIMEN WITH VACUUM ULTRA...

SYSTEMS AND METHODS FOR MEASUREMENT OF A SPECIMEN WITH VACUUM ULTRA...

Systems and methods for measurement or analysis of a specimen using...

Systems and methods for measurement of a specimen with vacuum ultra...

Systems and methods for measurement of a specimen with vacuum ultra...

Time-resolved measurement technique using radiation pulses

Optical system for measuring samples using short wavelength radiation

Multi-technique thin film analysis tool

Surface photo-acoustic film measurement device and technique

Laser-based cleaning device for film analysis tool

Method and apparatus for improved x-ray reflection measurement