Gary Woods

Person

Sunnyvale, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
System and method for voltage noise and jitter measurement using ti...
- Patent number 7,679,358
- Issue date Mar 16, 2010
- DCG Systems, Inc.
- Steven Kasapi
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for probing integrated circuits using laser il...
- Patent number 7,616,312
- Issue date Nov 10, 2009
- DCG Systems, Inc.
- Steven Kasapi
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for measuring high-bandwidth electrical signal...
- Patent number 7,450,245
- Issue date Nov 11, 2008
- DCG Systems, Inc.
- Gary Woods
- G01 - MEASURING TESTING
Information Patent Grant
System and method for determining probing locations on IC
- Patent number 7,243,039
- Issue date Jul 10, 2007
- Credence Systems Corporation
- Hitesh Suri
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for determining voltage using optical observation
- Patent number 7,012,537
- Issue date Mar 14, 2006
- Credence Systems Corporation
- Gary Leonard Woods
- G01 - MEASURING TESTING
Information Patent Grant
Device and method for probing instantaneous high-speed local supply...
- Patent number 6,737,880
- Issue date May 18, 2004
- Intel Corporation
- Samie B. Samaan
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus to measure statistical variation of electrical...
- Patent number 6,596,980
- Issue date Jul 22, 2003
- Intel Corporation
- Stefan Rusu
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor die manufacture method to limit a voltage drop on a p...
- Patent number 6,519,744
- Issue date Feb 11, 2003
- Intel Corporation
- Steven G. Seidel
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SYSTEM AND METHOD FOR VOLTAGE NOISE AND JITTER MEASUREMENT USING TI...
- Publication number 20070236206
- Publication date Oct 11, 2007
- Credence Systems Corporation
- Steven Kasapi
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR DETERMINING PROBING LOCATIONS ON IC
- Publication number 20070179736
- Publication date Aug 2, 2007
- Credence Systems Corporation
- Hitesh Suri
- G01 - MEASURING TESTING
Information Patent Application
Laser probing system for integrated circuits
- Publication number 20070002329
- Publication date Jan 4, 2007
- Steven Kasapi
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for measuring high-bandwidth electrical signal...
- Publication number 20070002328
- Publication date Jan 4, 2007
- Credence Systems Corporation
- Gary Woods
- G01 - MEASURING TESTING
Information Patent Application
Apparatus and method for determining voltage using optical observation
- Publication number 20050174248
- Publication date Aug 11, 2005
- Gary Leonard Woods
- G01 - MEASURING TESTING
Information Patent Application
Time resolved emission spectral analysis system
- Publication number 20050002028
- Publication date Jan 6, 2005
- Steven Kasapi
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus to measure statistical variation of electrical...
- Publication number 20030042439
- Publication date Mar 6, 2003
- Stefan Rusu
- G01 - MEASURING TESTING
Information Patent Application
Device and method for probing instantaneous high-speed local supply...
- Publication number 20020167327
- Publication date Nov 14, 2002
- Samie B. Samaan
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor die manufacture method to limit a voltage drop on a p...
- Publication number 20020073386
- Publication date Jun 13, 2002
- Steven G. Seidel
- G01 - MEASURING TESTING

Person

Patents Grantslast 30 patents

System and method for voltage noise and jitter measurement using ti...

Apparatus and method for probing integrated circuits using laser il...

Method and apparatus for measuring high-bandwidth electrical signal...

System and method for determining probing locations on IC

Apparatus and method for determining voltage using optical observation

Device and method for probing instantaneous high-speed local supply...

Method and apparatus to measure statistical variation of electrical...

Semiconductor die manufacture method to limit a voltage drop on a p...

Patents Applicationslast 30 patents

SYSTEM AND METHOD FOR VOLTAGE NOISE AND JITTER MEASUREMENT USING TI...

SYSTEM AND METHOD FOR DETERMINING PROBING LOCATIONS ON IC

Laser probing system for integrated circuits

Method and apparatus for measuring high-bandwidth electrical signal...

Apparatus and method for determining voltage using optical observation

Time resolved emission spectral analysis system

Method and apparatus to measure statistical variation of electrical...

Device and method for probing instantaneous high-speed local supply...

Semiconductor die manufacture method to limit a voltage drop on a p...