Gary Stewart Kanner

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Algonquin, IL, US

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Patents Grantslast 30 patents

Information Patent Grant
Optical method and system for analyzing or inspecting patterned mat...
- Patent number 7,495,823
- Issue date Feb 24, 2009
- Northrop Grumman Corporation
- Gary Stewart Kanner
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Optical method and system for analyzing or inspecting patterned mat...
- Publication number 20080049300
- Publication date Feb 28, 2008
- Litton Systems, Inc.
- Gary Stewart Kanner
- G02 - OPTICS