Gary Robert Waggoner

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San Jose, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Integrated circuit and method for testing memory on the integrated...
- Patent number 8,145,958
- Issue date Mar 27, 2012
- ARM Limited
- Robert Campbell Aitken
- G11 - INFORMATION STORAGE
Information Patent Grant
Method and apparatus for handling fuse data for repairing faulty el...
- Patent number 8,112,681
- Issue date Feb 7, 2012
- ARM Limited
- Faisal Ramzan Ali Khoja
- G11 - INFORMATION STORAGE
Information Patent Grant
Supporting scan functions within memories
- Patent number 8,045,401
- Issue date Oct 25, 2011
- ARM Limited
- Yew Keong Chong
- G11 - INFORMATION STORAGE
Information Patent Grant
Serial scan chain control within an integrated circuit
- Patent number 7,734,974
- Issue date Jun 8, 2010
- ARM Limited
- Robert Campbell Aitken
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Supporting scan functions within memories
- Publication number 20110072323
- Publication date Mar 24, 2011
- ARM Limited
- Yew Keong Chong
- G11 - INFORMATION STORAGE
Information Patent Application
Electronic fuses
- Publication number 20090190422
- Publication date Jul 30, 2009
- ARM Limited
- Faisal Ramzan Ali Khoja
- G11 - INFORMATION STORAGE
Information Patent Application
Serial scan chain control within an integrated circuit
- Publication number 20090019329
- Publication date Jan 15, 2009
- ARM Limited
- Robert Campbell Aitken
- G01 - MEASURING TESTING
Information Patent Application
Integrated circuit and method for testing memory on the integrated...
- Publication number 20070106923
- Publication date May 10, 2007
- Robert Campbell Aitken
- G11 - INFORMATION STORAGE