Gary William Maier

Person

Burlington, VT, US

People

Patents Grantslast 30 patents

Information Patent Grant
Portable chip tester with integrated field programmable gate array
- Patent number 11,226,372
- Issue date Jan 18, 2022
- International Business Machines Corporation
- Noah Singer
- G01 - MEASURING TESTING
Information Patent Grant
Built-in device testing of integrated circuits
- Patent number 10,768,230
- Issue date Sep 8, 2020
- International Business Machines Corporation
- Robert M. Casatuta
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Iterative N-detect based logic diagnostic technique
- Patent number 10,254,336
- Issue date Apr 9, 2019
- International Business Machines Corporation
- Mary P. Kusko
- G01 - MEASURING TESTING
Information Patent Grant
Dynamic fault model generation for diagnostics simulation and patte...
- Patent number 10,169,510
- Issue date Jan 1, 2019
- International Business Machines Corporation
- Mary P. Kusko
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method of forming a temporary test structure for device fabrication
- Patent number 10,043,723
- Issue date Aug 7, 2018
- International Business Machines Corporation
- Charles L. Arvin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Iterative N-detect based logic diagnostic technique
- Patent number 10,024,910
- Issue date Jul 17, 2018
- International Business Machines Corporation
- Mary P. Kusko
- G01 - MEASURING TESTING
Information Patent Grant
Method of forming a temporary test structure for device fabrication
- Patent number 9,997,424
- Issue date Jun 12, 2018
- International Business Machines Corporation
- Charles L. Arvin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of forming a temporary test structure for device fabrication
- Patent number 9,899,280
- Issue date Feb 20, 2018
- International Business Machines Corporation
- Charles L. Arvin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Dynamic fault model generation for diagnostics simulation and patte...
- Patent number 9,852,245
- Issue date Dec 26, 2017
- International Business Machines Corporation
- Mary P. Kusko
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method of forming a temporary test structure for device fabrication
- Patent number 9,735,071
- Issue date Aug 15, 2017
- International Business Machines Corporation
- Charles L. Arvin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Dynamic fault model generation for diagnostics simulation and patte...
- Patent number 9,552,449
- Issue date Jan 24, 2017
- International Business Machines Corporation
- Mary P. Kusko
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Optimizing heat transfer in 3-D chip-stacks
- Patent number 9,189,037
- Issue date Nov 17, 2015
- GLOBALFOUNDRIES Inc.
- Thomas Brunschwiler
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Phase change memory management
- Patent number 9,047,938
- Issue date Jun 2, 2015
- International Business Machines Corporation
- Mukta G. Farooq
- G11 - INFORMATION STORAGE
Information Patent Grant
Physical design symmetry and integrated circuits enabling three dim...
- Patent number 9,029,234
- Issue date May 12, 2015
- International Business Machines Corporation
- John Matthew Safran
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Three-dimensional (3D) stacked integrated circuit testing
- Patent number 8,542,030
- Issue date Sep 24, 2013
- International Business Machines Corporation
- Chen-Yong Cher
- G01 - MEASURING TESTING
Information Patent Grant
AC ABIST diagnostic method, apparatus and program product
- Patent number 7,930,601
- Issue date Apr 19, 2011
- International Business Machines Corporation
- Joseph Eckelman
- G11 - INFORMATION STORAGE
Information Patent Grant
Method for enhancing the diagnostic accuracy of a VLSI chip
- Patent number 7,831,863
- Issue date Nov 9, 2010
- International Business Machines Corporation
- Mary P. Kusko
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Creation of memory array bitmaps using logical to physical server
- Patent number 6,775,796
- Issue date Aug 10, 2004
- International Business Machines Corporation
- Ulrich A. Finkler
- G11 - INFORMATION STORAGE
Information Patent Grant
System and method to predetermine a bitmap of a self-tested embedde...
- Patent number 6,754,864
- Issue date Jun 22, 2004
- International Business Machines Corporation
- David V. Gangl
- G11 - INFORMATION STORAGE
Information Patent Grant
Array-built-in-self-test (ABIST) for efficient, fast, bitmapping of...
- Patent number 6,643,807
- Issue date Nov 4, 2003
- International Business Machines Corporation
- Jay G. Heaslip
