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Gary W. Reed
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Beaverton, OR, US
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Patents Grants
last 30 patents
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Patent Grant
Probing adapter for a signal acquisition probe having pivoting, com...
Patent number
7,592,822
Issue date
Sep 22, 2009
Tektronix, Inc.
Gary W. Reed
G01 - MEASURING TESTING
Information
Patent Grant
Attachable/detachable variable spacing probing tip system
Patent number
6,967,473
Issue date
Nov 22, 2005
Tektronix, Inc.
Gary W. Reed
G01 - MEASURING TESTING
Information
Patent Grant
Multi-channel, low input capacitance signal probe and probe head
Patent number
6,781,391
Issue date
Aug 24, 2004
Tektronix, Inc.
Gary W. Reed
G01 - MEASURING TESTING
Information
Patent Grant
Removable mechanical attachment system for electronic assemblies
Patent number
6,646,887
Issue date
Nov 11, 2003
Tektronix, Inc.
Kei-Wean C. Yang
G02 - OPTICS
Information
Patent Grant
Probe tip adapter for a measurement probe
Patent number
6,603,297
Issue date
Aug 5, 2003
Tektronix, Inc.
Marc A. Gessford
G01 - MEASURING TESTING
Information
Patent Grant
Probe tip adapter for a measurement probe
Patent number
6,400,167
Issue date
Jun 4, 2002
Tektronix, Inc.
Marc A. Gessford
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
Probing Adapter for a Signal Acquisition Probe
Publication number
20090153159
Publication date
Jun 18, 2009
Tektronix, Inc.
Gary W. Reed
G01 - MEASURING TESTING
Information
Patent Application
ATTACHABLE/DETACHABLE VARIABLE SPACING PROBING TIP SYSTEM
Publication number
20050264276
Publication date
Dec 1, 2005
Gary W. Reed
G01 - MEASURING TESTING
Information
Patent Application
REMOVABLE MECHANICAL ATTACHMENT SYSTEM FOR ELECTRONIC ASSEMBLIES
Publication number
20030179562
Publication date
Sep 25, 2003
Kei-Wean C. Yang
G02 - OPTICS
Information
Patent Application
Multi-channel, low input capacitance signal probe and probe head
Publication number
20030107388
Publication date
Jun 12, 2003
Gary W. Reed
G01 - MEASURING TESTING