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Gary W. Michalko
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Ham Lake, MN, US
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Patents Grants
last 30 patents
Information
Patent Grant
Electrically conductive pins microcircuit tester
Patent number
10,302,675
Issue date
May 28, 2019
Johnstech International Corporation
John E. Nelson
Y10 - TECHNICAL SUBJECTS COVERED BY FORMER USPC
Information
Patent Grant
Electrically conductive kelvin contacts for microcircuit tester
Patent number
10,247,755
Issue date
Apr 2, 2019
Johnstech International Corporation
Joel N. Erdman
G01 - MEASURING TESTING
Information
Patent Grant
Resilient interposer with electrically conductive slide-by pins as...
Patent number
10,073,117
Issue date
Sep 11, 2018
Johnstech International Corporation
John E. Nelson
G01 - MEASURING TESTING
Information
Patent Grant
Electrically conductive pins for microcircuit tester
Patent number
9,678,106
Issue date
Jun 13, 2017
Johnstech International Corporation
John E. Nelson
G01 - MEASURING TESTING
Information
Patent Grant
Electrically conductive kelvin contacts for microcircuit tester
Patent number
9,500,673
Issue date
Nov 22, 2016
Johnstech International Corporation
Joel Erdman
G01 - MEASURING TESTING
Information
Patent Grant
Electrically conductive Kelvin contacts for microcircuit tester
Patent number
9,329,204
Issue date
May 3, 2016
Johnstech International Corporation
Joel N. Erdman
G01 - MEASURING TESTING
Information
Patent Grant
Electrically conductive pins for microcircuit tester
Patent number
9,297,832
Issue date
Mar 29, 2016
Johnstech International Corporation
John E. Nelson
G01 - MEASURING TESTING
Information
Patent Grant
Electrically conductive pins for microcircuit tester
Patent number
9,007,082
Issue date
Apr 14, 2015
Johnstech International Corporation
John E. Nelson
G01 - MEASURING TESTING
Information
Patent Grant
Electrically conductive kelvin contacts for microcircuit tester
Patent number
8,988,090
Issue date
Mar 24, 2015
Johnstech International Corporation
Joel N. Erdman
G01 - MEASURING TESTING
Information
Patent Grant
Microcircuit tester with slideable electrically conductive pins
Patent number
8,937,484
Issue date
Jan 20, 2015
Johnstech International Corporation
John E. Nelson
G01 - MEASURING TESTING
Information
Patent Grant
Electrically conductive Kelvin contacts for microcircuit tester
Patent number
8,558,554
Issue date
Oct 15, 2013
Johnstech International Corporation
Joel N. Erdman
G01 - MEASURING TESTING
Information
Patent Grant
Electrically conductive pins for microcircuit tester
Patent number
8,536,889
Issue date
Sep 17, 2013
Johnstech International Corporation
John E. Nelson
G01 - MEASURING TESTING
Information
Patent Grant
Electrical contact pin
Patent number
D663635
Issue date
Jul 17, 2012
Johnstech International Corporation
John E. Steger
D10 - Measuring, testing, or signalling instruments
Information
Patent Grant
Electrical pin used in integrated circuit test sockets
Patent number
D634228
Issue date
Mar 15, 2011
Johnstech International
John E. Steger
D10 - Measuring, testing, or signalling instruments
Information
Patent Grant
Transition flow treatment process and apparatus
Patent number
7,156,927
Issue date
Jan 2, 2007
FSI International, Inc.
Kurt Karl Christenson
B08 - CLEANING
Patents Applications
last 30 patents
Information
Patent Application
Electrically Conductive Kelvin Contacts For Microcircuit Tester
Publication number
20190302145
Publication date
Oct 3, 2019
Johnstech International Corporation
Joel N. Erdman
G01 - MEASURING TESTING
Information
Patent Application
Electrically Conductive Pins Microcircuit Tester
Publication number
20190004091
Publication date
Jan 3, 2019
Johnstech International Corporation
John E. Nelson
G01 - MEASURING TESTING
Information
Patent Application
Electrically Conductive Pins Microcircuit Tester
Publication number
20170276699
Publication date
Sep 28, 2017
Johnstech International Corporation
John E. Nelson
G01 - MEASURING TESTING
Information
Patent Application
Electrically Conductive Kelvin Contacts For Microcircuit Tester
Publication number
20160320429
Publication date
Nov 3, 2016
Johnstech International Corporation
Joel N. Erdman
G01 - MEASURING TESTING
Information
Patent Application
Electrically Conductive Pins Microcircuit Tester
Publication number
20160209444
Publication date
Jul 21, 2016
Johnstech International Corporation
John E. Nelson
G01 - MEASURING TESTING
Information
Patent Application
Electrically Conductive Pins For Microcircuit Tester
Publication number
20150123689
Publication date
May 7, 2015
Johnstech International Corporation
John E. Nelson
G01 - MEASURING TESTING
Information
Patent Application
Electrically Conductive Pins For Microcircuit Tester
Publication number
20140266279
Publication date
Sep 18, 2014
Johnstech International Corporation
John E. Nelson
G01 - MEASURING TESTING
Information
Patent Application
Electrically Conductive Kelvin Contacts For Microcircuit Tester
Publication number
20140103949
Publication date
Apr 17, 2014
Joel N. Erdman
G01 - MEASURING TESTING
Information
Patent Application
Electrically Conductive Pins For Microcircuit Tester
Publication number
20130271176
Publication date
Oct 17, 2013
John E. Nelson
G01 - MEASURING TESTING
Information
Patent Application
Electrically Conductive Pins For Microcircuit Tester
Publication number
20130154678
Publication date
Jun 20, 2013
Johnstech International Corporation
John E. Nelson
G01 - MEASURING TESTING
Information
Patent Application
Electrically Conductive Kelvin Contacts For Microcircuit Tester
Publication number
20130099810
Publication date
Apr 25, 2013
Johnstech International Corporation
Joel N. Erdman
G01 - MEASURING TESTING
Information
Patent Application
Electrically Conductive Pins For Microcircuit Tester
Publication number
20130002285
Publication date
Jan 3, 2013
Johnstech International Corporation
John E. Nelson
G01 - MEASURING TESTING
Information
Patent Application
Electrically Conductive Kelvin Contacts For Microcircuit Tester
Publication number
20120092034
Publication date
Apr 19, 2012
Johnstech International Corporation
Joel N. Erdman
G01 - MEASURING TESTING
Information
Patent Application
Electrically Conductive Pins For Microcircuit Tester
Publication number
20120062261
Publication date
Mar 15, 2012
Johnstech International Corporation
John E. Nelson
G01 - MEASURING TESTING
Information
Patent Application
Electrically Conductive Kelvin Contacts For Microcircuit Tester
Publication number
20100264935
Publication date
Oct 21, 2010
Joel N. Erdman
G01 - MEASURING TESTING
Information
Patent Application
Transition flow treatment process and apparatus
Publication number
20030188765
Publication date
Oct 9, 2003
Kurt Karl Christenson
B08 - CLEANING