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
PORTABLE CHIP TESTER WITH INTEGRATED FIELD PROGRAMMABLE GATE ARRAY
- Publication number 20210109154
- Publication date Apr 15, 2021
- International Business Machines Corporation
- Noah Singer
- G01 - MEASURING TESTING
Information Patent Application
ITERATIVE N-DETECT BASED LOGIC DIAGNOSTIC TECHNIQUE
- Publication number 20180252769
- Publication date Sep 6, 2018
- International Business Machines Corporation
- Mary P. Kusko
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF FORMING A TEMPORARY TEST STRUCTURE FOR DEVICE FABRICATION
- Publication number 20180090400
- Publication date Mar 29, 2018
- International Business Machines Corporation
- Charles L. Arvin
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF FORMING A TEMPORARY TEST STRUCTURE FOR DEVICE FABRICATION
- Publication number 20180090399
- Publication date Mar 29, 2018
- International Business Machines Corporation
- Charles L. Arvin
- G01 - MEASURING TESTING
Information Patent Application
DYNAMIC FAULT MODEL GENERATION FOR DIAGNOSTICS SIMULATION AND PATTE...
- Publication number 20180075170
- Publication date Mar 15, 2018
- International Business Machines Corporation
- Mary P. Kusko
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
BUILT-IN DEVICE TESTING OF INTEGRATED CIRCUITS
- Publication number 20170343601
- Publication date Nov 30, 2017
- International Business Machines Corporation
- Robert M. Casatuta
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF FORMING A TEMPORARY TEST STRUCTURE FOR DEVICE FABRICATION
- Publication number 20170263514
- Publication date Sep 14, 2017
- International Business Machines Corporation
- Charles L. Arvin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ITERATIVE N-DETECT BASED LOGIC DIAGNOSTIC TECHNIQUE
- Publication number 20170219651
- Publication date Aug 3, 2017
- International Business Machines Corporation
- Mary P. Kusko
- G01 - MEASURING TESTING
Information Patent Application
DYNAMIC FAULT MODEL GENERATION FOR DIAGNOSTICS SIMULATION AND PATTE...
- Publication number 20170199946
- Publication date Jul 13, 2017
- International Business Machines Corporation
- Mary P. Kusko
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD OF FORMING A TEMPORARY TEST STRUCTURE FOR DEVICE FABRICATION
- Publication number 20170062291
- Publication date Mar 2, 2017
- International Business Machines Corporation
- Charles L. Arvin
- G01 - MEASURING TESTING
Information Patent Application
PHASE CHANGE MEMORY MANAGEMENT
- Publication number 20140241048
- Publication date Aug 28, 2014
- International Business Machines Corporation
- Mukta G. Farooq
- G11 - INFORMATION STORAGE
Information Patent Application
Optimizing Heat Transfer in 3-D Chip-Stacks
- Publication number 20130331996
- Publication date Dec 12, 2013
- International Business Machines Corporation
- Thomas Brunschwiler
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
PHYSICAL DESIGN SYMMETRY AND INTEGRATED CIRCUITS ENABLING THREE DIM...
- Publication number 20130307159
- Publication date Nov 21, 2013
- International Business Machines Corporation
- John Matthew Safran
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
THREE-DIMENSIONAL (3D) STACKED INTEGRATED CIRCUIT TESTING
- Publication number 20120112776
- Publication date May 10, 2012
- International Business Machines Corporation
- Chen-Yong Cher
- G01 - MEASURING TESTING
Information Patent Application
CORRELATION AND OVERLAY OF LARGE DESIGN PHYSICAL PARTITIONS AND EMB...
- Publication number 20100174957
- Publication date Jul 8, 2010
- International Business Machines Corporation
- Jonathan K. Winslow, II
- G01 - MEASURING TESTING
Information Patent Application
AC ABIST Diagnostic Method, Apparatus and Program Product
- Publication number 20090217112
- Publication date Aug 27, 2009
- International Business Machines Corporation
- Joseph Eckelman
- G11 - INFORMATION STORAGE
Information Patent Application
METHOD FOR ENHANCING THE DIAGNOSTIC ACCURACY OF A VLSI CHIP
- Publication number 20080172576
- Publication date Jul 17, 2008
- International Business Machines Corporation
- Mary P. Kusko
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Creation of memory array bitmaps using logical to physical server
- Publication number 20030046621
- Publication date Mar 6, 2003
- Ulrich A. Finkler
- G11 - INFORMATION STORAGE
Information Patent Application
System and method to predetermine a bitmap of a self-tested embedde...
- Publication number 20020116676
- Publication date Aug 22, 2002
- International Business Machines Corporation
- David V. Gangl
- G11 - INFORMATION STORAGE

