Gary W. Rubloff

Person

Katonah, NY, US

People

Patents Grantslast 30 patents

Information Patent Grant
Apparatus for directional low pressure chemical vapor deposition (D...
- Patent number 5,290,358
- Issue date Mar 1, 1994
- International Business Machines Corporation
- Gary W. Rubloff
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Full-wafer processing of laser diodes with cleaved facets
- Patent number 5,284,792
- Issue date Feb 8, 1994
- International Business Machines Corporation
- Theodor Forster
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
High area capacitor formation using material dependent etching
- Patent number 5,155,657
- Issue date Oct 13, 1992
- International Business Machines Corporation
- Gottlieb S. Oehrlein
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
High area capacitor formation using dry etching
- Patent number 5,153,813
- Issue date Oct 6, 1992
- International Business Machines Corporation
- Gottlieb S. Oehrlein
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Metal-polymer adhesion by low energy bombardment
- Patent number 4,886,681
- Issue date Dec 12, 1989
- International Business Machines Corporation
- Joachim G. Clabes
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Full chip integrated circuit tester
- Patent number 4,845,425
- Issue date Jul 4, 1989
- International Business Machines Corporation
- Johannes G. Beha
- G01 - MEASURING TESTING
Information Patent Grant
Photon assisted tunneling testing of passivated integrated circuits
- Patent number 4,786,864
- Issue date Nov 22, 1988
- International Business Machines Corporation
- Johannes G. Beha
- G01 - MEASURING TESTING
Information Patent Grant
Post-oxidation anneal of silicon dioxide
- Patent number 4,784,975
- Issue date Nov 15, 1988
- International Business Machines Corporation
- Karl Hofmann
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Enhanced adhesion between metals and polymers
- Patent number 4,720,401
- Issue date Jan 19, 1988
- International Business Machines Corporation
- Paul S. C. Ho
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Noncontact dynamic tester for integrated circuits
- Patent number 4,706,018
- Issue date Nov 10, 1987
- International Business Machines Corporation
- Johannes G. Beha
- G01 - MEASURING TESTING
Information Patent Grant
Full chip integrated circuit tester
- Patent number 4,703,260
- Issue date Oct 27, 1987
- International Business Machines Corporation
- Johannes G. Beha
- G01 - MEASURING TESTING
Information Patent Grant
Low temperature shallow doping technique
- Patent number 4,692,348
- Issue date Sep 8, 1987
- International Business Machines Corporation
- Gary W. Rubloff
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Noncontact full-line dynamic AC tester for integrated circuits
- Patent number 4,670,710
- Issue date Jun 2, 1987
- International Business Machines Corporation
- Johannes G. Beha
- G01 - MEASURING TESTING
Information Patent Grant
Photon assisted tunneling testing of passivated integrated circuits
- Patent number 4,644,264
- Issue date Feb 17, 1987
- International Business Machines Corporation
- Johannes G. Beha
- G01 - MEASURING TESTING

Gary W. Rubloff

Person

Patents Grantslast 30 patents

Apparatus for directional low pressure chemical vapor deposition (D...

Full-wafer processing of laser diodes with cleaved facets

High area capacitor formation using material dependent etching

High area capacitor formation using dry etching

Metal-polymer adhesion by low energy bombardment

Full chip integrated circuit tester

Photon assisted tunneling testing of passivated integrated circuits

Post-oxidation anneal of silicon dioxide

Enhanced adhesion between metals and polymers

Noncontact dynamic tester for integrated circuits

Full chip integrated circuit tester

Low temperature shallow doping technique

Noncontact full-line dynamic AC tester for integrated circuits

Photon assisted tunneling testing of passivated integrated circuits