Gary William Maier

Person

Patents Grantslast 30 patents

Portable chip tester with integrated field programmable gate array

Built-in device testing of integrated circuits

Iterative N-detect based logic diagnostic technique

Dynamic fault model generation for diagnostics simulation and patte...

Method of forming a temporary test structure for device fabrication

Iterative N-detect based logic diagnostic technique

Method of forming a temporary test structure for device fabrication

Method of forming a temporary test structure for device fabrication

Dynamic fault model generation for diagnostics simulation and patte...

Method of forming a temporary test structure for device fabrication

Dynamic fault model generation for diagnostics simulation and patte...

Optimizing heat transfer in 3-D chip-stacks

Phase change memory management

Physical design symmetry and integrated circuits enabling three dim...

Three-dimensional (3D) stacked integrated circuit testing

AC ABIST diagnostic method, apparatus and program product

Method for enhancing the diagnostic accuracy of a VLSI chip

Creation of memory array bitmaps using logical to physical server

System and method to predetermine a bitmap of a self-tested embedde...

Array-built-in-self-test (ABIST) for efficient, fast, bitmapping of...

Patents Applicationslast 30 patents

PORTABLE CHIP TESTER WITH INTEGRATED FIELD PROGRAMMABLE GATE ARRAY

ITERATIVE N-DETECT BASED LOGIC DIAGNOSTIC TECHNIQUE

METHOD OF FORMING A TEMPORARY TEST STRUCTURE FOR DEVICE FABRICATION

METHOD OF FORMING A TEMPORARY TEST STRUCTURE FOR DEVICE FABRICATION

DYNAMIC FAULT MODEL GENERATION FOR DIAGNOSTICS SIMULATION AND PATTE...

BUILT-IN DEVICE TESTING OF INTEGRATED CIRCUITS

METHOD OF FORMING A TEMPORARY TEST STRUCTURE FOR DEVICE FABRICATION

ITERATIVE N-DETECT BASED LOGIC DIAGNOSTIC TECHNIQUE

DYNAMIC FAULT MODEL GENERATION FOR DIAGNOSTICS SIMULATION AND PATTE...

METHOD OF FORMING A TEMPORARY TEST STRUCTURE FOR DEVICE FABRICATION

PHASE CHANGE MEMORY MANAGEMENT

Optimizing Heat Transfer in 3-D Chip-Stacks

PHYSICAL DESIGN SYMMETRY AND INTEGRATED CIRCUITS ENABLING THREE DIM...

THREE-DIMENSIONAL (3D) STACKED INTEGRATED CIRCUIT TESTING

CORRELATION AND OVERLAY OF LARGE DESIGN PHYSICAL PARTITIONS AND EMB...

AC ABIST Diagnostic Method, Apparatus and Program Product

METHOD FOR ENHANCING THE DIAGNOSTIC ACCURACY OF A VLSI CHIP

Creation of memory array bitmaps using logical to physical server

System and method to predetermine a bitmap of a self-tested embedde...